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1.发明公开公开(公告)号：US20240035883A1
公开(公告)日：2024-02-01
申请号：US17815699
申请日：2022-07-28
Applicant: GRAMM INC.
Inventor： Jisoo LEE
CPC classification number: G01J1/4257 , G01J1/0407 , G01J1/58 , H05B47/20 , G01J2001/0481
Abstract: Disclosed is a device for inspecting optical power measurement of a light emitter, the device including: a reference light emitter; a measurer configured to measure optical power by receiving light emitted from one of the reference light emitter and a plurality of inspection target light emitters, the measurer including an integrating sphere, a photodiode detector, and a photocurrent or photovoltage measurement device; and a controller configured to calculate a first average of optical power of the plurality of inspection target light emitters by measuring first optical power of a first inspection target light emitter among the plurality of inspection target light emitters, and generate an alarm to stop using the measurer when a difference between the first average and a second optical power of the reference light emitter exceeds a first threshold. Thus, the inspection is more accurately and reliably carried out.
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公开(公告)号：US09915561B1
公开(公告)日：2018-03-13
申请号：US15245660
申请日：2016-08-24
Applicant: International Business Machines Corporation
Inventor： Jason S. Orcutt , Paul M. Solomon
CPC classification number: G01J1/44 , G01J1/0204 , G01J1/0228 , G01J1/0425 , G01J1/0448 , G01J1/0459 , G01J2001/0481 , G02B6/12004 , G02B6/1228 , G02B6/4274 , G02B2006/12154 , H04B10/697
Abstract: A photoreceiver device includes a light detector connected between a power supply node and a first node, and first to third switching elements. The light detector is configured to detect an incident optical data signal, and to output photocurrent corresponding to a magnitude of the optical data signal through the first node. The first switching element is connected between the first node and a ground node. The second switching element is connected between the power supply node and a second node. The third switching element is connected between the second node and the ground node. The third switching element has a control node connected to the first node.
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公开(公告)号：US20160327429A1
公开(公告)日：2016-11-10
申请号：US15113791
申请日：2014-08-20
Applicant: ISMECA SEMICONDUCTOR HOLDING SA
Inventor： Sylvain VIENOT
CPC classification number: G01J1/044 , G01J1/0214 , G01J1/0223 , G01J1/0271 , G01J1/0474 , G01J1/42 , G01J2001/0481 , G01J2001/4252
Abstract: A testing device for measuring the light characteristics of an electronic component includes an inlet at one end at which an electronic component can be presented for testing. A shutter is located at the inlet and is moveable between a first open position in which an electronic component can be received into the inlet, and a second closed position in which the shutter can overlay at least the majority of a nest on which said electronic component is supported, so that the shutter prevents light emitted by the electronic component from being diverted away from the testing device. The shutter includes at least one sliding door that can be slid to move the shutter into its first and second open positions. The at least one sliding door includes a cut out portion that defines said opening when the shutter is in its second closed position.
Abstract translation: 用于测量电子部件的光特性的测试装置包括在一端的入口，在该入口处可以呈现用于测试的电子部件。 快门位于入口处，并且可以在电子部件可以被容纳在入口中的第一打开位置和第二关闭位置之间移动，在该第二关闭位置中，快门可以至少覆盖所述电子部件 被支撑，使得快门防止由电子部件发射的光被转移离开测试装置。 快门包括至少一个可滑动的滑动门，以将快门移动到其第一和第二打开位置。 至少一个滑动门包括当快门处于其第二关闭位置时限定所述开口的切口部分。
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公开(公告)号：US09442010B2
公开(公告)日：2016-09-13
申请号：US14407626
申请日：2012-06-15
Applicant: Naoharu Yanagawa
Inventor： Naoharu Yanagawa
CPC classification number: G01J3/0254 , G01J1/08 , G01J2001/0481
Abstract: The light measurement apparatus according to the present invention includes: an integrating sphere; a reference calibration light source body holding unit that is arranged on the integrating sphere and to which a reference calibration light source body is attached; a test light source body holding unit that is arranged on the integrating sphere and to which a test light source body to be measured is attached; a light detection unit that is arranged on the integrating sphere and detects light from the reference calibration light source body and the test light source body; and a control unit that controls lighting of the reference calibration light source body and the test light source body, the light measurement apparatus being configured so that only either one of the reference calibration light source body and the test light source body is able to selectively emit light in the integrating sphere.
