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1.发明授权公开(公告)号：US08836932B2
公开(公告)日：2014-09-16
申请号：US13848240
申请日：2013-03-21
Applicant: Taiwan Power Testing Technology Co., Ltd.
Inventor： Yu-Chiang Lin
CPC classification number: G01J1/42 , G01J1/04 , G01J1/4257 , G01J3/0202 , G01J3/0267 , G01J3/506 , G01J2001/4247
Abstract: Disclosed is an inspecting equipment for inspecting a light emission characteristic of a display screen includes: a carrying device provided for carrying the display screen, a cover device and a data analyzing device. The cover device has a detecting surface provided with a plurality of luminance detectors, and covers an emitting surface of the display screen to form a darkroom between the cover device and the detecting surface. A plurality of corresponding luminance information is generated by the luminance detectors provided for detecting a plurality of measuring zones of the emitting surface. The data analyzing device receives the luminance information and analyzes the light emission characteristic of the display screen according to the luminance information. And, it is thus able to rapidly inspect the light emission characteristic of the display screen during manufacture process, and is easy to be applied to a present producing line.
Abstract translation: 公开了一种用于检查显示屏的发光特性的检查设备，包括：用于承载显示屏的承载装置，盖装置和数据分析装置。 盖装置具有设置有多个亮度检测器的检测表面，并且覆盖显示屏的发射表面，以在盖装置和检测表面之间形成暗室。 由用于检测发射表面的多个测量区域的亮度检测器产生多个对应的亮度信息。 数据分析装置接收亮度信息，并根据亮度信息分析显示画面的发光特性。 而且，能够在制造过程中快速检查显示屏的发光特性，容易应用于现有的生产线。
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公开(公告)号：US20140123749A1
公开(公告)日：2014-05-08
申请号：US13730542
申请日：2012-12-28
Applicant: TAIWAN POWER TESTING TECHNOLOGY CO., LTD.
Inventor： YU-CHIANG LIN
IPC: G01N33/36
CPC classification number: G01N33/367 , G01N21/8983
Abstract: The invention provides a fibre cloth inspecting method for inspecting a fibre cloth regarding sparse density, filament break, various kinds of mark, fabric runs, break, weaving validation, and dyeing uniformity. The method includes following steps: scanning the fibre cloth by a scanning light beam; retrieving a light pattern generated by the scanning; generating an inspecting result information according to the light pattern in relation to the fibre cloth; and analyzing the fibre cloth regarding sparse density, filament break, various kinds of mark, fabric runs, break, weaving validation, and dyeing uniformity according to the inspecting result information.
Abstract translation: 本发明提供了一种纤维布检查方法，用于检查纤维布上的稀疏密度，细丝断裂，各种标记，织物运行，断裂，织造验证和染色均匀性。 该方法包括以下步骤：通过扫描光束扫描纤维布; 检索由扫描产生的光图案; 根据与纤维布相关的光图案生成检查结果信息; 根据检测结果信息，分析纤维布的稀疏密度，细丝断裂，各种标记，织物运行，断裂，织造验证和染色均匀性。
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公开(公告)号：US20140130599A1
公开(公告)日：2014-05-15
申请号：US13739551
申请日：2013-01-11
Applicant: TAIWAN POWER TESTING TECHNOLOGY CO., LTD.
Inventor： YU-CHIANG LIN
IPC: G01N29/04
CPC classification number: G01N29/07 , G01N29/26 , G01N29/28 , G01N33/367 , G01N2291/105
Abstract: The invention provides a method for inspecting defect point in adhesive layer of fibre cloth. The method includes following steps: spreading a fibre cloth; inspecting, by using two ultrasonic detectors, an upper surface and a lower surface of the fibre cloth simultaneously to sense a defect point in an adhesive layer of the fibre cloth; and analyzing an inspecting information sensed by the two ultrasonic detectors to obtain the situation of the defect point of the fibre cloth.
Abstract translation: 本发明提供一种检验纤维布粘合剂层缺陷点的方法。 该方法包括以下步骤：铺展纤维布; 通过使用两个超声波检测器同时检测纤维布的上表面和下表面以感测纤维布的粘合剂层中的缺陷点; 并分析由两个超声波检测器检测的检查信息，以获得纤维布的缺陷点的情况。
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公开(公告)号：US20140125331A1
公开(公告)日：2014-05-08
申请号：US13712036
申请日：2012-12-12
Applicant: TAIWAN POWER TESTING TECHNOLOGY CO., LTD
Inventor： YU-CHIANG LIN
IPC: G01B7/06
Abstract: The invention provides an equipment of inspecting thickness of fibre cloth and method therefor. The method includes following steps: disposing a fibre cloth on a metal backboard; sensing an eddy current responding from the fibre cloth and the metal backboard by an eddy current sensing device to obtain a multilayer thickness information; and comparing the multilayer thickness information with a single-layer thickness information to obtain a cloth thickness information corresponding to the thickness of the fibre cloth, wherein the single-layer thickness information is obtained by sensing an eddy current responding from the metal backboard, thereby the thickness of fibre cloth can be obtained.
