公开(公告)号：US20060158248A1

公开(公告)日：2006-07-20

申请号：US11331095

申请日：2006-01-13

Applicant: Lin-Jing Chang

Inventor： Lin-Jing Chang

IPC: H03F3/38

CPC classification number: H03F3/217

Abstract: A dynamic pulse width modulation (PWM) amplifier comprising an input terminal, a dynamic PWM controller, a power stage, a low pass filter, and an output terminal. The input terminal receives an input signal. The dynamic PWM controller transforms the N-bit input signal sampled by a sampling frequency to a 1-bit PWM signal. The power stage receives and outputs thel-bit PWM signal. The low pass filter receives and outputs the 1-bit PWM signal. The 1-bit PWM signal is used to drive the power stage and the low pass filter. The output terminal outputs the 1-bit PWM signal. The dynamic PWM amplifier is characterized in the dynamic PWM amplifier uses a register array to store the input signal processed immediately in each frame, regroups the input signal, and outputs the regroup signal, so that the 1-bit PWM signal is changed according to the input signal.

Abstract translation: 一种动态脉宽调制（PWM）放大器，包括输入端，动态PWM控制器，功率级，低通滤波器和输出端。 输入端接收输入信号。 动态PWM控制器将采样频率采样的N位输入信号变换为1位PWM信号。 功率级接收并输出1位PWM信号。 低通滤波器接收并输出1位PWM信号。 1位PWM信号用于驱动功率级和低通滤波器。 输出端输出1位PWM信号。 动态PWM放大器的特点是动态PWM放大器使用寄存器阵列来存储每帧中立即处理的输入信号，重新分组输入信号，并输出重组信号，使得1位PWM信号根据 输入信号。

公开(公告)号：US10161881B2

公开(公告)日：2018-12-25

申请号：US12657068

申请日：2010-01-13

Applicant: Ajharali Amanullah ,  Lin Jing ,  Han Cheng Ge ,  Kok Weng Wong

Inventor： Ajharali Amanullah ,  Lin Jing ,  Han Cheng Ge ,  Kok Weng Wong

IPC: G01N21/95 ,  G01N21/88 ,  G06T7/00 ,  H01L21/66

Abstract: An inspection system for inspecting a semiconductor wafer. The inspection system comprises an illumination setup for supplying broadband illumination. The broadband illumination can be of different contrasts, for example brightfield and darkfield broadband illumination. The inspection system further comprises a first image capture device and a second image capture device, each configured for receiving broadband illumination to capture images of the semiconductor wafer while the semiconductor wafer is in motion. The system comprises a number of tube lenses for enabling collimation of the broadband illumination. The system also comprises a stabilizing mechanism and an objective lens assembly. The system further comprises a thin line illumination emitter and a third image capture device for receiving thin line illumination to thereby capture three-dimensional images of the semiconductor wafer. The system comprises a reflector assembly for enabling the third image capture device to receive illumination reflected from the semiconductor wafer in multiple directions.

公开(公告)号：US20090034831A1

公开(公告)日：2009-02-05

申请号：US11888827

申请日：2007-08-02

Applicant: Ajharali Amanullah ,  Lin Jing ,  Chunlin Luke Zeng

Inventor： Ajharali Amanullah ,  Lin Jing ,  Chunlin Luke Zeng

IPC: G06K9/00

CPC classification number: G01N21/95607 ,  G01N21/9501

Abstract: A system for inspecting semiconductor devices is provided. The system includes a region system selecting a plurality of regions from a semiconductor wafer. A golden template system generates a region golden template for each region, such as to allow a die image to be compared to golden templates from a plurality of regions. A group golden template system generates a plurality of group golden templates from the region golden templates, such as to allow the die image to be compared to golden templates from a plurality of group golden templates.

Abstract translation: 提供了一种用于检查半导体器件的系统。 该系统包括从半导体晶片选择多个区域的区域系统。 金色模板系统为每个区域生成区域金色模板，以允许将模具图像与来自多个区域的金色模板进行比较。 组金模板系统从区域金模板生成多个组黄金模板，以允许将模具图像与来自多个组金模板的金模板进行比较。

公开(公告)号：US07411447B2

公开(公告)日：2008-08-12

申请号：US11331095

申请日：2006-01-13

Applicant: Lin-Jing Chang

Inventor： Lin-Jing Chang

IPC: H03F3/38

CPC classification number: H03F3/217

Abstract: A dynamic pulse width modulation (PWM) amplifier comprising an input terminal, a dynamic PWM controller, a power stage, a low pass filter, and an output terminal. The input terminal receives an input signal. The dynamic PWM controller transforms the N-bit input signal sampled by a sampling frequency to a 1-bit PWM signal. The power stage receives and outputs the 1-bit PWM signal. The low pass filter receives and outputs the 1-bit PWM signal. The 1-bit PWM signal is used to drive the power stage and the low pass filter. The output terminal outputs the 1-bit PWM signal. The dynamic PWM amplifier is characterized in the dynamic PWM amplifier uses a register array to store the input signal processed immediately in each frame, regroups the input signal, and outputs the regroup signal, so that the 1-bit PWM signal is changed according to the input signal.