Abstract translation: 根据本发明的光测量装置包括：积分球; 参考校准光源体保持单元，其布置在所述积分球上并附着有基准校准光源体; 测试光源体保持单元，其布置在所述积分球上，并且附接有待测量的测试光源体; 光检测单元，布置在积分球上并检测来自基准校准光源体和测试光源体的光; 以及控制单元，其控制所述基准校准光源体和所述测试光源体的照明，所述光测量装置被配置为使得仅所述参考校准光源体和所述测试光源体中的任一个能够选择性地发射 光在积分球。
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5.发明授权公开(公告)号：US09404962B2
公开(公告)日：2016-08-02
申请号：US14038696
申请日：2013-09-26
Applicant: EPISTAR CORPORATION
Inventor： Ming-Hong Huang , Pei-Hsiang Tseng , Pei-Hsiu Shih , Chia-Hung Yu , Min-Shun Huang
CPC classification number: G01R31/2635 , G01J1/0422 , G01J1/42 , G01J2001/0481 , G01J2001/4252
Abstract: An apparatus for measuring the optoelectronic characteristics of a light-emitting diode includes: a container including a light input port and a light output port; a measurement module connected to the light output port of the container; a sample holder under the container for holding a light-emitting diode under test, wherein a surface of the measurement module reflects more than 50% of the luminous flux generated by the light-emitting diode under test; and a light gathering unit between the container and the sample holder, wherein an interior wall of the light gathering unit reflects more than 50% of the luminous flux generated by the light-emitting diode under test.
Abstract translation: 一种用于测量发光二极管的光电特性的装置，包括：包括光输入端口和光输出端口的容器; 连接到容器的光输出端口的测量模块; 用于保持被测试的发光二极管的容器下面的样品保持器，其中测量模块的表面反映了由被测发光二极管产生的光通量的50％以上; 以及在所述容器和所述样品保持器之间的聚光单元，其中所述聚光单元的内壁反射由被测试的发光二极管产生的光通量的50％以上。
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Patent Agency Ranking
公开(公告)号：US20160178431A1
公开(公告)日：2016-06-23
申请号：US14804613
申请日：2015-07-21
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Joon Sub LEE , Seung Won PARK
CPC classification number: G01J1/42 , G01J1/58 , G01J3/0254 , G01J2001/0481 , G01J2001/4252
Abstract: A light measuring system including an integrating sphere having an aperture configured by opposing reflectors selectively aligned with complementary reflectors of at least one light source mounting block having a light source mounting region for mounting a light source thereon.
Abstract translation: 一种光测量系统，包括具有开口的积分球，所述积分球由相对的反射器配置，所述反射器选择性地与具有用于在其上安装光源的光源安装区域的至少一个光源安装块的互补反射器对准。
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公开(公告)号：US09157867B2
公开(公告)日：2015-10-13
申请号：US13826973
申请日：2013-03-14
Applicant: Romik Chatterjee , Robert Martin Eastlund , Christopher Jan Koci , Archer Forrest Finley
CPC classification number: G01N21/9501 , G01J2001/0481 , G01N21/8806
Abstract: A lighting dome that can be used to inspect semiconductor wafers includes a small aperture, and can include backlighting, a reflectance gradient and/or a broad spectrum light source. A pin hole lens is aligned with the small aperture.
Abstract translation: 可用于检查半导体晶片的照明圆顶包括小孔，并且可以包括背光，反射梯度和/或广谱光源。 针孔透镜与小孔对齐。
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公开(公告)号：US20140078507A1
公开(公告)日：2014-03-20
申请号：US14022783
申请日：2013-09-10
Applicant: BlueLight Analytics, Inc.
Inventor： Daniel LABRIE , Ivan Kostylev , Chris Felix
CPC classification number: G01J1/0474 , A61C19/003 , G01J1/0204 , G01J1/0219 , G01J1/0271 , G01J1/0425 , G01J1/0488 , G01J3/0205 , G01J3/0218 , G01J3/0254 , G01J3/0256 , G01J3/0264 , G01J2001/0481 , G01J2001/4247 , G01M11/0235 , G01N21/55 , G02B5/02 , G02B5/021 , G02B5/0284
Abstract: The invention features devices and methods for collecting and measuring light from external light sources. In general, the devices of the invention feature a light diffusing element, e.g., as a component of a light collector, connected by a light conducting conduit, e.g., a fiber optic cable, to a light measuring device, e.g., a spectrometer. This light diffusing element allows, e.g., for substantially uniform light diffusion across its surface and thus accurate measurements, while permitting the total footprint of the device to remain relatively small and portable. This light diffusing element also allows flexibility in scaling of the device to permit use in a wide range of applications.