Abstract translation: 本发明提供一种检验纤维布厚度的设备及其方法。 该方法包括以下步骤：将纤维布放在金属背板上; 通过涡流感测装置感测从纤维布和金属背板响应的涡流，以获得多层厚度信息; 并且将多层厚度信息与单层厚度信息进行比较以获得与纤维布厚度相对应的布厚度信息，其中通过感测从金属背板响应的涡流获得单层厚度信息，从而 纤维布的厚度可以得到。
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5.发明授权Method for automatically sorting LEDs according to electrostatic resistance and system using the same 有权根据静电电阻自动分类LED的方法及使用其的系统公开(公告)号：US09134362B2
公开(公告)日：2015-09-15
申请号：US13911312
申请日：2013-06-06
Applicant: TAIWAN POWER TESTING TECHNOLOGY CO., LTD.
Inventor： Yu-Chiang Lin
CPC classification number: G01R31/2635 , G01R31/2642
Abstract: Disclosed is a method for automatically sorting LEDs (light emitting diode) according to electrostatic resistance and a system using the same. The system includes a transport carrier for laying LEDs and passing LEDs through an electrostatic discharging zone, a lightening evaluating zone, and a sorting zone in sequence. An electrostatic discharging device discharges an electrostatic power to the LED in the electrostatic discharging zone. Furthermore, a lighting device inputs a lightening power to the LED in the lightening evaluating zone. Moreover, an evaluating device in the evaluating zone generates an evaluating signal to a sorting device in the sorting zone according to the lighting condition of the LED for allowing the sorting device to sort LEDs according to electrostatic resistance. Thereby the reliability both for the failure rate and the detection rate can be raised.
Abstract translation: 公开了一种根据静电电阻自动分类LED（发光二极管）的方法和使用该方法的系统。 该系统包括用于铺设LED并依次通过静电放电区，发光评估区和分选区的LED的输送载体。 静电放电装置对静电放电区域中的LED进行静电放电。 此外，照明装置在减重评估区域中向LED输入发光功率。 此外，评价区域中的评价装置根据LED的照明条件，对分拣区域中的分拣装置生成评价信号，使得分拣装置能够根据静电电阻对LED进行分类。 从而可以提高故障率和检测率的可靠性。
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Patent Agency Ranking
公开(公告)号：US20150047215A1
公开(公告)日：2015-02-19
申请号：US14451256
申请日：2014-08-04
Applicant: Taiwan Power Testing Technology Co., Ltd.
Inventor： Yu-Chiang LIN
Abstract: An electronic welding seam gauge comprises a reference positioning block and an electronic displacement measuring member. The reference positioning block has a contacting surface that abuts against a first abutting surface to form a first reference point, and the electronic displacement measuring member is disposed at a side of the reference positioning block, having a displacement probe and a displaying portion, wherein a displacement that the displacement probe moves to abut against a second reference point of a second abutting surface with respect to the first reference point is displayed by the displaying portion for providing a more precise measurement with respect to the welding seam, so as to enable the welded product to comply with the standards.
Abstract translation: 电子焊缝计包括参考定位块和电子位移测量构件。 基准定位块具有与第一抵接面邻接以形成第一基准点的接触面，电子位移测量部件设置在基准定位块的一侧，具有位移探针和显示部，其中， 位移探头相对于第一参考点移动抵靠第二邻接表面的第二参考点的位移由显示部分显示，用于相对于焊缝提供更精确的测量，以使焊接 产品符合标准。
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公开(公告)号：US09164074B2
公开(公告)日：2015-10-20
申请号：US13730542
申请日：2012-12-28
Applicant: TAIWAN POWER TESTING TECHNOLOGY CO., LTD.
Inventor： Yu-Chiang Lin
IPC: G01N33/36 , G01N21/898
CPC classification number: G01N33/367 , G01N21/8983
Abstract: The invention provides a fiber cloth inspecting method for inspecting a fiber cloth regarding sparse density, filament break, various kinds of mark, fabric runs, break, weaving validation, and dyeing uniformity. The method includes following steps: scanning the fiber cloth by a scanning light beam; retrieving a light pattern generated by the scanning; generating an inspecting result information according to the light pattern in relation to the fiber cloth; and analyzing the fiber cloth regarding sparse density, filament break, various kinds of mark, fabric runs, break, weaving validation, and dyeing uniformity according to the inspecting result information.
Abstract translation: 本发明提供了一种纤维布检查方法，用于检查纤维布上的稀疏密度，细丝断裂，各种标记，织物运行，断裂，织造验证和染色均匀性。 该方法包括以下步骤：通过扫描光束扫描纤维布; 检索由扫描产生的光图案; 根据与纤维布相关的光图案生成检查结果信息; 根据检测结果信息，分析纤维布的稀疏密度，细丝断裂，各种标记，织物运行，断裂，织造验证和染色均匀性。
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公开(公告)号：US09091526B2
公开(公告)日：2015-07-28
申请号：US13712036
申请日：2012-12-12
Applicant: TAIWAN POWER TESTING TECHNOLOGY CO., LTD.
