公开(公告)号：US20150047215A1

公开(公告)日：2015-02-19

申请号：US14451256

申请日：2014-08-04

Applicant: Taiwan Power Testing Technology Co., Ltd.

Inventor： Yu-Chiang LIN

IPC: B23K31/12 ,  G01B7/14

CPC classification number: B23K31/125 ,  G01B3/205 ,  G01B3/22 ,  G01B3/28 ,  G01B3/56 ,  G01B5/061

Abstract: An electronic welding seam gauge comprises a reference positioning block and an electronic displacement measuring member. The reference positioning block has a contacting surface that abuts against a first abutting surface to form a first reference point, and the electronic displacement measuring member is disposed at a side of the reference positioning block, having a displacement probe and a displaying portion, wherein a displacement that the displacement probe moves to abut against a second reference point of a second abutting surface with respect to the first reference point is displayed by the displaying portion for providing a more precise measurement with respect to the welding seam, so as to enable the welded product to comply with the standards.

Abstract translation: 电子焊缝计包括参考定位块和电子位移测量构件。 基准定位块具有与第一抵接面邻接以形成第一基准点的接触面，电子位移测量部件设置在基准定位块的一侧，具有位移探针和显示部，其中， 位移探头相对于第一参考点移动抵靠第二邻接表面的第二参考点的位移由显示部分显示，用于相对于焊缝提供更精确的测量，以使焊接 产品符合标准。

公开(公告)号：US20140176178A1

公开(公告)日：2014-06-26

申请号：US13911312

申请日：2013-06-06

Applicant: TAIWAN POWER TESTING TECHNOLOGY CO., LTD.

Inventor： Yu-Chiang LIN

IPC: G01R31/01 ,  G01R31/26

CPC classification number: G01R31/2635 ,  G01R31/2642

Abstract: Disclosed is a method for automatically sorting LEDs (light emitting diode) according to electrostatic resistance and a system using the same. The system includes a transport carrier for laying LEDs and passing LEDs through an electrostatic discharging zone, a lightening evaluating zone, and a sorting zone in sequence. An electrostatic discharging device discharges an electrostatic power to the LED in the electrostatic discharging zone. Furthermore, a lighting device inputs a lightening power to the LED in the lightening evaluating zone. Moreover, an evaluating device in the evaluating zone generates an evaluating signal to a sorting device in the sorting zone according to the lighting condition of the LED for allowing the sorting device to sort LEDs according to electrostatic resistance. Thereby the reliability both for the failure rate and the detection rate can be raised.

Abstract translation: 公开了一种根据静电电阻自动分类LED（发光二极管）的方法和使用该方法的系统。 该系统包括用于铺设LED并依次通过静电放电区，发光评估区和分选区的LED的输送载体。 静电放电装置对静电放电区域中的LED进行静电放电。 此外，照明装置在减重评估区域中向LED输入发光功率。 此外，评价区域中的评价装置根据LED的照明条件，对分拣区域中的分拣装置生成评价信号，使得分拣装置根据静电电阻对LED进行分类。 从而可以提高故障率和检测率的可靠性。

公开(公告)号：US20140192351A1

公开(公告)日：2014-07-10

申请号：US13848240

申请日：2013-03-21

Applicant: TAIWAN POWER TESTING TECHNOLOGY CO., LTD.

Inventor： Yu-Chiang LIN

IPC: G01J1/42

CPC classification number: G01J1/42 ,  G01J1/04 ,  G01J1/4257 ,  G01J3/0202 ,  G01J3/0267 ,  G01J3/506 ,  G01J2001/4247

Abstract: Disclosed is an inspecting equipment for inspecting a light emission characteristic of a display screen includes: a carrying device provided for carrying the display screen, a cover device and a data analyzing device. The cover device has a detecting surface provided with a plurality of luminance detectors, and covers an emitting surface of the display screen to form a darkroom between the cover device and the detecting surface. A plurality of corresponding luminance information is generated by the luminance detectors provided for detecting a plurality of measuring zones of the emitting surface. The data analyzing device receives the luminance information and analyzes the light emission characteristic of the display screen according to the luminance information. And, it is thus able to rapidly inspect the light emission characteristic of the display screen during manufacture process, and is easy to be applied to a present producing line.

Abstract translation: 公开了一种用于检查显示屏的发光特性的检查设备，包括：用于承载显示屏的承载装置，盖装置和数据分析装置。 盖装置具有设置有多个亮度检测器的检测表面，并且覆盖显示屏的发射表面，以在盖装置和检测表面之间形成暗室。 由用于检测发射表面的多个测量区域的亮度检测器产生多个对应的亮度信息。 数据分析装置接收亮度信息，并根据亮度信息分析显示画面的发光特性。 而且，能够在制造过程中快速检查显示屏的发光特性，容易应用于现有的生产线。

公开(公告)号：US20140168643A1

公开(公告)日：2014-06-19

申请号：US13848239

申请日：2013-03-21

Applicant: TAIWAN POWER TESTING TECHNOLOGY CO., LTD.

Inventor： Yu-Chiang LIN

IPC: G01N21/956

CPC classification number: G01N21/958 ,  G01N2021/9513

Abstract: Disclosed is a method for inspecting defects of optical layer elements of a display device. The method includes steps of: scanning a selected optical layer element of the display device by a scanning light beam at a predetermined scan angle, wherein the optical layer element is selected from a polarizing layer, a filter layer, an alignment layer, a liquid crystal layer, a thin film transistor substrate layer, a light diffusion layer, a light guide layer, or a combination thereof; retrieving a light pattern generated by scanning the selected optical layer element; generating an inspecting result information according to the light pattern in relation to the selected optical layer element; and analyzing the optical layer element regarding defect conditions according to the inspecting result information.

Abstract translation: 公开了一种用于检查显示装置的光学层元件的缺陷的方法。 该方法包括以下步骤：通过扫描光束以预定的扫描角度扫描显示装置的所选择的光学层元件，其中光学层元件选自偏振层，滤光层，取向层，液晶 薄膜晶体管衬底层，光扩散层，导光层或其组合; 检索通过扫描所选择的光学层元件而产生的光图案; 根据与所选择的光学层元件相关的光图案生成检查结果信息; 并根据检查结果信息分析关于缺陷状况的光学层元件。