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公开(公告)号：US20190295676A1
公开(公告)日：2019-09-26
申请号：US15928587
申请日：2018-03-22
Applicant: GLOBALFOUNDRIES INC.
Inventor： Igor ARSOVSKI , Kyle M. HOLMES
Abstract: The present disclosure relates to a device including a built-in-self-test (BIST) circuit configured to run a BIST pattern in a loop mode on a memory which is customized for activity factors corresponding to a programmable number of operations, the BIST circuit being further configured to measure dynamic power on a supply while running the BIST pattern in the loop mode on the memory.
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