Abstract translation: 一种动态脉宽调制（PWM）放大器，包括输入端，动态PWM控制器，功率级，低通滤波器和输出端。 输入端接收输入信号。 动态PWM控制器将采样频率采样的N位输入信号变换为1位PWM信号。 功率级接收并输出1位PWM信号。 低通滤波器接收并输出1位PWM信号。 1位PWM信号用于驱动功率级和低通滤波器。 输出端输出1位PWM信号。 动态PWM放大器的特点是动态PWM放大器使用寄存器阵列来存储每帧中立即处理的输入信号，重新分组输入信号，并输出重组信号，使得1位PWM信号根据 输入信号。

公开(公告)号：US08401272B2

公开(公告)日：2013-03-19

申请号：US11888827

申请日：2007-08-02

Applicant: Ajharali Amanullah ,  Lin Jing ,  Chunlin Luke Zeng

Inventor： Ajharali Amanullah ,  Lin Jing ,  Chunlin Luke Zeng

IPC: G06K9/00

CPC classification number: G01N21/95607 ,  G01N21/9501

Abstract: A system for inspecting semiconductor devices is provided. The system includes a region system selecting a plurality of regions from a semiconductor wafer. A golden template system generates a region golden template for each region, such as to allow a die image to be compared to golden templates from a plurality of regions. A group golden template system generates a plurality of group golden templates from the region golden templates, such as to allow the die image to be compared to golden templates from a plurality of group golden templates.

公开(公告)号：US20060187622A1

公开(公告)日：2006-08-24

申请号：US11060428

申请日：2005-02-18

Applicant: Lin Jing

Inventor： Lin Jing

IPC: G06F1/16

CPC classification number: G06F3/0202

Abstract: A computer keyboard includes a keyboard body removably received and retained in an outer frame assembly. The outer frame assembly includes a rigid base, serving as a lower frame forming a first central cavity and having a front flange, and a soft pad including an upper frame forming a second central cavity and having a wrist support extending from the upper frame. The upper frame is stacked on the lower frame with the central cavities aligned with each other to define a space for receiving the keyboard body. The wrist support that is soft is positioned on and supported by the front flange of the lower frame to in turn support a user's wrists.

Abstract translation: 计算机键盘包括可移除地容纳并保持在外框组件中的键盘体。 外框架组件包括刚性基座，用作形成第一中心腔并具有前凸缘的下框架，以及包括形成第二中心腔并具有从上框架延伸的腕部支撑件的上框架的软垫。 上框架堆叠在下框架上，其中心空腔彼此对准以限定用于接收键盘主体的空间。 柔软的腕部支撑件定位在下框架的前凸缘上并由其支撑，从而支撑使用者的手腕。

公开(公告)号：US20100188486A1

公开(公告)日：2010-07-29

申请号：US12657068

申请日：2010-01-13

Applicant: Ajharali Amanullah ,  Lin Jing ,  Han Cheng Ge ,  Kok Weng Wong

Inventor： Ajharali Amanullah ,  Lin Jing ,  Han Cheng Ge ,  Kok Weng Wong

IPC: H04N7/18 ,  H04N13/02

CPC classification number: G01N21/8806 ,  G01N21/9501 ,  G01N2021/8825 ,  G01N2201/06113 ,  G01N2201/0636 ,  G06T7/0008 ,  G06T7/001 ,  G06T2207/10152 ,  G06T2207/20212 ,  G06T2207/30148 ,  H01L22/12 ,  H01L2924/0002 ,  H04N5/2354 ,  H01L2924/00

Abstract: An inspection system for inspecting a semiconductor wafer. The inspection system comprises an illumination setup for supplying broadband illumination. The broadband illumination can be of different contrasts, for example brightfield and darkfield broadband illumination. The inspection system further comprises a first image capture device and a second image capture device, each configured for receiving broadband illumination to capture images of the semiconductor wafer while the semiconductor wafer is in motion. The system comprises a number of tube lenses for enabling collimation of the broadband illumination. The system also comprises a stabilizing mechanism and an objective lens assembly. The system further comprises a thin line illumination emitter and a third image capture device for receiving thin line illumination to thereby capture three-dimensional images of the semiconductor wafer. The system comprises a reflector assembly for enabling the third image capture device to receive illumination reflected from the semiconductor wafer in multiple directions.

Abstract translation: 用于检查半导体晶片的检查系统。 检查系统包括用于提供宽带照明的照明设备。 宽带照明可以具有不同的对比度，例如明场和暗场宽带照明。 检查系统还包括第一图像捕获装置和第二图像捕获装置，每个被配置为在半导体晶片运动的同时接收宽带照明以捕获半导体晶片的图像。 该系统包括许多用于使准直宽带照明的管透镜。 该系统还包括稳定机构和物镜组件。 该系统还包括细线照明发射器和用于接收细线照明从而捕获半导体晶片的三维图像的第三图像捕获装置。 该系统包括反射器组件，用于使得第三图像捕获装置能够在多个方向上接收从半导体晶片反射的照明。

公开(公告)号：US20060187206A1

公开(公告)日：2006-08-24

申请号：US11060363

申请日：2005-02-18

Applicant: Lin Jing

Inventor： Lin Jing

IPC: G09G5/08

CPC classification number: G06F3/03543 ,  G06F2203/0333

Abstract: A computer mouse includes a body having a bottom and a top cover mounted to the bottom to define therebetween an interior space for accommodating mechanical/electronic/optic components. The cover has front and rear portions separated by a partition wall. The front portions forms control buttons of the mouse. The rear portion has a surface from which pegs extend. A soft pad has a bottom defining holes fit over the pegs to fix the pad on the surface of the rear portion of the cover of the mouse.

Abstract translation: 计算机鼠标包括具有底部的主体和安装到底部的顶盖，以在其间限定用于容纳机械/电子/光学部件的内部空间。 盖子具有由分隔壁隔开的前部和后部。 前面部分形成鼠标的控制按钮。 后部具有栓从其延伸的表面。 软垫具有限定孔的底部，该孔配合在钉上，以将垫固定在鼠标盖的后部的表面上。