公开(公告)号：US10680709B2

公开(公告)日：2020-06-09

申请号：US16329065

申请日：2016-12-19

Applicant: Accelink Technologies Co., Ltd.

Inventor： Zhao Huang ,  Bo Zhang ,  Kun Qian ,  Yi Hu ,  Weidong Ma

IPC: H04B10/079 ,  G02F1/01 ,  G02F1/21 ,  H04B10/548 ,  G02F1/25 ,  H04B10/556 ,  H04B10/564 ,  G02F1/225

Abstract: A debugging method and device for an operating point voltage of a parallel MZI electro-optical modulator. The parallel MZI electro-optical modulator comprises a Parent MZI (2) formed by a parallel connection of a Child MZI (3) in an I path and a Child MZI (4) in a Q path. The debugging method comprises: fixing a bias voltage of one Child MZI of the Child MZI (3) in the I path and the Child MZI (4) in the Q path; gradually adjusting a bias voltage of the other Child MZI, testing a parent extinction ratio PER of the Parent MZI (2) when different bias voltages are applied, and finding a corresponding bias voltage as an operating point voltage of the other Child MZI when the PER of the Parent MZI (2) reaches a minimum value, and then finding a corresponding bias voltage as an operating point voltage of the one Child MZI when the PER of the Parent MZI (2) reaches a minimum value; setting the bias voltages of two Child MZIs as operating point voltages corresponding to the two Child MZIs respectively, adjusting a phase modulation voltage of the Parent MZI (2) until the parallel MZI electro-optical modulator reaches an optimum output effect, and determining the phase modulation voltage of the Parent MZI (2). The method and device are simple; and the debugging process thereof is fast and efficient.

公开(公告)号：US20190273558A1

公开(公告)日：2019-09-05

申请号：US16329065

申请日：2016-12-19

Applicant: Accelink Technologies Co., Ltd.

Inventor： Zhao Huang ,  Bo Zhang ,  Kun Qian ,  Yi Hu ,  Weidong Ma

IPC: H04B10/079 ,  H04B10/548 ,  G02F1/21 ,  G02F1/01

Abstract: A debugging method and device for an operating point voltage of a parallel MZI electro-optical modulator. The parallel MZI electro-optical modulator comprises a Parent MZI (2) formed by a parallel connection of a Child MZI (3) in an I path and a Child MZI (4) in a Q path. The debugging method comprises: fixing a bias voltage of one Child MZI of the Child MZI (3) in the I path and the Child MZI (4) in the Q path; gradually adjusting a bias voltage of the other Child MZI, testing a parent extinction ratio Per of the Parent MZI (2) when different bias voltages are applied, and finding a corresponding bias voltage as an operating point voltage of the other Child MZI when the Per of the Parent MZI (2) reaches a minimum value, and then finding a corresponding bias voltage as an operating point voltage of the one Child MZI when the Per of the Parent MZI (2) reaches a minimum value; setting the bias voltages of the two Child MZIs as operating point voltages corresponding to the two Child MZIs respectively, adjusting a phase modulation voltage of the Parent MZI (2) until an output effect of the parallel MZI electro-optical modulator reaches the best, and determining the phase modulation voltage of the Parent MZI (2). The method and device are simple; and the debugging process thereof is fast and efficient.