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    1.
    发明公开

    公开(公告)号:US20240282560A1

    公开(公告)日:2024-08-22

    申请号:US18571542

    申请日:2022-06-24

    CPC classification number: H01J49/0031 H01J49/0036 H01J49/40 H01J49/4215

    Abstract: The technology relates to systems and methods for performing mass spectrometry analysis of a sample. An example method may include receiving, as input via an input device, a target mass-to-charge (m/z) ratio for a fragment ion of interest; setting a target m/z range based on the target m/z ratio; ionizing the sample to generate precursor ions; fragmenting the precursor ions to generate fragment ions having a range of mass-to-charge ratios larger than the target m/z range; accelerating the fragment ions to a detector such that fragment ions inside and outside of the target m/z ratio are detected; summing a count of fragment ions within the target m/z range without storing ion counts for fragment ions outside of the target m/z range; and storing the summed ion count as corresponding with the target mass-to-charge ratio.

    STANDARD ADDITION WORKFLOW FOR QUANTITATIVE ANALYSIS

    公开(公告)号:US20240339311A1

    公开(公告)日:2024-10-10

    申请号:US18294386

    申请日:2022-08-05

    CPC classification number: H01J49/0031 H01J49/165

    Abstract: A method for measuring a concentration of an analyte in a sample includes: sampling, from a first sample, a first one or more droplets for mass analysis, wherein the first sample includes the sample; performing mass analysis on the first one or more droplets to determine a first intensity of an analyte in the first one or more droplets; sampling, from a second sample, a second one or more droplets for mass analysis, wherein the sec-ond sample includes the sample and a first spike of the analyte; performing mass analysis on the second one or more droplets to determine a second intensity of the analyte in the second one or more droplets; fitting a curve to the first intensity and the second intensity; and based on the fitted curve, calculating an analyte concentration for the sample.

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