公开(公告)号：US20170242782A1

公开(公告)日：2017-08-24

申请号：US15051503

申请日：2016-02-23

Applicant: FUJITSU LIMITED

Inventor： Hiroaki YOSHIDA ,  Ripon Kumar SAHA ,  Mukul R. PRASAD

IPC: G06F11/36 ,  G06F17/30

CPC classification number: G06F11/3688 ,  G06F9/44589 ,  G06F11/362 ,  G06F11/3664 ,  G06F11/3692 ,  G06F17/3053 ,  G06F2201/81 ,  G06F2201/86 ,  G06F2201/865 ,  G06F2201/88

Abstract: According to an aspect of an embodiment, a method may include identifying a fault at a fault location in a software program using a test suite. The method may also include determining multiple textual similarity scores by determining a textual similarity score with respect to each of multiple repair candidates for the fault. In addition, the method may include sorting the repair candidates based on the textual similarity scores. The method may also include selecting a particular repair candidate from the repair candidates based on the sorting. Moreover, the method may include implementing the particular repair candidate at the fault location based on the selection of the particular repair candidate.