公开(公告)号：US20100048043A1

公开(公告)日：2010-02-25

申请号：US12604529

申请日：2009-10-23

Applicant: Danny L.C. Morlion ,  Stefaan Sercu ,  Winnie Heyvaert ,  Jan DeGeest

Inventor： Danny L.C. Morlion ,  Stefaan Sercu ,  Winnie Heyvaert ,  Jan DeGeest

IPC: H01R12/04

CPC classification number: H05K1/114 ,  H05K1/0219 ,  H05K1/0237 ,  H05K2201/09227 ,  H05K2201/09236 ,  H05K2201/10189 ,  H05K2201/10734

Abstract: Disclosed are methodologies for defining matched-impedance footprints on a substrate such as a printed circuit board, for example, that is adapted to receive an electrical component having an arrangement of terminal leads. Such a footprint may include an arrangement of electrically-conductive pads and an arrangement of electrically-conductive vias. The via arrangement may differ from the pad arrangement. The vias may be arranged to increase routing density, while limiting cross-talk and providing for matched impedance between the component and the substrate. The via arrangement may be altered to achieve a desired routing density on a layer of the board. Increasing the routing density may decrease the number of board layers, which tends to decrease capacitance and thereby increase impedance. Ground vias and signal vias may be arranged with respect to one another in such a manner as to affect impedance. Thus, the via arrangement may be altered to achieve an impedance that matches the impedance of the component. The via arrangement may be also be altered to limit cross-talk among neighboring signal conductors. Thus, the via arrangement may be defined to balance the impedance, cross-talk, and routing density requirements of the system.

公开(公告)号：US20100041275A1

公开(公告)日：2010-02-18

申请号：US12604465

申请日：2009-10-23

Applicant: Danny L.C. Morlion ,  Stefaan Sercu ,  Winnie Heyvaert ,  Jan DeGeest

Inventor： Danny L.C. Morlion ,  Stefaan Sercu ,  Winnie Heyvaert ,  Jan DeGeest

IPC: H01R13/648

CPC classification number: H05K1/114 ,  H05K1/0219 ,  H05K1/0237 ,  H05K2201/09227 ,  H05K2201/09236 ,  H05K2201/10189 ,  H05K2201/10734

Abstract: Disclosed are methodologies for defining matched-impedance footprints on a substrate such as a printed circuit board, for example, that is adapted to receive an electrical component having an arrangement of terminal leads. Such a footprint may include an arrangement of electrically-conductive pads and an arrangement of electrically-conductive vias. The via arrangement may differ from the pad arrangement. The vias may be arranged to increase routing density, while limiting cross-talk and providing for matched impedance between the component and the substrate. The via arrangement may be altered to achieve a desired routing density on a layer of the board. Increasing the routing density may decrease the number of board layers, which tends to decrease capacitance and thereby increase impedance. Ground vias and signal vias may be arranged with respect to one another in such a manner as to affect impedance. Thus, the via arrangement may be altered to achieve an impedance that matches the impedance of the component. The via arrangement may be also be altered to limit cross-talk among neighboring signal conductors. Thus, the via arrangement may be defined to balance the impedance, cross-talk, and routing density requirements of the system.

公开(公告)号：US08383951B2

公开(公告)日：2013-02-26

申请号：US12604465

申请日：2009-10-23

Applicant: Danny L. C. Morlion ,  Stefaan Sercu ,  Winnie Heyvaert ,  Jan DeGeest

Inventor： Danny L. C. Morlion ,  Stefaan Sercu ,  Winnie Heyvaert ,  Jan DeGeest

IPC: H05K1/11

CPC classification number: H05K1/114 ,  H05K1/0219 ,  H05K1/0237 ,  H05K2201/09227 ,  H05K2201/09236 ,  H05K2201/10189 ,  H05K2201/10734

Abstract: Disclosed are methodologies for defining matched-impedance footprints on a substrate such as a printed circuit board, for example, that is adapted to receive an electrical component having an arrangement of terminal leads. Such a footprint may include an arrangement of electrically-conductive pads and an arrangement of electrically-conductive vias. The via arrangement may differ from the pad arrangement. The vias may be arranged to increase routing density, while limiting cross-talk and providing for matched impedance between the component and the substrate. The via arrangement may be altered to achieve a desired routing density on a layer of the board. Increasing the routing density may decrease the number of board layers, which tends to decrease capacitance and thereby increase impedance. Ground vias and signal vias may be arranged with respect to one another in such a manner as to affect impedance. Thus, the via arrangement may be altered to achieve an impedance that matches the impedance of the component. The via arrangement may be also be altered to limit cross-talk among neighboring signal conductors. Thus, the via arrangement may be defined to balance the impedance, cross-talk, and routing density requirements of the system.

