Method and sampling device for detection of low levels of a property/quality trait present in an inhomogeneously distributed sample substrate
    1.
    发明授权
    Method and sampling device for detection of low levels of a property/quality trait present in an inhomogeneously distributed sample substrate 失效
    用于检测不均匀分布的样品底物中存在的低水平的性质/质量性状的方法和取样装置

    公开(公告)号:US06872946B2

    公开(公告)日:2005-03-29

    申请号:US10366166

    申请日:2003-02-13

    Abstract: A process for detecting low levels of a predetermined quality trait present in an inhomogeneously distributed particulate substrate involving the steps of: (a) providing a particulate substrate to be analyzed; (b) providing a spectrometer with an electromagnetic detector capable of performing spectroscopic measurements with electromagnetic radiation; (c) providing a rotatable sample holder having a transparent area through which electromagnetic radiation may pass; (d) providing a tumbling member located within the rotatable sample holder for tumbling the particulate substrate contained therein; (e) introducing the particulate substrate into the rotatable sample holder; (f) simultaneously rotating and tumbling the particulate substrate contained within the rotatable sample holder; and (g) activating the spectrometer, thereby illuminating the particulate substrate contained within the rotatable sample holder with electromagnetic radiation.

    Abstract translation: 用于检测存在于非均匀分布的颗粒基质中的低水平的预定质量特征的方法,包括以下步骤:(a)提供待分析的颗粒基质; (b)向光谱仪提供能够用电磁辐射进行光谱测量的电磁检测器; (c)提供可旋转的样品保持器,其具有电磁辐射通过的透明区域; (d)提供位于可旋转样品保持器内的翻转构件,用于翻转容纳在其中的颗粒基质; (e)将颗粒基材引入到可旋转的样品保持器中; (f)同时旋转和翻转包含在可旋转样品架内的颗粒基质; 和(g)激活光谱仪,从而用电磁辐射照射包含在可旋转样品保持器内的颗粒基质。

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