Large-area probe card and method of manufacturing the same
    1.
    发明授权
    Large-area probe card and method of manufacturing the same 有权
    大面积探针卡及其制造方法

    公开(公告)号:US09459286B2

    公开(公告)日:2016-10-04

    申请号:US14463056

    申请日:2014-08-19

    Abstract: A large-area probe card and method of manufacturing the same including an insulation plate including at least one contactor formed thereon, a main substrate disposed below the insulation plate, and a flexible signal connector vertically passing through the insulation plate and disposed between the at least one contactor and the main substrate to electrically connect the at least one contactor with the main substrate.

    Abstract translation: 一种大面积探针卡及其制造方法,包括:绝缘板,包括形成在其上的至少一个接触器,设置在绝缘板下方的主基板和垂直穿过绝缘板的柔性信号连接器,并且设置在至少 一个接触器和主基板,以将至少一个接触器与主基板电连接。

    Large-Area Probe Card and Method of Manufacturing the Same
    3.
    发明申请
    Large-Area Probe Card and Method of Manufacturing the Same 有权
    大面积探头卡及其制造方法

    公开(公告)号:US20150054541A1

    公开(公告)日:2015-02-26

    申请号:US14463056

    申请日:2014-08-19

    Abstract: A large-area probe card and method of manufacturing the same including an insulation plate including at least one contactor formed thereon, a main substrate disposed below the insulation plate, and a flexible signal connector vertically passing through the insulation plate and disposed between the at least one contactor and the main substrate to electrically connect the at least one contactor with the main substrate.

    Abstract translation: 一种大面积探针卡及其制造方法,包括:绝缘板,包括形成在其上的至少一个接触器,设置在绝缘板下方的主基板和垂直穿过绝缘板的柔性信号连接器,并且设置在至少 一个接触器和主基板,以将至少一个接触器与主基板电连接。

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