Abstract:
An on-chip jitter measurement circuit and corresponding method are provided for receiving a reference clock and a signal of interest, the circuit including a latch for latching and comparing the arrival time of the signal of interest to the reference clock, a clock counter in signal communication with the latch for counting the number of reference clock cycles received and latched, a delay chain in signal communication with the reference clock for varying the arrival time of the reference clock, the delay chain having a first stage, middle stages, and a last stage, and a voltage controller in signal communication with at least one of the middle stages of the delay chain for controlling the delay of the arrival time of the reference clock, wherein the voltage controller controls the first and last stages of the delay chain to retain a full voltage swing independent of the delay.
Abstract:
A Viterbi decoding circuit performs Viterbi decoding on the basis of a reproduced signal obtained by reading an optical disc. A decoded bit sequence is fed to a first specific pattern detection circuit and a first reverse pattern detection circuit. A path metric difference ΔM is fed to a reproduced signal evaluation circuit. The reproduced signal evaluation circuit extracts path metric differences for a specific pattern and a reverse pattern detected by the first specific pattern detection circuit and the first reverse pattern detection circuit and evaluates the reproduced signal on the basis of results. The evaluation uses not only the bit sequence for which the ideal SAM value is a minimum. The invention achieves accurate evaluation for reproduction.
Abstract:
In embodiments of the present invention, an optical device tester performs stressed eye testing on several optical receivers and transmission and dispersion penalty testing on optical transmitters at a variety of data rates wavelengths using single mode optical signals and multimode optical signals using a variety of supply voltages and temperatures.
Abstract:
A jitter evaluation apparatus for receiving a digital test signal from which a clock signal is recovered, is shown. A clock recovery circuit (401) recovers a clock signal from the test signal and a synchronisation circuit generates a synchronised system clock signal from said recovered clock signal. A sinusoid generator (403) generates a sinusoid signal from the synchronised system clock signal and a sampling analog to digital converter (404) samples the sinusoid signal by the recovered clock signal to provide sinusoid samples further comprising: A numerically controlled oscillator (401) is configured to produce sine values and cosine values in response to receiving an input from the system clock signal and a first multiplier (412) is configured to produce a first product of the sinusoid samples and the sine values. In addition, a second multiplier is configured to produce a second product of the sinusoid samples and the cosine values. Furthermore, a co-ordinate rotation device (416) is configured to receive said first product via a first low pass filter (414) and to receive said second product via a second low pass filter (415) to produce an output indicative of jitter phase.
Abstract:
A system and circuit for determining data signal jitter via asynchronous sampling provides a low cost and production-integrable mechanism for measuring data signal jitter. The data signal is edge-detected and sampled by a sampling clock of unrelated frequency the sampled values are collected in a histogram according to a folding of the samples around a timebase. The timebase is determined by sweeping to detect a minimum jitter for the folded data. The histogram for the correct estimated timebase period is representative of the probability density function of the location of data signal edges and the jitter characteristics are determined by the width and shape of the density function peaks. Frequency drift can be corrected by adjusting the timebase used to fold the data across the sample set.
Abstract:
A method of phase shifting bits in a digital signal pattern combines a bit-wise phase-shift signal with an external clock signal to produce a perturbed clock signal. The perturbed clock signal is provided to a digital pattern source to generate a shifted digital signal pattern wherein at least one bit is selectively phase-shifted according to the bit-wise phase-shift signal.
Abstract:
An eyewidth of a data signal is determined by steps including: (a) recovering a phase of a clock from a data signal as a sampling clock; (b) shifting the phase of the sampling clock away from the first phase by a count multiplied by predetermined phase amount; (c) sampling the data signal with the shifted sampling clock phase to obtain sample data; d) determining whether the sample data contains error; (e) when the sample data does not contain error, recovering the phase of the clock from the data signal again for use as the first phase of the sampling clock, increasing the count value and repeating steps (b) through (e); and f) when the sample data contains error, determining the eyewidth based on the last shifted phase of the sampling clock prior to determining that the sample data contains error.
Abstract:
A sampling method that determines the deterministic and random components of a signal when the magnitude of the signal exceeds the range of the sampler.
Abstract:
Determining a jitter property of a signal with a repetitive bit sequence of a plurality of bits includes setting a sample point at a first sampling position relative to a first transition within the bit pattern, assigning a set of digital values to comparison results of the digital signal with a threshold at the set sample point for a plurality of repetitions of the bit sequence, determining a distribution value on the base of the sum of the assigned digital values, shifting the sample point by a time increment, iteratively repeating determining the distribution value until the sample point has reached a second sampling position, determining from the distribution values a distribution function over the sample points, and determining the jitter property by using the distribution function.
Abstract:
Apparatuses and methods comprise a phase shifter, an adjustable capacitance configured to adjust a phase shift of said phase shifter, an arbitrary waveform generator configured to adjust the adjustable capacitance, and a pulse pattern generator coupled to the phase shifter, the phase shifter is configured to control the pulse pattern generator. In one aspect, an adjustable capacitance is at least one varactor diode. In another, a pair of varactor diodes are separated by λ/4 lines, an input and an output of the adjustable capacitance is AC-coupled, and the arbitrary waveform generator is configured to adjust the adjustable capacitance through a gaussian noise signal input to the pair of varactor diodes. A deterministic jitter generator may be coupled to the pulse pattern generator. An open-circuited stub line may be input to the pattern generator, a deterministic jitter content number adjustable varying stub line length.