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公开(公告)号:US20200335394A1
公开(公告)日:2020-10-22
申请号:US16090059
申请日:2017-03-29
Applicant: EBARA CORPORATION
Inventor: Keiichi KURASHINA , Taiki ISHITSUKA , Shinji OMATA , Mitsuhiro SHAMOTO , Makoto KUBOTA
IPC: H01L21/768 , H01L21/02 , H01L23/532 , H01L23/00
Abstract: To prevent a tin alloy from coming into contact with a copper wiring layer when a tin alloy bump layer is reflowed. According to an aspect of the present invention, a method of manufacturing a substrate having a bump at a resist opening is provided. The method of manufacturing a substrate includes a step of forming a copper wiring layer on the substrate by plating at a first temperature, a step of forming a barrier layer on the copper wiring layer by plating at a second temperature that is approximately equal to the first temperature, and a step of forming a tin alloy bump layer on the barrier layer by plating.
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公开(公告)号:US20240318346A1
公开(公告)日:2024-09-26
申请号:US18026774
申请日:2022-04-21
Applicant: EBARA CORPORATION
Inventor: Shinji OMATA , Masaki TOMITA , Kentaro YAMAMOTO , Yasuyuki MASUDA
CPC classification number: C25D17/002 , C25D17/02 , C25D17/06 , C25D21/04
Abstract: Provided is a technique that ensures suppressing deterioration of plating quality of a substrate due to gas bubbles at an anode.
A plating module 400 includes a plating tank 10 configured to house a plating solution, an anode 13 arranged in the plating tank 10, a substrate holder 20 configured to hold a substrate WF with a surface to be plated facing downward so as to be opposed to the anode 13, a membrane module 40 that includes a first membrane 41 partitioning an inside of the plating tank 10 into an anode chamber 11 and a cathode chamber 12 and a second membrane 42 arranged between the first membrane 41 and the anode 13, and a pipe member 31 communicating between a first region R1 below the anode 13 in the plating tank 10 and a second region R2 between the first membrane 41 and the second membrane 42.
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