公开(公告)号：US20240392435A1

公开(公告)日：2024-11-28

申请号：US18790702

申请日：2024-07-31

Applicant: ASM IP Holding B.V.

Inventor： Dieter Pierreux ,  Theodorus G.M. Oosterlaken ,  Herbert Terhorst ,  Lucian Jdira ,  Bert Jongbloed

IPC: C23C16/44 ,  C23C16/34 ,  C23C16/455 ,  C23C16/458 ,  C23C16/52

Abstract: A chemical vapor deposition furnace for depositing silicon nitride films is disclosed. The furnace includes a process chamber elongated in a substantially vertical direction and a wafer boat for supporting a plurality of wafers in the process chamber. A process gas injector inside the process chamber is provided with vertically spaced gas injection holes to provide gas introduced at a feed end in an interior of the process gas injector to the process chamber. A valve system connected to the feed end of the process gas injector is being constructed and arranged to connect a source of a silicon precursor and a nitrogen precursor to the feed end for depositing silicon nitride layers. The valve system may connect the feed end of the process gas injector to a cleaning gas system to provide a cleaning gas to remove silicon nitride from the process gas injector and/or the process chamber.

公开(公告)号：US20200071828A1

公开(公告)日：2020-03-05

申请号：US16677446

申请日：2019-11-07

Applicant: ASM IP Holding B.V.

Inventor： Bert Jongbloed ,  Delphine Longrie ,  Robin Roelofs ,  Lucian Jdira ,  Suvi Haukka ,  Antti Niskanen ,  Jun Kawahara ,  Yukihiro Mori

IPC: C23C16/455 ,  C23C16/458 ,  C23C16/52 ,  H01L21/02 ,  H01L21/285 ,  C23C16/54

Abstract: In accordance with some embodiments herein, methods and apparatuses for deposition of thin films are provided. In some embodiments, a deposition reactor is provided comprising: a first station configured to contain a substrate, the first station comprising a first heating element; a second station configured to contain the substrate, the second station comprising a second heating element, wherein the first station is configured to contact the substrate with a first reactant in the first station in substantial isolation from the second station such that a layer of the first reactant is deposited on the substrate, wherein the first heating element is configured to heat the first station to a first station temperature during contacting of the substrate with the first reactant, wherein the second station is configured to contact the substrate with a second reactant in the second station substantially in the absence of the first reactant, and wherein the second heating element is configured to heat the second station to a second station temperature during contacting of the substrate with the second reactant, a transfer system; and a controller set to control a cycle of: moving the substrate via the transfer system to the first station, directing the first station to contact the substrate with the first reactant at the first station temperature, moving the substrate to the second station via the transfer system, and directing the second station to contact the substrate with the second reactant at the second station temperature, and further set to repeat the cycle until a film of desired thickness is formed on a surface of the substrate.

公开(公告)号：US11830730B2

公开(公告)日：2023-11-28

申请号：US15690017

申请日：2017-08-29

Applicant: ASM IP Holding B.V.

Inventor： Arjen Klaver ,  Werner Knaepen ,  Lucian Jdira ,  Gido van der Star ,  Ruslan Kvetny

IPC: H01L21/02 ,  C23C16/52 ,  C23C16/44 ,  C23C16/455 ,  C23C16/34

CPC classification number: H01L21/0228 ,  C23C16/345 ,  C23C16/4408 ,  C23C16/45527 ,  C23C16/45544 ,  C23C16/45553 ,  C23C16/52 ,  H01L21/0217 ,  H01L21/02208 ,  H01L21/02211

Abstract: There is provided a method and apparatus for forming a layer, by sequentially repeating a layer deposition cycle to process a substrate disposed in a reaction chamber. The deposition cycle comprising:



supplying a first precursor into the reaction chamber for a first pulse period;
supplying a second precursor into the reaction chamber for a second pulse period. At least one of the first and second precursors may be supplied into the reaction chamber for a pretreatment period longer than the first or second pulse period before sequentially repeating the deposition cycles.

公开(公告)号：US09431238B2

公开(公告)日：2016-08-30

申请号：US14718517

申请日：2015-05-21

Applicant: ASM IP Holding B.V.

