公开(公告)号：US20140159733A1

公开(公告)日：2014-06-12

申请号：US13836493

申请日：2013-03-15

Applicant: GENESIS PHOTONICS INC

Inventor： TAI-CHENG TSAI ,  TAI-WEI WU ,  HSIN-HUNG LIN ,  PING-TSUNG TSAI ,  GWO-JIUN SHEU ,  SHOU-WEN HSU ,  YUN-LI LI

IPC: G01R31/44

CPC classification number: G01R31/44 ,  G01J1/0223 ,  G01J2001/0481 ,  G01J2001/4247 ,  G01R31/2635

Abstract: A detection apparatus for light-emitting diode chip comprising a light-collecting apparatus having an opening, a bracing component and a probing device is disclosed. The bracing component is designed to bear at least one light-emitting diode chip. The probing device comprises a power supply and at least two flexible current-transporting elements. The two ends of the current-transporting elements are respectively electrically connected to the light-emitting diode chip and the power supply to enable the light-emitting diode chip to emit light beams. Besides, the detection apparatus for light-emitting diode chip of the present invention further comprises a thimble to push the light-emitting diode chip into the inside of the light-collecting apparatus via the opening such that the light beams emitted by the light-emitting diode chip are collected by the light-collecting apparatus.

Abstract translation: 公开了一种发光二极管芯片的检测装置，其包括具有开口的光收集装置，支撑部件和探测装置。 支撑部件被设计成承载至少一个发光二极管芯片。 探测装置包括电源和至少两个柔性电流传输元件。 电流传输元件的两端分别电连接到发光二极管芯片和电源，以使得发光二极管芯片能够发射光束。 此外，本发明的发光二极管芯片的检测装置还包括通过开口将发光二极管芯片推入集光装置的内部的套管，使得由发光二极管芯片发出的光束 二极管芯片由光收集装置收集。