METHOD AND APPARATUS FOR TESTING AN INFRARED SENSOR
    1.
    发明申请
    METHOD AND APPARATUS FOR TESTING AN INFRARED SENSOR 失效
    用于测试红外传感器的方法和装置

    公开(公告)号:US20060131495A1

    公开(公告)日:2006-06-22

    申请号:US10905151

    申请日:2004-12-17

    CPC classification number: G01J5/12

    Abstract: A method and apparatus for evaluating the functionality and sensitivity of an infrared sensor to infrared radiation. The method and apparatus are adapted for testing an infrared sensor having a diaphragm containing a heating element and a transducer that generates an output responsive to temperature. The method entails placing the infrared sensor in a controlled environment, and then exposing the diaphragm of the sensor to different levels of thermal radiation so as to obtain outputs of the transducer at different output levels. In the absence of exposure of the diaphragm to thermal radiation, flowing current through the heating element at different input levels so that the output of the transducer returns to the different output levels obtained using thermal radiation, the input difference between the input levels can be computed and used to assess the functionality and the sensitivity of the sensor.

    Abstract translation: 一种用于评估红外传感器对红外辐射的功能和灵敏度的方法和装置。 该方法和装置适于测试具有包含加热元件的振动膜和产生响应于温度的输出的换能器的红外传感器。 该方法需要将红外传感器放置在受控的环境中,然后将传感器的膜片暴露于不同的热辐射水平,以便获得不同输出电平的换能器的输出。 在没有将隔膜暴露于热辐射的情况下,流过不同输入电平的加热元件的电流,使得换能器的输出返回到使用热辐射获得的不同输出电平,可以计算输入电平之间的输入差 并用于评估传感器的功能和灵敏度。

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