Abstract translation: 公开了用于在诸如印刷电路板的基板上定义匹配阻抗覆盖区的方法，例如适于接收具有端子引线布置的电气部件。 这种覆盖区可以包括导电焊盘的布置和导电通孔的布置。 通孔布置可以不同于衬垫布置。 通孔可以被布置成增加布线密度，同时限制串扰并且提供组件和基板之间的匹配阻抗。 可以改变通孔布置以在板的层上实现期望的布线密度。 增加布线密度可能会减少电路板层数，这往往会降低电容，从而增加阻抗。 接地通路和信号通孔可以以影响阻抗的方式相对于彼此布置。 因此，可以改变通孔布置以实现与部件的阻抗匹配的阻抗。 也可以改变通孔装置以限制相邻信号导体之间的串扰。 因此，可以定义通孔布置以平衡系统的阻抗，串扰和布线密度要求。

公开(公告)号：US08183466B2

公开(公告)日：2012-05-22

申请号：US12604529

申请日：2009-10-23

Applicant: Danny L. C. Morlion ,  Stefaan Sercu ,  Winnie Heyvaert ,  Jan DeGeest

Inventor： Danny L. C. Morlion ,  Stefaan Sercu ,  Winnie Heyvaert ,  Jan DeGeest

IPC: H05K1/11

CPC classification number: H05K1/114 ,  H05K1/0219 ,  H05K1/0237 ,  H05K2201/09227 ,  H05K2201/09236 ,  H05K2201/10189 ,  H05K2201/10734

Abstract: Disclosed are methodologies for defining matched-impedance footprints on a substrate such as a printed circuit board, for example, that is adapted to receive an electrical component having an arrangement of terminal leads. Such a footprint may include an arrangement of electrically-conductive pads and an arrangement of electrically-conductive vias. The via arrangement may differ from the pad arrangement. The vias may be arranged to increase routing density, while limiting cross-talk and providing for matched impedance between the component and the substrate. The via arrangement may be altered to achieve a desired routing density on a layer of the board. Increasing the routing density may decrease the number of board layers, which tends to decrease capacitance and thereby increase impedance. Ground vias and signal vias may be arranged with respect to one another in such a manner as to affect impedance. Thus, the via arrangement may be altered to achieve an impedance that matches the impedance of the component. The via arrangement may be also be altered to limit cross-talk among neighboring signal conductors. Thus, the via arrangement may be defined to balance the impedance, cross-talk, and routing density requirements of the system.

Abstract translation: 公开了用于在诸如印刷电路板的基板上定义匹配阻抗覆盖区的方法，例如适于接收具有端子引线布置的电气部件。 这种覆盖区可以包括导电焊盘的布置和导电通孔的布置。 通孔布置可以不同于衬垫布置。 通孔可以被布置成增加布线密度，同时限制串扰并且提供组件和基板之间的匹配阻抗。 可以改变通孔布置以在板的层上实现期望的布线密度。 增加布线密度可能会减少电路板层数，这往往会降低电容，从而增加阻抗。 接地通路和信号通孔可以以影响阻抗的方式相对于彼此布置。 因此，可以改变通孔布置以实现与部件的阻抗匹配的阻抗。 也可以改变通孔装置以限制相邻信号导体之间的串扰。 因此，可以定义通孔布置以平衡系统的阻抗，串扰和布线密度要求。

公开(公告)号：US07935896B2

公开(公告)日：2011-05-03

申请号：US12604459

申请日：2009-10-23

Applicant: Danny L. C. Morlion ,  Stefaan Sercu ,  Winnie Heyvaert ,  Jan DeGeest

Inventor： Danny L. C. Morlion ,  Stefaan Sercu ,  Winnie Heyvaert ,  Jan DeGeest

IPC: H05K1/11

CPC classification number: H05K1/114 ,  H05K1/0219 ,  H05K1/0237 ,  H05K2201/09227 ,  H05K2201/09236 ,  H05K2201/10189 ,  H05K2201/10734

