公开(公告)号：US20200271911A1

公开(公告)日：2020-08-27

申请号：US16748463

申请日：2020-01-21

Applicant: ADVANCED OPTICAL TECHNOLOGIES, INC.

Inventor： Brian G. Hoover ,  Jonathan H. Turner

IPC: G02B21/00 ,  G02B26/06 ,  G01J4/04

Abstract: A polarimeter and a method of analyzing and imaging microstructural material orientation of a sample are disclosed. The polarimeter, which is a partial Mueller-matrix polarimeter (pMMP), accesses multiple independent polarization channels by employing two independent polarization modulators configured to switch serially among multiple independent settings, wherein the combination of the settings of the first and second polarization modulators defines an independent polarization channel, and wherein an imaging detector produces a set of spatially registered images that are synchronized with the channels formed by the polarization modulators; and wherein a processor connected with a memory executes a classification algorithm stored in the memory that maps the set of images to one or more material orientation images by mapping the set of values for each detector pixel corresponding to the set of spatially registered images to a value of material orientation at each pixel coordinate using a machine-learning model, an electrodynamic model, or a combination thereof. The invention can thereby create material microstructural orientation images of diverse anisotropic materials, for instance polymer domains, fiber bundles or plys, and metallic crystalline grains.

公开(公告)号：US11867891B2

公开(公告)日：2024-01-09

申请号：US16748463

申请日：2020-01-21

Applicant: ADVANCED OPTICAL TECHNOLOGIES, INC.

Inventor： Brian G. Hoover ,  Jonathan H. Turner

IPC: G02B21/00 ,  G01J4/04 ,  G01N21/21 ,  G01N21/84

CPC classification number: G02B21/0092 ,  G01J4/04 ,  G01N21/21 ,  G01N2021/8477 ,  G02B21/0068

Abstract: A polarimeter and a method of analyzing and imaging microstructural material orientation of a sample are disclosed. The polarimeter, which is a partial Mueller-matrix polarimeter (pMMP), accesses multiple independent polarization channels by employing two independent polarization modulators configured to switch serially among multiple independent settings, wherein the combination of the settings of the first and second polarization modulators defines an independent polarization channel, and wherein an imaging detector produces a set of spatially registered images that are synchronized with the channels formed by the polarization modulators; and wherein a processor connected with a memory executes a classification algorithm stored in the memory that maps the set of images to one or more material orientation images by mapping the set of values for each detector pixel corresponding to the set of spatially registered images to a value of material orientation at each pixel coordinate using a machine-learning model, an electrodynamic model, or a combination thereof. The invention can thereby create material microstructural orientation images of diverse anisotropic materials, for instance polymer domains, fiber bundles or plys, and metallic crystalline grains.

公开(公告)号：US20240142758A1

公开(公告)日：2024-05-02

申请号：US18407012

申请日：2024-01-08

Applicant: ADVANCED OPTICAL TECHNOLOGIES, INC.

Inventor： Brian G. Hoover ,  Jonathan H. Turner

IPC: G02B21/00 ,  G01J4/04 ,  G01N21/21

CPC classification number: G02B21/0092 ,  G01J4/04 ,  G01N21/21 ,  G01N2021/8477 ,  G02B21/0068

Abstract: A polarimeter and a method of analyzing and imaging microstructural material orientation of a polished reflective sample are disclosed. The polarimeter, which is a partial Mueller-matrix polarimeter (pMMP), accesses multiple independent polarization channels by employing two independent polarization modulators configured to switch serially among multiple independent settings, wherein the combination of the settings of the first and second polarization modulators defines an independent polarization channel, and wherein an imaging detector produces a set of polarization images that are synchronized with the channels formed by the polarization modulators; and wherein a processor connected with a memory executes a classification algorithm stored in the memory that maps the set of polarization images to one or more material orientation images by mapping the set of values for each detector pixel corresponding to the set of polarization images to a value of material orientation at each pixel coordinate using a model. The invention can thereby create material microstructural orientation images of diverse anisotropic materials, for instance polymer domains, fiber bundles or plys, and crystalline grains.