Inventor： Yu-Chiang Lin
Abstract: An equipment for inspecting the thickness of fiber cloth and a method therefor. The method includes disposing a fiber cloth on a metal backboard; sensing an eddy current responding from the fiber cloth and the metal backboard by an eddy current sensing device to obtain a multilayer thickness value; and comparing the multilayer thickness value with a single-layer thickness value to obtain a cloth thickness value corresponding to the thickness of the fiber cloth, wherein the single-layer thickness value is obtained by sensing an eddy current responding from the metal backboard, thereby the thickness of fiber cloth can be obtained.
Abstract translation: 用于检查纤维布厚度的设备及其方法。 该方法包括在金属背板上布置纤维布; 通过涡流感测装置感测从纤维布和金属背板响应的涡流，以获得多层厚度值; 并且将多层厚度值与单层厚度值进行比较以获得与纤维布厚度相对应的布厚度值，其中通过感测从金属背板响应的涡流获得单层厚度值，由此， 纤维布的厚度可以得到。
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9.发明申请INSPECTING EQUIPMENT FOR INSPECTING A LIGHT EMISSION CHARACTERISTIC OF A MONITOR 有权检查监控器的轻型排放特性的检查设备公开(公告)号：US20140192351A1
公开(公告)日：2014-07-10
申请号：US13848240
申请日：2013-03-21
Applicant: TAIWAN POWER TESTING TECHNOLOGY CO., LTD.
Inventor： Yu-Chiang LIN
IPC: G01J1/42
CPC classification number: G01J1/42 , G01J1/04 , G01J1/4257 , G01J3/0202 , G01J3/0267 , G01J3/506 , G01J2001/4247
Abstract: Disclosed is an inspecting equipment for inspecting a light emission characteristic of a display screen includes: a carrying device provided for carrying the display screen, a cover device and a data analyzing device. The cover device has a detecting surface provided with a plurality of luminance detectors, and covers an emitting surface of the display screen to form a darkroom between the cover device and the detecting surface. A plurality of corresponding luminance information is generated by the luminance detectors provided for detecting a plurality of measuring zones of the emitting surface. The data analyzing device receives the luminance information and analyzes the light emission characteristic of the display screen according to the luminance information. And, it is thus able to rapidly inspect the light emission characteristic of the display screen during manufacture process, and is easy to be applied to a present producing line.
Abstract translation: 公开了一种用于检查显示屏的发光特性的检查设备，包括：用于承载显示屏的承载装置，盖装置和数据分析装置。 盖装置具有设置有多个亮度检测器的检测表面，并且覆盖显示屏的发射表面，以在盖装置和检测表面之间形成暗室。 由用于检测发射表面的多个测量区域的亮度检测器产生多个对应的亮度信息。 数据分析装置接收亮度信息，并根据亮度信息分析显示画面的发光特性。 而且，能够在制造过程中快速检查显示屏的发光特性，容易应用于现有的生产线。
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10.发明申请METHOD FOR INSPECTING DEFECTS OF OPTICAL LAYER ELEMENTS OF A DISPLAY DEVICE 审中-公开用于检查显示器件的光学元件的缺陷的方法公开(公告)号：US20140168643A1
公开(公告)日：2014-06-19
申请号：US13848239
申请日：2013-03-21
Applicant: TAIWAN POWER TESTING TECHNOLOGY CO., LTD.
Inventor： Yu-Chiang LIN
IPC: G01N21/956
CPC classification number: G01N21/958 , G01N2021/9513
Abstract: Disclosed is a method for inspecting defects of optical layer elements of a display device. The method includes steps of: scanning a selected optical layer element of the display device by a scanning light beam at a predetermined scan angle, wherein the optical layer element is selected from a polarizing layer, a filter layer, an alignment layer, a liquid crystal layer, a thin film transistor substrate layer, a light diffusion layer, a light guide layer, or a combination thereof; retrieving a light pattern generated by scanning the selected optical layer element; generating an inspecting result information according to the light pattern in relation to the selected optical layer element; and analyzing the optical layer element regarding defect conditions according to the inspecting result information.
Abstract translation: 公开了一种用于检查显示装置的光学层元件的缺陷的方法。 该方法包括以下步骤：通过扫描光束以预定的扫描角度扫描显示装置的所选择的光学层元件，其中光学层元件选自偏振层，滤光层，取向层，液晶 薄膜晶体管衬底层，光扩散层，导光层或其组合; 检索通过扫描所选择的光学层元件而产生的光图案; 根据与所选择的光学层元件相关的光图案生成检查结果信息; 并根据检查结果信息分析关于缺陷状况的光学层元件。
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