Substrate processing apparatus, storage medium and substrate processing method

    公开(公告)号:US11094505B2

    公开(公告)日:2021-08-17

    申请号:US15644535

    申请日:2017-07-07

    Abstract: Examples of a substrate processing apparatus include a signal transmitter that outputs a command signal, and an RF generator that receives the command signal, starts to output traveling wave power simultaneously with a first transition of the command signal, measures a delay time, which is a time period after the first transition of the command signal until a predetermined power-applied state is achieved on a receiving side of the traveling wave power, and stops outputting the traveling wave power when the delay time elapses after a second transition of the command signal.

    SUBSTRATE LIFT MECHANISM AND SUBSTRATE PROCESSING APPARATUS INCLUDING SAME

    公开(公告)号:US20220415701A1

    公开(公告)日:2022-12-29

    申请号:US17847470

    申请日:2022-06-23

    Abstract: A substrate processing apparatus is disclosed. An exemplary substrate processing apparatus includes a reaction chamber; a susceptor plate positioned within the reaction chamber, constructed and arranged to support a substrate, and provided with one or more holes; a substrate lift mechanism comprising: a plurality of lift pins to support the substrate; and a lift pin support member to move the lift pins; in a vertical direction through the one or more holes; a substrate transfer robot provided with one or more robotic arms to transfer the substrate to a position above the lift pins; and a gas supply unit constructed and arranged to face the susceptor plate; wherein the gas supply unit is constructed and arranged to move in the vertical direction thereby positioning the gas supply unit in a processing position in the reaction chamber.

    SUBSTRATE PROCESSING APPARATUS, STORAGE MEDIUM AND SUBSTRATE PROCESSING METHOD

    公开(公告)号:US20190013181A1

    公开(公告)日:2019-01-10

    申请号:US15644535

    申请日:2017-07-07

    Abstract: Examples of a substrate processing apparatus include a signal transmitter that outputs a command signal, and an RF generator that receives the command signal, starts to output traveling wave power simultaneously with a first transition of the command signal, measures a delay time, which is a time period after the first transition of the command signal until a predetermined power-applied state is achieved on a receiving side of the traveling wave power, and stops outputting the traveling wave power when the delay time elapses after a second transition of the command signal.

    SUBSTRATE PROCESSING APPARATUS INCLUDING SUBSTRATE TRANSFER ROBOT

    公开(公告)号:US20230326783A1

    公开(公告)日:2023-10-12

    申请号:US18131552

    申请日:2023-04-06

    CPC classification number: H01L21/68707 B25J13/08 B25J11/0095 H01L21/67259

    Abstract: A substrate processing apparatus is disclosed. Exemplary substrate processing apparatus includes a plurality of reaction chambers; a plurality of susceptors disposed within the reaction chambers and configured to support a substrate; a substrate transfer robot disposed within the substrate processing apparatus, comprising: a rotation arm comprising a plurality of arms, the arms configured to transfer the substrate between the reaction chambers; and a rotation shaft connected to the plurality of arms; a motor configured to rotate the rotation shaft; a motor controller configured to drive the motor; and a first sensor with a portion disposed on at least one of the plurality of arms.

    Substrate processing apparatus and substrate transfer method

    公开(公告)号:US10777445B2

    公开(公告)日:2020-09-15

    申请号:US16212555

    申请日:2018-12-06

    Abstract: Examples of a substrate processing apparatus includes a susceptor, a plurality of three or more susceptor pins configured to protrude from an upper surface of the susceptor or be positioned below the upper surface of the susceptor, a transfer arm configured to provide a substrate onto the susceptor or take out a substrate on the susceptor, a plurality of sensors configured to individually detect contact or non-contact of a substrate with the plurality of susceptor pins individually, and a control device configured to monitor a detection result of the plurality of sensors and determine abnormality when an order of variations in a contact state of the substrate with the plurality of susceptor pins is not a predetermined order or when a time difference between the variations in the contact state of the substrate with the plurality of susceptor pins is not within a predetermined time difference range.

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