Abstract: Disclosed are methodologies for defining matched-impedance footprints on a substrate such as a printed circuit board, for example, that is adapted to receive an electrical component having an arrangement of terminal leads. Such a footprint may include an arrangement of electrically-conductive pads and an arrangement of electrically-conductive vias. The via arrangement may differ from the pad arrangement. The vias may be arranged to increase routing density, while limiting cross-talk and providing for matched impedance between the component and the substrate. The via arrangement may be altered to achieve a desired routing density on a layer of the board. Increasing the routing density may decrease the number of board layers, which tends to decrease capacitance and thereby increase impedance. Ground vias and signal vias may be arranged with respect to one another in such a manner as to affect impedance. Thus, the via arrangement may be altered to achieve an impedance that matches the impedance of the component. The via arrangement may be also be altered to limit cross-talk among neighboring signal conductors. Thus, the via arrangement may be defined to balance the impedance, cross-talk, and routing density requirements of the system.

Abstract translation: 公开了用于在诸如印刷电路板的基板上定义匹配阻抗覆盖区的方法，例如适于接收具有端子引线布置的电气部件。 这种覆盖区可以包括导电焊盘的布置和导电通孔的布置。 通孔布置可以不同于衬垫布置。 通孔可以被布置成增加布线密度，同时限制串扰并且提供组件和基板之间的匹配阻抗。 可以改变通孔布置以在板的层上实现期望的布线密度。 增加布线密度可能会减少电路板层数，这往往会降低电容，从而增加阻抗。 接地通路和信号通孔可以以影响阻抗的方式相对于彼此布置。 因此，可以改变通孔布置以实现与部件的阻抗匹配的阻抗。 也可以改变通孔装置以限制相邻信号导体之间的串扰。 因此，可以定义通孔布置以平衡系统的阻抗，串扰和布线密度要求。

公开(公告)号：US20100041256A1

公开(公告)日：2010-02-18

申请号：US12604459

申请日：2009-10-23

Applicant: Danny L.C. Morlion ,  Stefaan Sercu ,  Winnie Heyvaert ,  Jan DeGeest

Inventor： Danny L.C. Morlion ,  Stefaan Sercu ,  Winnie Heyvaert ,  Jan DeGeest

IPC: H01R13/648

CPC classification number: H05K1/114 ,  H05K1/0219 ,  H05K1/0237 ,  H05K2201/09227 ,  H05K2201/09236 ,  H05K2201/10189 ,  H05K2201/10734

Abstract: Disclosed are methodologies for defining matched-impedance footprints on a substrate such as a printed circuit board, for example, that is adapted to receive an electrical component having an arrangement of terminal leads. Such a footprint may include an arrangement of electrically-conductive pads and an arrangement of electrically-conductive vias. The via arrangement may differ from the pad arrangement. The vias may be arranged to increase routing density, while limiting cross-talk and providing for matched impedance between the component and the substrate. The via arrangement may be altered to achieve a desired routing density on a layer of the board. Increasing the routing density may decrease the number of board layers, which tends to decrease capacitance and thereby increase impedance. Ground vias and signal vias may be arranged with respect to one another in such a manner as to affect impedance. Thus, the via arrangement may be altered to achieve an impedance that matches the impedance of the component. The via arrangement may be also be altered to limit cross-talk among neighboring signal conductors. Thus, the via arrangement may be defined to balance the impedance, cross-talk, and routing density requirements of the system.

Abstract translation: 公开了用于在诸如印刷电路板的基板上定义匹配阻抗覆盖区的方法，例如适于接收具有端子引线布置的电气部件。 这种覆盖区可以包括导电焊盘的布置和导电通孔的布置。 通孔布置可以不同于衬垫布置。 通孔可以被布置成增加布线密度，同时限制串扰并且提供组件和基板之间的匹配阻抗。 可以改变通孔布置以在板的层上实现期望的布线密度。 增加布线密度可能会减少电路板层数，这往往会降低电容，从而增加阻抗。 接地通路和信号通孔可以以影响阻抗的方式相对于彼此布置。 因此，可以改变通孔布置以实现与部件的阻抗匹配的阻抗。 也可以改变通孔装置以限制相邻信号导体之间的串扰。 因此，可以定义通孔布置以平衡系统的阻抗，串扰和布线密度要求。