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公开(公告)号:US20220285299A1
公开(公告)日:2022-09-08
申请号:US17748817
申请日:2022-05-19
Inventor: Yaoyu PANG , Steven A. ATHERTON
IPC: H01L23/00
Abstract: A semiconductor die may be coupled to a printed circuit board using a solder ball. The semiconductor die comprises a redistribution layer formed above a semiconductor chip, a polymer layer formed on the redistribution layer, and an Under Bump Metallurgy (UBM) layer formed on the polymer layer. The polymer layer comprises a plurality of vias, which electrically couple the UBM layer to the redistribution layer. The entire UBM layer may be deposited with a continuously flat upper surface for coupling to the solder ball. The plurality of vias may be positioned such that they are centered on a point that is not central to the UBM layer.
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公开(公告)号:US20230088252A1
公开(公告)日:2023-03-23
申请号:US17993638
申请日:2022-11-23
Inventor: Craig MCADAM , Jonathan TAYLOR , Douglas MACFARLANE , John KERR , James MUNGER , John PAVELKA , Steven A. ATHERTON
IPC: H01L23/498 , H01L23/00
Abstract: The present disclosure relates to a chip scale package (CSP) comprising: a first set of CSP contact balls or bumps; a second set of CSP contact balls or bumps; and a channel routing region, the channel routing region being devoid of any CSP contact balls or bumps.
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公开(公告)号:US20220246514A1
公开(公告)日:2022-08-04
申请号:US17245259
申请日:2021-04-30
Inventor: Craig MCADAM , Jonathan TAYLOR , Douglas MACFARLANE , John KERR , James MUNGER , John PAVELKA , Steven A. ATHERTON
IPC: H01L23/498 , H01L23/00
Abstract: The present disclosure relates to a chip scale package (CSP) comprising: a first set of CSP contact balls or bumps; a second set of CSP contact balls or bumps; and a channel routing region, the channel routing region being devoid of any CSP contact balls or bumps.
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公开(公告)号:US20200343206A1
公开(公告)日:2020-10-29
申请号:US16857606
申请日:2020-04-24
Inventor: Yaoyu PANG , Steven A. ATHERTON
IPC: H01L23/00
Abstract: A semiconductor die may be coupled to a printed circuit board using a solder ball. The semiconductor die comprises a redistribution layer formed above a semiconductor chip, a polymer layer formed on the redistribution layer, and an Under Bump Metallurgy (UBM) layer formed on the polymer layer. The polymer layer comprises a plurality of vias, which electrically couple the UBM layer to the redistribution layer. The entire UBM layer may be deposited with a continuously flat upper surface for coupling to the solder ball. The plurality of vias may be positioned such that they are centered on a point that is not central to the UBM layer.
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