PHOTO-ASSISTED ELECTRON BEAM EMITTER

    公开(公告)号:US20250062095A1

    公开(公告)日:2025-02-20

    申请号:US18799382

    申请日:2024-08-09

    Abstract: An electron beam emitter apparatus includes a light source and a radio frequency (“RF”) source. In another aspect, an apparatus includes direct density modulation of photo-assisted field emission from a radio frequency cold cathode. A further aspect provides a radio frequency source connected to an electron emitter or cold cathode having tapered projections, and a photon emitter such as a laser, infrared light or ultraviolet light.

    Microscale Gas Breakdown Device And Process
    3.
    发明申请

    公开(公告)号:US20200033293A1

    公开(公告)日:2020-01-30

    申请号:US16523255

    申请日:2019-07-26

    Abstract: A microscale gas breakdown device includes a first surface and a second surface. The first surface and the second surface define a gap distance. The device includes a perturbation on the first surface or the second surface. The perturbation is defined by a height value and a radius value. The device includes a current source or a voltage source configured to apply a current or a voltage across the first surface and the second surface. In response to the current or the voltage being applied, a resulting discharge travels along a first discharge path in response to being exposed to a high pressure and a second discharge path in response to being exposed to a low pressure.

    Tunneling Electrical Contacts
    4.
    发明申请

    公开(公告)号:US20190393087A1

    公开(公告)日:2019-12-26

    申请号:US16448160

    申请日:2019-06-21

    Abstract: A method of constructing an electrical contact including a contact element positioned between a first contact member and a second contact member. The method includes defining a transmission line model to represent operation of the electrical contact. The transmission line model indicates a contact resistance and a specific contact resistivity along a length of the contact element. The method includes determining a current flow profile of the contact element. The current flow profile is determined based on a current distribution using the transmission line model. The method includes determining one of: (i) a material, (ii) a thickness, and (iii) a geometry of the contact element based on the contact resistance and the current flow profile of the transmission line model. The method includes constructing the contact element positioned between the first contact member and the second contact member with the at least one of (i) the material, (ii) the thickness, and (iii) the geometry.

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