公开(公告)号：US20200309802A1

公开(公告)日：2020-10-01

申请号：US16849534

申请日：2020-04-15

Applicant: Abbott Laboratories

Inventor： Roger W. Accurso ,  Jiong Wu ,  Richard G. Kendall ,  James A. Janik ,  Ronald J. Shanafelter ,  Robert Fahey ,  Svitlana Y. Berezhna ,  Trevor David Shields ,  Mahmoud Janbakhsh ,  Daryl Wong ,  Jorge Haro ,  Michael J. Kennedy

IPC: G01N35/02 ,  G01N35/00 ,  G01D5/34 ,  G01N1/31 ,  G01N21/13 ,  G01N35/04

Abstract: Aspects of the present disclosure include systems and methods. According to certain embodiments, provided is an integrated analysis system that includes a first module including a sample analysis component and a first internal container conveyor system. The integrated analysis system further includes a second module including a second internal container conveyor system. The first and second modules are positioned adjacent each other such that the first and second internal container conveyor systems are aligned and adapted to transport containers from the first module to the second module. Also provided are methods of analyzing and preparing samples (e.g., blood and body fluid samples), as well as components that find use within the analysis systems of the present disclosure.

公开(公告)号：US20200003990A1

公开(公告)日：2020-01-02

申请号：US16512856

申请日：2019-07-16

Applicant: Abbott Laboratories

Inventor： Trevor David Shields ,  Robert John Fahey ,  Damian J. Verdnik ,  Svitlana Y. Berezhna ,  Mahmoud Janbakhsh ,  Koshy T. Chacko

IPC: G02B7/38 ,  G02B21/08 ,  G02B21/24

Abstract: Methods, systems and devices for automatically focusing a microscope on a specimen and collecting a focused image of the specimen are provided. Aspects of the methods include detecting the presence of a substrate in a microscope, determining whether the substrate is in a correct orientation for imaging, focusing the microscope on a specimen that is placed on the substrate, and collecting one or more images of the specimen. Systems and devices for carrying out the subject methods are also provided.

公开(公告)号：US10983305B2

公开(公告)日：2021-04-20

申请号：US16512856

申请日：2019-07-16

Applicant: Abbott Laboratories

Inventor： Trevor David Shields ,  Robert John Fahey ,  Damian J. Verdnik ,  Svitlana Y. Berezhna ,  Mahmoud Janbakhsh ,  Koshy T. Chacko

IPC: G02B7/38 ,  G02B21/08 ,  G02B21/24

Abstract: Methods, systems and devices for automatically focusing a microscope on a specimen and collecting a focused image of the specimen are provided. Aspects of the methods include detecting the presence of a substrate in a microscope, determining whether the substrate is in a correct orientation for imaging, focusing the microscope on a specimen that is placed on the substrate, and collecting one or more images of the specimen. Systems and devices for carrying out the subject methods are also provided.

公开(公告)号：US10393997B2

公开(公告)日：2019-08-27

申请号：US15041717

申请日：2016-02-11

Applicant: Abbott Laboratories

Inventor： Trevor David Shields ,  Robert John Fahey ,  Damian John Verdnik ,  Svitlana Y. Berezhna ,  Mahmoud Janbakhsh ,  Koshy Thekkadathu Chacko

IPC: G02B7/38 ,  G02B21/08 ,  G02B21/24

Abstract: Methods, systems and devices for automatically focusing a microscope on a specimen and collecting a focused image of the specimen are provided. Aspects of the methods include detecting the presence of a substrate in a microscope, determining whether the substrate is in a correct orientation for imaging, focusing the microscope on a specimen that is placed on the substrate, and collecting one or more images of the specimen. Systems and devices for carrying out the subject methods are also provided.

公开(公告)号：US20160238826A1

公开(公告)日：2016-08-18

申请号：US15041717

申请日：2016-02-11

Applicant: Abbott Laboratories

Inventor： Trevor David Shields ,  Robert John Fahey ,  Damian John Verdnik ,  Svitlana Y. Berezhna ,  Mahmoud Janbakhsh ,  Koshy Thekkadathu Chacko

IPC: G02B21/00

CPC classification number: G02B7/38 ,  G02B21/088 ,  G02B21/244 ,  G02B21/245

Abstract: Methods, systems and devices for automatically focusing a microscope on a specimen and collecting a focused image of the specimen are provided. Aspects of the methods include detecting the presence of a substrate in a microscope, determining whether the substrate is in a correct orientation for imaging, focusing the microscope on a specimen that is placed on the substrate, and collecting one or more images of the specimen. Systems and devices for carrying out the subject methods are also provided.

Abstract translation: 提供了用于将显微镜自动聚焦在样本上并收集样本的聚焦图像的方法，系统和装置。 方法的方面包括在显微镜中检测基底的存在，确定基底是否处于用于成像的正确取向，将显微镜聚焦在放置在基底上的样本上，以及收集样本的一个或多个图像。 还提供了用于执行主题方法的系统和装置。