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    Kelvin contact-type testing device
    2.
    发明授权
    Kelvin contact-type testing device 失效
    开尔文接触式试验装置

    公开(公告)号：US6069480A

    公开(公告)日：2000-05-30

    申请号：US1299

    申请日：1997-12-31

    Applicant: Farid J. Sabounchi ,  Martin Rowan ,  Kurt Schultz

    Inventor： Farid J. Sabounchi ,  Martin Rowan ,  Kurt Schultz

    IPC: G01R1/04 ,  G01R31/28

    CPC classification number: G01R1/0466

    Abstract: A device (10) for testing miniature electronic components (104) includes a pair of contacts (88, 90), each of which is adapted to engage a common side (121) of a lead (110) of the electronic component (104) to be tested at longitudinally spaced locations. In particular, each contact (88, 90) includes an end portion (95, 99) that is arranged at an angle to both the lead (110) and the other contact (88, 90), while extending in a common vertical plane with the other contact (88, 90). In a preferred form of the invention, the device (10) includes a base (46) to which the first and second contacts (88, 90) are mounted. Each of the contacts (88, 90) include first and second end portions (94, 95 and 98, 99), with the first end portion (94, 98) of each contact (88, 90) being fixed relative to the base (46) and the second end portion (95, 99) extending at an angle to a plane of the base (46). In the most preferred form, the first end portion (94) of the first contact (88) is mounted atop the base (46) and the second end portion (95) thereof slopes downward from the base (46). On the other hand, the second end portion (99) of the second contact (90) is mounted below the first contact (88), such as on the bottom of the base (46), and the second end portion (99) thereof projects upwardly, at an acute angle to the vertical, to a point located above the second end portion (95) of the first contact (88). To accommodate the testing of electronic components (104) having varying lead spans, the base (46) can be formed from multiple, relatively shiftable sections (46a, 46b), each of which carries a respective pair of contact (88, 90).

    Abstract translation: 用于测试微型电子部件（104）的装置（10）包括一对触头（88,90），每个触头适于接合电子部件（104）的引线（110）的公共侧（121） 在纵向间隔的位置进行测试。 特别地，每个触头（88,90）包括端部（95,99），该端部（95,99）与引线（110）和另一触点（88,90）成一定角度布置，同时在共同的垂直平面中延伸 另一个触点（88,90）。 在本发明的优选形式中，装置（10）包括安装有第一和第二触头（88,90）的基座（46）。 每个触点（88,90）包括第一和第二端部（94,95和98,99），每个触点（88,90）的第一端部（94,98）相对于基座（ 46）和与基座（46）的平面成一定角度延伸的第二端部（95,99）。 在最优选的形式中，第一触点（88）的第一端部（94）安装在基座（46）的顶部，并且其第二端部（95）从基部（46）向下倾斜。 另一方面，第二触点（90）的第二端部（99）安装在第一触点（88）的下方，例如在基部（46）的底部，并且其第二端部（99） 以与垂直方向成锐角的方式向上突出到位于第一触头（88）的第二端部（95）上方的点。 为了适应具有变化的引线跨距的电子部件（104）的测试，基部（46）可以由多个相对可移位的部分（46a，46b）形成，每个部分承载相应的一对触头（88,90）。

    RISERS INCLUDING A PLURALITY OF HIGH ASPECT RATIO ELECTRICAL CONDUITS AND SYSTEMS AND METHODS OF MANUFACTURE AND USE THEROF
    5.
    发明申请
    RISERS INCLUDING A PLURALITY OF HIGH ASPECT RATIO ELECTRICAL CONDUITS AND SYSTEMS AND METHODS OF MANUFACTURE AND USE THEROF 审中-公开
    包括多个高比例电气连接和系统的升高及其制造和使用方法

    公开(公告)号：US20130069680A1

    公开(公告)日：2013-03-21

    申请号：US13610076

    申请日：2012-09-11

    Applicant: Koby L. Duckworth ,  Eric Hill ,  Mike Jolley ,  Kurt Schultz ,  Jody Curtis

    Inventor： Koby L. Duckworth ,  Eric Hill ,  Mike Jolley ,  Kurt Schultz ,  Jody Curtis

    IPC: G01R1/073 ,  H05K3/10 ,  H05K1/11

    CPC classification number: G01R1/07378 ,  G01R3/00 ,  H05K1/11 ,  H05K3/4046 ,  H05K2201/0379 ,  H05K2201/10378

    Abstract: Risers including a plurality of high aspect ratio electrical conduits, as well as systems and methods of manufacture and/or use of the risers and/or the high aspect ratio electrical conduits. The systems and methods may include incorporation of the plurality of high aspect ratio electrical conduits within a substantially planar body that may include and/or be formed from a solid dielectric material. The plurality of electrical conduits may be configured to conduct a plurality of electric currents between a first surface of the body and a second, substantially opposed, surface of the body. The surfaces may include a plurality of contact pads configured to provide a robust and/or corrosion-resistant surface and/or to improve electrical contact between the riser and another device. The risers also may include a layered structure, wherein the layers are sequentially formed to increase a thickness of the riser and/or the aspect ratio of the electrical conduits.

    Abstract translation: 包括多个高纵横比电导管的立管以及制造和/或使用立管和/或高纵横比电导管的系统和方法。 系统和方法可以包括将多个高纵横比的电导管并入可包括和/或由固体电介质材料形成的基本平坦的体内。 多个电导管可以被配置为在主体的第一表面和主体的第二，基本相对的表面之间传导多个电流。 表面可以包括多个接触垫，其被配置为提供坚固的和/或耐腐蚀的表面和/或改善上升管和另一个装置之间的电接触。 立管还可以包括层状结构，其中顺序地形成这些层以增加提升管的厚度和/或电导管的纵横比。

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