Inventor： Bert Jongbloed ,  Dieter Pierreux ,  Cornelius A. van der Jeugd ,  Herbert Terhorst ,  Lucian Jdira ,  Radko G. Bankras ,  Theodorus G. M. Oosterlaken

IPC: H01L21/02

CPC classification number: H01L21/02337 ,  C23C16/402 ,  C23C16/56 ,  H01L21/02164 ,  H01L21/02233 ,  H01L21/02274

Abstract: In some embodiments, a reactive curing process may be performed by exposing a semiconductor substrate in a process chamber to an ambient containing hydrogen peroxide, with the pressure in the process chamber at about 300 Torr or less. In some embodiments, the residence time of hydrogen peroxide molecules in the process chamber is about five minutes or less. The curing process temperature may be set at about 500° C. or less. The curing process may be applied to cure flowable dielectric materials and may provide highly uniform curing results, such as across a batch of semiconductor substrates cured in a batch process chamber.

Abstract translation: 在一些实施方案中，反应性固化方法可以通过将处理室中的半导体衬底暴露于含有过氧化氢的环境中，其中处理室中的压力为约300托或更小。 在一些实施方案中，过氧化氢分子在处理室中的停留时间为约5分钟或更短。 固化过程温度可以设定在约500℃或更低。 固化过程可用于固化可流动介电材料，并且可以提供高度均匀的固化结果，例如在批处理室中固化的一批半导体衬底。

公开(公告)号：US20150357184A1

公开(公告)日：2015-12-10

申请号：US14718517

申请日：2015-05-21

Applicant: ASM IP Holding B.V.

Inventor： Bert Jongbloed ,  Dieter Pierreux ,  Cornelius A. van der Jeugd ,  Herbert Terhorst ,  Lucian Jdira ,  Radko G. Bankras ,  Theodorus G.M. Oosterlaken

IPC: H01L21/02

CPC classification number: H01L21/02337 ,  C23C16/402 ,  C23C16/56 ,  H01L21/02164 ,  H01L21/02233 ,  H01L21/02274

Abstract: In some embodiments, a reactive curing process may be performed by exposing a semiconductor substrate in a process chamber to an ambient containing hydrogen peroxide, with the pressure in the process chamber at about 300 Torr or less. In some embodiments, the residence time of hydrogen peroxide molecules in the process chamber is about five minutes or less. The curing process temperature may be set at about 500° C. or less. The curing process may be applied to cure flowable dielectric materials and may provide highly uniform curing results, such as across a batch of semiconductor substrates cured in a batch process chamber.

Abstract translation: 在一些实施方案中，反应性固化方法可以通过将处理室中的半导体衬底暴露于含有过氧化氢的环境中，其中处理室中的压力为约300托或更小。 在一些实施方案中，过氧化氢分子在处理室中的停留时间为约5分钟或更短。 固化过程温度可以设定在约500℃或更低。 固化过程可用于固化可流动介电材料，并且可以提供高度均匀的固化结果，例如在批处理室中固化的一批半导体衬底。

公开(公告)号：US12243757B2

公开(公告)日：2025-03-04

申请号：US17323288

申请日：2021-05-18

Applicant: ASM IP Holding B.V.

Inventor： Jeroen de Jonge ,  Sumit Sachdeva ,  Lucian Jdira ,  Julien Laurentius Antonius Maria Keijser ,  Theodorus G. M. Oosterlaken

IPC: H01L21/67 ,  F27B17/00 ,  F27D5/00 ,  F27D9/00 ,  H01L21/673

Abstract: The disclosure relates to a flange for a process tube in an apparatus for processing substrates, e.g., a vertical furnace. The flange may be provided with an opening for in use giving access to the process chamber of the process tube and a cooling channel for allowing a cooling fluid to flow there through and cool the flange. A material with a heat conductivity between 0.1 and 40 W/m K may be at least partially provided in between the cooling fluid and the rest of the flange.

公开(公告)号：US20250069911A1

公开(公告)日：2025-02-27

申请号：US18812488

申请日：2024-08-22

Applicant: ASM IP Holding B.V.

