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公开(公告)号：US10328717B2
公开(公告)日：2019-06-25
申请号：US15841944
申请日：2017-12-14
Inventor： Zijian Zheng , Zemin Wu , Junyang Xiao , Zhihui Yang , Xicong Li , Song Li , Bo Wang , Wei Guo
Abstract: The present disclosure relates to a marking method and device, and a repair system for a display panel in the field of display panel detection. The marking device includes: magnifying component and a marking component. The magnifying component is configured to magnify a target position point on a target object, and the marking component is configured to mark the target position point on the target object in accordance with the magnified target position point. The present disclosure may solve the problem that the operation process of marking the defective position point is complicated and simplify the operation process of marking the defective position point. The present disclosure may mark the defects of the display panel.
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公开(公告)号：US20180297375A1
公开(公告)日：2018-10-18
申请号：US15841944
申请日：2017-12-14
Inventor： Zijian Zheng , Zemin Wu , Junyang Xiao , Zhihui Yang , Xicong Li , Song Li , Bo Wang , Wei Guo
CPC classification number: B41J2/435 , B41J2/13 , B41J2/14 , B41J2002/14193
Abstract: The present disclosure relates to a marking method and device, and a repair system for a display panel in the field of display panel detection. The marking device includes: magnifying component and a marking component. The magnifying component is configured to magnify a target position point on a target object, and the marking component is configured to mark the target position point on the target object in accordance with the magnified target position point. The present disclosure may solve the problem that the operation process of marking the defective position point is complicated and simplify the operation process of marking the defective position point. The present disclosure may mark the defects of the display panel.
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公开(公告)号：US20240288376A1
公开(公告)日：2024-08-29
申请号：US18023810
申请日：2022-03-01
Applicant: BOE TECHNOLOGY GROUP CO., LTD.
Inventor： Xing Li , Ruize Li , Hao Tang , Ronghua Lan , Jiuyang Cheng , Meng Guo , Zhihui Yang , Qing Zhang , Xuehui Zhu , Quanguo Zhou , Lijia Zhou , Yong Qiao , Zhong Huang , Lirong Xu
CPC classification number: G01N21/8851 , G01N21/892 , G06T7/0004 , G06T7/13 , G06V10/44 , G01N2021/8887 , G01N2021/891 , G01N2201/0438 , G01N2201/06146 , G06T2207/30108 , H10K71/70
Abstract: A curved substrate bubble detection method includes: providing, by a first light source and a second light source, parallel light incident to a to-be-tested substrate in different incident directions; obtaining, by a linear array camera, a first image including image information of a first side edge of the to-be-tested substrate; determining location information of a defect region of the to-be-tested substrate according to the first image, and generating a second image including image information of the defect region; binarizing the second image, and determining that the to-be-tested substrate has a bubble defect if there are at least two bright spots in an obtained binarized image, and a distance between any two first bright spots of at least two first bright spots is less than a first preset value. A curved substrate bubble detection system is also disclosed.
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