公开(公告)号：US12205269B2

公开(公告)日：2025-01-21

申请号：US17784073

申请日：2021-06-11

Applicant: BOE TECHNOLOGY GROUP CO., LTD.

Inventor： Hao Tang ,  Ronghua Lan ,  Jiuyang Cheng ,  Shuo Zhou ,  Zhong Huang ,  Guo Jiang ,  Li Wang ,  Lijia Zhou ,  Zhidong Wang ,  Lirong Xu ,  Quanguo Zhou

IPC: G06T7/00 ,  G06V10/25 ,  G06V10/26

Abstract: A method for detecting a display panel defect, including: collecting a panel image of a to-be-detected display panel, a plurality of first pixels of the display panel corresponding to a plurality of second pixels in the panel image; converting the panel image into a binary image; dilating each bright spot region in the binary image such that adjacent bright spot regions communicate with each other to form at least one closed communication region in the binary image; determining a region of interest mask image in the binary image in accordance with the at least one closed communication region; determining a region of interest in accordance with the region of interest mask image and the panel image; and performing feature identification on the region of interest to determine a defect of the display panel.

公开(公告)号：US20240288376A1

公开(公告)日：2024-08-29

申请号：US18023810

申请日：2022-03-01

Applicant: BOE TECHNOLOGY GROUP CO., LTD.

Inventor： Xing Li ,  Ruize Li ,  Hao Tang ,  Ronghua Lan ,  Jiuyang Cheng ,  Meng Guo ,  Zhihui Yang ,  Qing Zhang ,  Xuehui Zhu ,  Quanguo Zhou ,  Lijia Zhou ,  Yong Qiao ,  Zhong Huang ,  Lirong Xu

IPC: G01N21/88 ,  G01N21/89 ,  G01N21/892 ,  G06T7/00 ,  G06T7/13 ,  G06V10/44 ,  H10K71/70

CPC classification number: G01N21/8851 ,  G01N21/892 ,  G06T7/0004 ,  G06T7/13 ,  G06V10/44 ,  G01N2021/8887 ,  G01N2021/891 ,  G01N2201/0438 ,  G01N2201/06146 ,  G06T2207/30108 ,  H10K71/70

Abstract: A curved substrate bubble detection method includes: providing, by a first light source and a second light source, parallel light incident to a to-be-tested substrate in different incident directions; obtaining, by a linear array camera, a first image including image information of a first side edge of the to-be-tested substrate; determining location information of a defect region of the to-be-tested substrate according to the first image, and generating a second image including image information of the defect region; binarizing the second image, and determining that the to-be-tested substrate has a bubble defect if there are at least two bright spots in an obtained binarized image, and a distance between any two first bright spots of at least two first bright spots is less than a first preset value. A curved substrate bubble detection system is also disclosed.