Abstract translation: 本发明的特征在于用于收集和测量来自外部光源的光的装置和方法。 通常，本发明的装置的特征在于光漫射元件，例如作为光收集器的部件，通过诸如光纤电缆的导光导管连接到诸如光谱仪的光测量装置。 该光漫射元件允许例如在其表面上实质上均匀的光扩散，从而允许精确的测量，同时允许设备的总占地面积保持相对较小和便携。 该光散射元件还允许设备的缩放的灵活性，以允许在广泛的应用中使用。
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公开(公告)号：US08625088B2
公开(公告)日：2014-01-07
申请号：US13511220
申请日：2010-02-02
Applicant: Seongchong Park , Dong Hoon Lee , Seung Nam Park
Inventor： Seongchong Park , Dong Hoon Lee , Seung Nam Park
IPC: G01J1/42
CPC classification number: G01J1/02 , G01J1/0295 , G01J2001/0481 , G01J2001/061 , G01J2001/4247
Abstract: Provided are an integrating sphere photometer and a measuring method of the same. The integrating sphere photometer includes an integrating sphere including a left hemisphere and a right hemisphere, a photometer disposed on the center surface of the right hemisphere, a photometer baffle disposed in front of the photometer to be spaced apart therefrom, a light source to be tested disposed at the center region of the integrating sphere to illuminate light to at least an illumination region of the left hemisphere, an auxiliary lamp part disposed in the vicinity of a contact region between the left hemisphere and the right hemisphere to illuminate light to the illumination region, and an auxiliary lamp baffle disposed around the auxiliary lamp part to prevent the light emitted from the light source to be tested from being directly illuminated to the auxiliary lamp part and also to prevent the light emitted from the auxiliary lamp part from being directly illuminated to the light source to be tested.
Abstract translation: 提供一种积分球光度计及其测量方法。 积分球形光度计包括包括左半球和右半球的积分球，设置在右半球的中心表面上的光度计，设置在光计前面以与之隔开的光度计挡板，待测光源 设置在积分球的中心区域，以将光照射到左半球的至少一个照明区域;辅助灯部分，设置在左半球和右半球之间的接触区域附近，以将光照射到照明区域 以及设置在辅助灯部分周围的辅助灯挡板，以防止从光源发射的光被直接照射到辅助灯部分，并且还防止从辅助灯部分发射的光被直接照射到 要测试的光源。
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公开(公告)号：US20130201321A1
公开(公告)日：2013-08-08
申请号：US13741561
申请日：2013-01-15
Applicant: Epistar Corporation
Inventor： Tang-Chung Chao , Pei-Hsiang Tseng , Jia-Kuan Kuo , Guan-Hung Wu , Yuan-Hao Su , Chi-Hsin Ho , Chia-Liang Hsu , Chih-Chiang Lu
IPC: G01J1/04
CPC classification number: G01J1/0474 , G01J1/4228 , G01J2001/0481 , G01J2001/4252 , G01R31/2635
Abstract: Disclosed is a method for testing a light-emitting device comprising the steps of: providing an integrating sphere comprising an inlet port and a first exit port; disposing the light-emitting device close to the inlet port of the integrating sphere; providing a current source to drive the light-emitting device to form an image of the light-emitting device in driven state; providing an image receiving device and to receive the image of the light-emitting device, wherein the image receiving device is connected to the first exit port of the integrating sphere; and determining a luminous intensity of the light-emitting device according to the image. An apparatus for testing a light-emitting device is also disclosed. The apparatus for testing a light-emitting device comprises: an integrating sphere comprising an inlet port and a first exit port, wherein the light-emitting device is disposed close to the inlet port of the integrating sphere; an image receiving device connected to the first exit port of the integrating sphere for receiving an image of the light-emitting device; and a processing unit coupled to image receiving device for determining a luminous intensity of the light-emitting device.
Abstract translation: 公开了一种用于测试发光器件的方法，包括以下步骤：提供包括入口和第一出口的积分球; 将发光装置配置在靠近积分球的入口的位置; 提供电流源以驱动所述发光器件以在驱动状态下形成所述发光器件的图像; 提供图像接收装置并且接收所述发光装置的图像，其中所述图像接收装置连接到所述积分球的所述第一出口; 以及根据图像确定发光装置的发光强度。 还公开了一种用于测试发光器件的装置。 用于测试发光装置的装置包括：积分球，包括入口和第一出口，其中所述发光装置设置成靠近所述积分球的入口; 连接到积分球的第一出口的图像接收装置，用于接收发光装置的图像; 以及耦合到图像接收装置的处理单元，用于确定发光装置的发光强度。
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