公开(公告)号：US06753500B2

公开(公告)日：2004-06-22

申请号：US10078720

申请日：2002-02-19

Applicant: Kaidong Ye ,  Chengwu An ,  Minghui Hong ,  Yongfeng Lu

Inventor： Kaidong Ye ,  Chengwu An ,  Minghui Hong ,  Yongfeng Lu

IPC: B23K2600

CPC classification number: H01L21/78 ,  B23K26/0853 ,  B23K26/38 ,  B23K2101/40

Abstract: The invention relates to a method and apparatus for cutting a substrate using laser irradiation. A laser beam is scanned over a substrate. The beam ablates a first layer of the substrate. The beam is then refocused onto the newly revealed second layer and a further pass is performed. The process is repeated until complete separation occurs. The method and apparatus are particularly suitable for singulation of IC packages.

Abstract translation: 本发明涉及一种使用激光照射切割基板的方法和装置。 在衬底上扫描激光束。 光束消融基片的第一层。 然后将光束重新聚焦到新露出的第二层上，并进行另一遍。 重复该过程直到发生完全分离。 该方法和装置特别适用于IC封装的分离。

公开(公告)号：US20130093419A1

公开(公告)日：2013-04-18

申请号：US13703557

申请日：2011-06-13

Applicant: Chengwu An ,  Kaidong Ye ,  Qiong Xie ,  Wendong Song ,  Kay Siang Tiaw

Inventor： Chengwu An ,  Kaidong Ye ,  Qiong Xie ,  Wendong Song ,  Kay Siang Tiaw

IPC: G01N21/01 ,  G01N21/63

CPC classification number: G01N21/01 ,  G01N21/63 ,  G01R33/0325

Abstract: An apparatus and method of testing a magnetic medium at temperatures of interest is disclosed. Properties of the magnetic medium are determined by focusing light from a source of polarized light on a magnetic surface of the magnetic medium; measuring polarization of resulting reflected light due to the magneto-optical Kerr effect, using, for example a measuring subsystem; and varying the light source to heat the magnetic material where incident to pre-defined temperatures, thereby allowing determination of the magnetic properties using the magneto-optical Kerr effect at said pre-defined temperatures.

Abstract translation: 公开了在感兴趣的温度下测试磁性介质的装置和方法。 通过将来自偏振光源的光聚焦在磁性介质的磁性表面上来确定磁性介质的性质; 使用例如测量子系统测量由于磁光克尔效应引起的所产生的反射光的偏振; 并且改变光源以加热入射到预定温度的磁性材料，由此允许使用在所述预定温度下的磁光克尔效应来确定磁特性。

公开(公告)号：US07170029B2

公开(公告)日：2007-01-30

申请号：US10902897

申请日：2004-07-29

Applicant: Wen Dong Song ,  Minghui Hong ,  Chengwu An ,  Yong Feng Lu

Inventor： Wen Dong Song ,  Minghui Hong ,  Chengwu An ,  Yong Feng Lu

IPC: B23K26/00 ,  B23K26/14 ,  B23K26/16 ,  B23K26/18

CPC classification number: B08B7/0042 ,  B23K26/0624 ,  B23K26/351 ,  B23K2101/40 ,  H01L21/67092 ,  H01L21/67144

Abstract: This invention relates to a method and apparatus for deflashing integrated circuit (IC) packages by laser irradiation. The method and apparatus include two lasers scanning flash area for performing deflashing operation. CO2 laser is used to remove top layer of flash and YAG laser is used to remove the thin layer of flash remained after CO2 laser deflashing. CO2 laser deflashing and following YAG laser deflashing can effectively remove flash and avoid damage of heat sinks as well as leads and bars in the IC packages.

Abstract translation: 本发明涉及一种通过激光照射对集成电路（IC）封装进行消融的方法和装置。 该方法和装置包括两个激光扫描闪光区域，用于进行去抖动操作。 CO 2激光器用于去除闪光的顶层，并且使用YAG激光器去除CO 2激光束缚后残留的薄层。 CO 2激光束缚和随后的YAG激光束缚可以有效地去除闪光，并避免散热片以及IC封装中的引线和棒的损坏。

公开(公告)号：US06838637B2

公开(公告)日：2005-01-04

申请号：US10059940

申请日：2002-01-29

Applicant: Wen Dong Song ,  Minghui Hong ,  Chengwu An ,  Yong Feng Lu

Inventor： Wen Dong Song ,  Minghui Hong ,  Chengwu An ,  Yong Feng Lu

IPC: B08B7/00 ,  B23K26/00 ,  B23K26/06 ,  H01L21/00

CPC classification number: B08B7/0042 ,  B23K26/0624 ,  B23K26/351 ,  B23K2101/40 ,  H01L21/67092 ,  H01L21/67144

Abstract: This invention relates to a method and apparatus for deflashing integrated circuit (IC) packages by laser irradiation. The method and apparatus include two lasers scanning flash area for performing deflashing operation. CO2 laser is used to remove top layer of flash and YAG laser is used to remove the thin layer of flash remained after CO2 laser deflashing. CO2 laser deflashing and following YAG laser deflashing can effectively remove flash and avoid damage of heat sinks as well as leads and bars in the IC packages.

