Abstract:
This invention relates to a method for setting up a conference call in a telecommunications network using the SIP protocol to set up a communication between a first terminal (30) and a second terminal (32), call controllers (36ca30, 36ca32) relaying signals for this communication.According to the invention, such a method is characterized in that it comprises the following steps: the step to interrupt communication of the first terminal (30) with the second terminal (32) to set up a communication between this first terminal (30) and a conference bridge (38pc), the step to simulate the second terminal (32) maintaining its communication with the first terminal (30) using at least one of the call controllers (36ca30, 36ca32), and the step to simulate the second terminal (32) interrupting its communication with the first terminal (30) to set up a communication between this second terminal and the conference bridge (38pc).
Abstract:
An apparatus and method of fabricating a through-wafer via. A first mask is formed over a first side of a first semiconductor die to define a first via area. A deep recess is etched through the first semiconductor die in the first via area and a blanket metal layer is formed over the first side including the deep recess. The blanket metal layer is removed from an outer surface of the first side of the first semiconductor die while retaining a portion of the blanket metal layer within the deep recess.
Abstract:
This invention relates to a method for setting up a conference call in a telecommunications network using the SIP protocol to set up a communication between a first terminal (30) and a second terminal (32), call controllers (36ca30, 36ca32) relaying signals for this communication.According to the invention, such a method is characterized in that it comprises the following steps: the step to interrupt communication of the first terminal (30) with the second terminal (32) to set up a communication between this first terminal (30) and a conference bridge (38pc), the step to simulate the second terminal (32) maintaining its communication with the first terminal (30) using at least one of the call controllers (36ca30, 36ca32), and the step to simulate the second terminal (32) interrupting its communication with the first terminal (30) to set up a communication between this second terminal and the conference bridge (38pc).
Abstract:
An apparatus and method of fabricating a through-wafer via. A first mask is formed over a first side of a first semiconductor die to define a first via area. A deep recess is etched through the first semiconductor die in the first via area and a blanket metal layer is formed over the first side including the deep recess. The blanket metal layer is removed from an outer surface of the first side of the first semiconductor die while retaining a portion of the blanket metal layer within the deep recess.
Abstract:
An improved semiconductor device is described. That semiconductor device includes a first insulating layer, having a low-k dielectric constant that preferably comprises a carbon doped oxide, that is formed on a substrate. The device further includes a second layer, which is formed on the first layer, that has a relatively high dielectric constant and superior mechanical strength. The second layer is preferably under compressive stress. A third layer may be formed on the second layer, which has a relatively low dielectric constant and relatively poor mechanical strength, and a fourth layer may be formed on the third layer, which has a relatively high dielectric constant and superior mechanical strength.
Abstract:
A microelectromechanical system may be enclosed in a hermetic cavity defined by joined, first and second semiconductor structures. The joined structures may be sealed by a solder sealing ring, which extends completely around the cavity. One of the semiconductor structures may have the system formed thereon and an open area may be formed underneath said system. That open area may be formed from the underside of the structure and may be closed by covering with a suitable film in one embodiment.
Abstract:
In a method of routing a call in a network with a plurality of nodes connected by trunks, each call is assigned a priority level as a function of which it can pre-empt calls in the network. The cost of different routes for routing the call is calculated and one route is chosen as a function of the cost. The cost of a route is a function of the maximum value on the trunks constituting the route, the priority level of the calls pre-empted on each of the trunks, the number of calls pre-empted on the trunks and the resources available on the trunks. The priority level of existing calls can therefore be taken into account when routing a call. The single figure of the accompanying drawing shows the typical trend of the cost function of a trunk as a function of the available resources.
Abstract:
A scanning impedance microscopy device maps out local impedance in a dielectric film sample. This may be used to detect conductive filaments in a dielectric film, to characterize semiconductor interfaces, and to be used a reading scheme for resistive change memory such as RRAM.
Abstract:
A film bulk acoustic resonator (FBAR) comprises a piezoelectric film sandwiched between a top electrode and a bottom electrode. A temperature sensor is provided to sense a temperature to determine a temperature induced frequency drift for the FBAR. A voltage controller operatively connected to the temperature sensor supplies a direct current (DC) bias voltage to the FBAR to induce an opposite voltage induced frequency drift to compensate for the temperature induced frequency drift.
Abstract:
In a method of routing calls to an external network from a calling node of a private network having a plurality of external network access circuit groups, each circuit group is connected to a gateway node of the private network. The method calculates a cost for different possible routes to the external network, the cost of a route to the external network being a function of the circuit group used and the route in the private network between the calling node and the gateway node of the circuit group used. It also chooses a route as a function of the calculated costs. The cost of a route to the external network is a decreasing function of the resources available on the circuit group used and is also a decreasing function of the load of the links used for routing in the private network. This optimizes use of the resources of the private network.