公开(公告)号：US20180286491A1

公开(公告)日：2018-10-04

申请号：US15478666

申请日：2017-04-04

Applicant: GLOBALFOUNDRIES INC.

Inventor： Igor ARSOVSKI ,  Eric D. HUNT-SCHROEDER ,  Michael A. ZIEGERHOFER

IPC: G11C29/12 ,  G06F12/1027 ,  G06F12/0806 ,  G06F12/1009

CPC classification number: G11C29/12 ,  G06F12/1027 ,  G06F2212/65 ,  G06F2212/68 ,  G11C8/16 ,  G11C2029/0409

Abstract: The present disclosure relates to a structure which includes a memory which is configured to enable zero test time built-in self-test (BIST) at a read/write port while concurrently performing at least one functional read operation at a read port.