Inventor： Lucian Jdira ,  Johannes Maria Theodorus van Eijden ,  Theodorus G.M. Oosterlaken ,  Julien Laurentius Antonius Maria Keijser ,  Radko Bankras ,  Herbert Terhorst

IPC: H01L21/67 ,  H01L21/673

Abstract: An apparatus for processing a plurality of substrates is provided. The apparatus may have a process tube creating a process chamber and a door configured to support substrates in the process chamber and to seal the process chamber. The apparatus may have a gas injector to provide process gas into the process chamber. The gas injector may be operably connected to a process gas line in a purge chamber to purge the connection between the gas injector and the process gas line.

公开(公告)号：US11971217B2

公开(公告)日：2024-04-30

申请号：US17844911

申请日：2022-06-21

Applicant: ASM IP Holding B.V.

Inventor： Theodorus G. M. Oosterlaken ,  Lucian Jdira ,  Herbert Terhorst

IPC: F27B5/04 ,  F27B5/10 ,  F27B5/16 ,  F27B5/18 ,  F27D1/18 ,  F27D3/00

CPC classification number: F27B5/04 ,  F27B5/10 ,  F27B5/16 ,  F27B5/18 ,  F27D1/1858 ,  F27D3/0084

Abstract: Batch furnace assembly for processing wafers, comprising a process chamber housing defining a process chamber and having a process chamber opening, a wafer boat housing defining a water boat chamber, a door assembly, a differential pressure sensor, and a controller. The door assembly has a closed position in which it closes off the process chamber opening. The door assembly defines in a closed position a door assembly chamber having a purge gas inlet for supplying purge gas to the door assembly chamber for gas sealingly separating the process chamber from the wafer boat chamber. The differential pressure sensor assembly fluidly connects to the door assembly chamber and is configured to determine a pressure difference between a pressure in the door assembly chamber and a reference pressure in a reference pressure chamber. The controller is configured to establish whether the pressure difference is in a desired pressure range.

公开(公告)号：US20230008131A1

公开(公告)日：2023-01-12

申请号：US17810773

申请日：2022-07-05

Applicant: ASM IP Holding, B.V.

Inventor： Dieter Pierreux ,  Theodorus G.M Oosterlaken ,  Herbert Terhorst ,  Lucian Jdira ,  Bert Jongbloed

IPC: C23C16/44 ,  C23C16/34 ,  C23C16/52 ,  C23C16/455

Abstract: A chemical vapor deposition furnace for depositing silicon nitride films is disclosed. The furnace having a process chamber elongated in a substantially vertical direction and a wafer boat for supporting a plurality of wafers in the process chamber. A process gas injector inside the process chamber is provided with a plurality of vertically spaced gas injection holes to provide gas introduced at a feed end in an interior of the process gas injector to the process chamber. A valve system connected to the feed end of the process gas injector is being constructed and arranged to connect a source of a silicon precursor and a nitrogen precursor to the feed end for depositing silicon nitride layers. The valve system may connect the feed end of the process gas injector to a cleaning gas system to provide a cleaning gas to remove silicon nitride from the process gas injector and/or the processing chamber.

公开(公告)号：US20190093221A1

公开(公告)日：2019-03-28

申请号：US16130798

申请日：2018-09-13

Applicant: ASM IP Holding B.V.

Inventor： Lucian Jdira ,  Herbert Terhorst ,  Naoto Tsuji ,  Yoshio Susa

IPC: C23C16/448 ,  C23C16/455

Abstract: An apparatus for dispensing a vapor phase reactant to a reaction chamber is disclosed. The apparatus may include: a first chamber configured for holding a source chemical with a first fill level; and a second chamber configured for holding the source chemical with a second fill level and in fluid communication with the first chamber via a fluid channel below the first and second fill levels. The apparatus may also include: a second chamber inlet opening in fluid communication with a pressurizing gas feed provided with a flow controller configured for controlling a flow of a pressurizing gas in the second chamber to control the first fill level in the first chamber. Methods for dispensing a vapor phase reactant are also provided.