Abstract translation: 本发明涉及一种通过激光照射对集成电路（IC）封装进行消融的方法和装置。 该方法和装置包括两个激光扫描闪光区域，用于进行去抖动操作。 CO2激光器用于去除顶层闪光灯，YAG激光器用于去除二氧化碳激光束缚后残留的薄层闪光。 二氧化碳激光束缚和随后的YAG激光束缚可以有效去除闪光灯，避免散热片以及IC封装中引线和棒的损坏。

公开(公告)号：US08283622B2

公开(公告)日：2012-10-09

申请号：US12672998

申请日：2008-08-13

Applicant: Chengwu An ,  Kaidong Ye

Inventor： Chengwu An ,  Kaidong Ye

IPC: G01J4/00

CPC classification number: G01R33/0325 ,  G01N21/21 ,  G01N27/72

Abstract: A method and apparatus for testing a magnetic medium. The method comprises applying a magnetic field of a time-varying strength; directing a polarized optical beam towards a portion of the medium that is in the magnetic field, wherein the optical beam is reflected by a surface of the medium at a point of incidence in the magnetic field; moving the medium relative to the optical beam so as to cause the point of incidence to repeatedly traverse each of a plurality of sectors along a track on the surface; obtaining a series of Kerr signal measurements of the reflected optical beam; grouping measurements into ensembles such that the measurements in an individual ensemble are those obtained while the point of incidence was in a corresponding one of the sectors; and determining at least one magnetic property of at least one of the sectors from the measurements in the corresponding ensemble.

Abstract translation: 一种用于测试磁介质的方法和装置。 该方法包括施加时变强度的磁场; 将偏振光束引导到处于磁场中的介质的一部分，其中所述光束在所述磁场中的入射点处被所述介质的表面反射; 使所述介质相对于所述光束移动，以使所述入射点沿着所述表面上的轨道重复地穿过多个扇区中的每一个; 获得反射光束的一系列克尔信号测量; 将测量分组成集合，使得单个集合中的测量是当发生点在相应的扇区中时获得的测量; 以及从所述相应组合中的测量确定至少一个扇区的至少一个磁性。

公开(公告)号：US20110310387A1

公开(公告)日：2011-12-22

申请号：US12672998

申请日：2008-08-13

Applicant: Chengwu An ,  Kaidong Ye

Inventor： Chengwu An ,  Kaidong Ye

IPC: G01J4/00

CPC classification number: G01R33/0325 ,  G01N21/21 ,  G01N27/72

Abstract: A method and apparatus for testing a magnetic medium. The method comprises applying a magnetic field of a time-varying strength; directing a polarized optical beam towards a portion of the medium that is in the magnetic field, wherein the optical beam is reflected by a surface of the medium at a point of incidence in the magnetic field; moving the medium relative to the optical beam so as to cause the point of incidence to repeatedly traverse each of a plurality of sectors along a track on the surface; obtaining a series of Kerr signal measurements of the reflected optical beam; grouping measurements into ensembles such that the measurements in an individual ensemble are those obtained while the point of incidence was in a corresponding one of the sectors; and determining at least one magnetic property of at least one of the sectors from the measurements in the corresponding ensemble.

Abstract translation: 一种用于测试磁介质的方法和装置。 该方法包括施加时变强度的磁场; 将偏振光束引导到处于磁场中的介质的一部分，其中所述光束在所述磁场中的入射点处被所述介质的表面反射; 使所述介质相对于所述光束移动，以使所述入射点沿着所述表面上的轨道重复地穿过多个扇区中的每一个; 获得反射光束的一系列克尔信号测量; 将测量分组成集合，使得单个集合中的测量是当发生点在相应的扇区中时获得的测量; 以及从所述相应组合中的测量确定至少一个扇区的至少一个磁性。

公开(公告)号：US20050082266A1

公开(公告)日：2005-04-21

申请号：US10902897

申请日：2004-07-29

Applicant: Wen Song ,  Minghui Hong ,  Chengwu An ,  Yong Lu

Inventor： Wen Song ,  Minghui Hong ,  Chengwu An ,  Yong Lu

IPC: B08B7/00 ,  B23K26/00 ,  B23K26/06 ,  H01L21/00

CPC classification number: B08B7/0042 ,  B23K26/0624 ,  B23K26/351 ,  B23K2101/40 ,  H01L21/67092 ,  H01L21/67144

Abstract: This invention relates to a method and apparatus for deflashing integrated circuit (IC) packages by laser irradiation. The method and apparatus include two lasers scanning flash area for performing deflashing operation. CO2 laser is used to remove top layer of flash and YAG laser is used to remove the thin layer of flash remained after CO2 laser deflashing. CO2 laser deflashing and following YAG laser deflashing can effectively remove flash and avoid damage of heat sinks as well as leads and bars in the IC packages.

Abstract translation: 本发明涉及一种通过激光照射对集成电路（IC）封装进行消融的方法和装置。 该方法和装置包括两个激光扫描闪光区域，用于进行去抖动操作。 CO 2激光器用于去除闪光的顶层，并且使用YAG激光器去除CO 2激光束缚后残留的薄层。 CO 2激光束缚和随后的YAG激光束缚可以有效地去除闪光，并避免散热片以及IC封装中的引线和棒的损坏。