公开(公告)号：US20230126790A1

公开(公告)日：2023-04-27

申请号：US17909463

申请日：2021-03-10

Applicant: HIL Applied Medical, Ltd.

Inventor： Evgeny Papeer ,  Alex BESPALI ,  Sagi Brink-Danan ,  Pavel Komm ,  Raphael Van Roermund ,  Indranuj Dey

IPC: A61N5/10

Abstract: Particle therapy systems and methods for treating patients are provided. In one implementation, a particle therapy system may include an interaction chamber for containing a target and an electromagnetic radiation source configured to generate a pulsed electromagnetic radiation beam of at least about 100 terawatts and at a repetition rate of at least about 20 Hz. The particle therapy system may further include optics configured to direct the pulsed electromagnetic radiation beam along a path towards a target in the interaction chamber. The particle therapy system may further include an actuator configured to cause relative movement between the target and the electromagnetic radiation beam at a speed associated with the repetition rate of the electromagnetic radiation source, to thereby vary a location of interaction of the pulsed electromagnetic radiation beam on a surface of the target and thereby cause a resultant emission from the target of at least about 3×106 charged particles per pulse.

公开(公告)号：US11501943B2

公开(公告)日：2022-11-15

申请号：US17253738

申请日：2019-07-09

Applicant: HIL Applied Medical, Ltd.

Inventor： Indranuj Dey ,  Evgeny Papeer ,  Alexander Bespaly ,  Shai Tsipshtein ,  Ynon Hefets ,  Assaf Shaham

IPC: H01J27/24 ,  G21K5/10 ,  H01J3/16 ,  H01J27/02

Abstract: Disclosed are systems and methods for generating a beam of charged particles, such as an ion beam. Such a system may comprise an interaction chamber configured to support a target, one or more electromagnetic radiation sources, a sensor, and at least one processor. The one or more electromagnetic radiation sources may be configured to provide a probe beam at a first energy for determining orientation data of the target and a particle-generating beam at a second energy, which is greater than the first energy, for producing a beam of charged particles. The processor may be configured to receive feedback information from the sensor and to cause a change in a relative orientation between the particle-generating beam and the target.