公开(公告)号：US20200320724A1

公开(公告)日：2020-10-08

申请号：US16848623

申请日：2020-04-14

Applicant: APPLEJACK 199 L.P.

Inventor： Wojciech J WALECKI ,  Wei-Chun HUNG

IPC: G06T7/40 ,  G01B11/00 ,  G01B11/30 ,  G01B11/16

Abstract: The present subject matter at-least provides a system for measurement of topography of specular surfaces. The system comprises a set of indexed light-sources and a controller configured to drive the set of light-sources for irradiating a specular-surface by sequentially illuminating a plurality of sub-sets of the light-sources in accordance with a pre-defined encoding criteria. Further, at least one camera is provided to capture reflected light-radiation from the specular-surface and thereby generate a plurality of images in accordance with the sequential-illumination, such that each of the generated-image corresponds to a particular sub-set of illuminated light sources. Further, a processing system is configured to process each generated image in accordance with an image-processing criteria specific to the encoding-criteria to determine one or more index of light-sources and thereby identify the light-sources within the images; and determine topography of the specular-surface at-least based on calculation of spatial-coordinates and the determined identity of each light-source.

公开(公告)号：US20200033578A1

公开(公告)日：2020-01-30

申请号：US16573923

申请日：2019-09-17

Applicant: APPLEJACK 199 L.P.

Inventor： Mihail MIHAYLOV ,  Wojciech J WALECKI ,  Jae RYU

IPC: G02B21/06 ,  H04N5/225 ,  G02B21/36 ,  G02B21/08 ,  H04N5/372

Abstract: The present subject matter includes a method of focusing of an optical imaging apparatus. The method comprises causing illumination of an object using an illuminating beam to thereby cause generation of a scattered beam. A first set of luminous parameters are derived from a first detected position of a luminous representation formed by the scattered beam from the object. The illumination-beam is focused upon the object by triggering a movement of the object along an optical-axis in a first direction, the first direction being based a numerical-representation of the first set of luminous parameters. A second set of luminous parameters are derived from a second detected position of the luminous-representation of the object, the second detected position being related to the first detected position and the movement of the object. The focusing of the illumination beam is ceased based at-least on a numerical-representation of the second set of luminous parameters.

公开(公告)号：US20190304110A1

公开(公告)日：2019-10-03

申请号：US15937677

申请日：2018-03-27

Applicant: APPLEJACK 199 L.P.

Inventor： Wojciech J WALECKI ,  Wei-Chun HUNG

IPC: G06T7/40 ,  G01B11/00 ,  G01B11/16 ,  G01B11/30

Abstract: The present subject matter at-least provides a system for measurement of topography of specular surfaces. The system comprises a set of indexed light-sources and a controller configured to drive the set of light-sources for irradiating a specular-surface by sequentially illuminating a plurality of sub-sets of the light-sources in accordance with a pre-defined encoding criteria. Further, at least one camera is provided to capture reflected light-radiation from the specular-surface and thereby generate a plurality of images in accordance with the sequential-illumination, such that each of the generated-image corresponds to a particular sub-set of illuminated light sources. Further, a processing system is configured to process each generated image in accordance with an image-processing criteria specific to the encoding-criteria to determine one or more index of light-sources and thereby identify the light-sources within the images; and determine topography of the specular-surface at-least based on calculation of spatial-coordinates and the determined identity of each light-source.

公开(公告)号：US20200149866A1

公开(公告)日：2020-05-14

申请号：US16741610

申请日：2020-01-13

Applicant: APPLEJACK 199 L.P.

Inventor： Wojciech J WALECKI

IPC: G01B9/02 ,  G01B11/06 ,  G01B11/30

Abstract: The present subject matter at least provides an apparatus for characterization of a slab of a material. The apparatus comprises two or more frequency-domain optical-coherence tomography (FD-OCT) probes configured for irradiating the slab of material, and detecting radiation reflected from the slab of material or transmitted there-through. Further, a centralized actuation-mechanism is connected to the OCT probes for simultaneously actuating elements in each of the OCT probes to cause a synchronized detection of the radiation from the slab of material. A spectral-analysis module is provided for analyzing at least an interference pattern with respect to each of the OCT probes to thereby determine at least one of thickness and topography of the slab of the material. Further, in some embodiments, the slab of material may include a passivation layer. The apparatus may be configured to determine a thickness of the passivation layer.