Abstract:
Apparatuses, systems, and methods are disclosed for reconfiguring an array of storage elements. A storage element error module is configured to determine that one or more storage elements in an array of storage elements are in error. An array of storage elements stores a first ECC block and first parity data generated from the first ECC block. A data reconfiguration module is configured to generate a second ECC block comprising at least a portion of data of a first ECC block. A new configuration storage module is configured to store a second ECC block and associated second parity data on fewer storage elements than a number of storage elements in an array.
Abstract:
An apparatus and system are disclosed for a storage area network (“SAN”). In one embodiment, a computer system includes an internal storage device and an internal storage controller. In this embodiment, the internal storage controller is configured to implement a SAN that includes at least the internal storage device and a storage device external to the computer system. In this embodiment, the internal storage controller is further configured to service a storage request received from a client that involves data stored by the internal storage device. In this embodiment, the internal storage controller is configured to communicate with the external storage device via a network.
Abstract:
An apparatus, system, and method are disclosed for reconfiguring an array of solid-state storage elements. The method includes determining that one or more storage elements are unavailable to store data. The storage elements are configured in an array of N storage elements that each store a portion of a first ECC chunk and P storage elements that store first parity data corresponding to the first ECC chunk. The method includes generating a second ECC chunk comprising at least a portion of the data of the first ECC chunk. The method includes storing the second ECC chunk and associated second parity data across (N+P)−Z storage elements where 1≦Z≦P.
Abstract:
An apparatus, system, and method are disclosed for reconfiguring an array of solid-state storage elements. The method includes determining that one or more storage elements are unavailable to store data. The storage elements are configured in an array of N storage elements that each store a portion of a first ECC chunk and P storage elements that store first parity data corresponding to the first ECC chunk. The method includes generating a second ECC chunk comprising at least a portion of the data of the first ECC chunk. The method includes storing the second ECC chunk and associated second parity data across (N+P)−Z storage elements where 1≦Z≦P.
Abstract:
An apparatus, system, and method are disclosed for testing physical regions in a solid-state storage device. The method includes defining a physical storage region on solid-state storage media of a solid-state storage device. The physical storage region includes a subset of storage capacity of the solid-state storage media. The method includes implementing the physical storage region definition on a storage controller such that memory operations are bounded to the physical storage region. The method includes testing wear of solid-state storage media associated with the physical storage region using memory operations bounded to the physical storage region.
Abstract:
An apparatus, system, and method are disclosed for solid-state storage as cache for high-capacity, non-volatile storage. The apparatus, system, and method are provided with a plurality of modules including a cache front-end module and a cache back-end module. The cache front-end module manages data transfers associated with a storage request. The data transfers between a requesting device and solid-state storage function as cache for one or more HCNV storage devices, and the data transfers may include one or more of data, metadata, and metadata indexes. The solid-state storage may include an array of non-volatile, solid-state data storage elements. The cache back-end module manages data transfers between the solid-state storage and the one or more HCNV storage devices.
Abstract:
Apparatuses, systems, and methods are disclosed for reconfiguring an array of storage elements. A storage element error module is configured to determine that one or more storage elements in an array of storage elements are in error. An array of storage elements stores a first ECC block and first parity data generated from the first ECC block. A data reconfiguration module is configured to generate a second ECC block comprising at least a portion of data of a first ECC block. A new configuration storage module is configured to store a second ECC block and associated second parity data on fewer storage elements than a number of storage elements in an array.
Abstract:
An apparatus, system, and method are disclosed for testing physical regions in a solid-state storage device. The method includes defining a physical storage region on solid-state storage media of a solid-state storage device. The physical storage region includes a subset of storage capacity of the solid-state storage media. The method includes implementing the physical storage region definition on a storage controller such that memory operations are bounded to the physical storage region. The method includes testing wear of solid-state storage media associated with the physical storage region using memory operations bounded to the physical storage region.
Abstract:
Apparatuses, systems, and methods are disclosed for reconfiguring an array of storage elements. A storage element error module is configured to determine that one or more storage elements in an array of storage elements are in error. An array of storage elements stores a first ECC block and first parity data generated from the first ECC block. A data reconfiguration module is configured to generate a second ECC block comprising at least a portion of data of a first ECC block. A new configuration storage module is configured to store a second ECC block and associated second parity data on fewer storage elements than a number of storage elements in an array.
Abstract:
A storage controller is configured to append data to a sequential log. The data may be appended sequentially within erase regions of the non-volatile storage medium. An order of the sequential log may be defined by, inter alia, the order in which the erase regions are filled and/or the sequential order of physical storage locations and/or addresses within the erase regions. The erase regions may comprise sequence information which may be applied in response to recovering the erase regions, appending data to the erase regions, or the like. Data appended to the sequential log may be associated with source parameters, which may include a virtual identifier of the data. The physical storage location of the data on the non-volatile storage medium may be independent of the source parameters. The sequential log may, therefore, comprise a set of mappings between virtual identifiers and physical storage locations.