Abstract:
System and method embodiments are provided for optical I/O arrays for wafer scale testing. A wafer includes a plurality of dies of PIC chips. Each die includes a plurality of first and second optical I/O elements each configured to couple to a testing probe array. A row of I/O elements includes alternating ones of the first and second optical I/O elements. Each die also includes a first waveguide and a second waveguide coupling a first one of the first and second optical I/O elements to a second one of the first and second optical I/O elements, respectively. The first and second optical I/O elements configured such that the testing probe array couples to at least some of the first optical I/O elements from a first side of the PIC chip and couples to at least some of the second optical I/O elements from a second side of the PIC chip.
Abstract:
System and method embodiments are provided for high density on-chip optical input/output (I/O) arrays with partition waveguide routing topology. System and apparatus embodiments for on-chip optical I/O arrays provide for doubling the density of optical I/O arrays in a given footprint on a photonic integrated circuit (PIC) chip. System and apparatus embodiments for on-chip optical I/O arrays also provide waveguide routing topology to provide signal feedback to facility automated active alignment and coupling of optical fiber arrays in to surface grating coupler elements without use of waveguide crossings and without intersecting with waveguides connecting devices to I/O ports. In an embodiment, a PIC chip includes a plurality of first optical I/O elements and a plurality of second optical I/O elements, wherein a row of I/O elements comprises alternating ones of the first optical I/O elements and the second optical I/O elements.
Abstract:
An optical transmitter is provided. The optical transmitter includes a first optical modulator configured to modulate a first optical carrier signal having a first wavelength and a first power using a first data bit to generate a first modulated output signal, a second optical modulator configured to modulate a second optical carrier signal having a second wavelength and a second power using a second data bit to generate a second modulated output signal, wherein the second optical modulator and the first optical modulator modulate in parallel, and an optical wavelength multiplexer configured to sum the first modulated output signal and the second modulated output signal into an analog signal suitable for transmission over an optical fiber.
Abstract:
System and method embodiments are provided for optical I/O arrays for wafer scale testing. A wafer includes a plurality of dies of PIC chips. Each die includes a plurality of first and second optical I/O elements each configured to couple to a testing probe array. A row of I/O elements includes alternating ones of the first and second optical I/O elements. Each die also includes a first waveguide and a second waveguide coupling a first one of the first and second optical I/O elements to a second one of the first and second optical I/O elements, respectively. The first and second optical I/O elements configured such that the testing probe array couples to at least some of the first optical I/O elements from a first side of the PIC chip and couples to at least some of the second optical I/O elements from a second side of the PIC chip.
Abstract:
An apparatus comprising a first photonic device comprising a waveguide loop configured to guide a first light from a first location of a surface to a second location of the surface, and a second photonic device comprising a light source configured to provide the first light, and a first alignment coupler optically coupled to the light source and configured to optically couple to the waveguide loop at the first location, a second alignment coupler configured to optically couple to the waveguide loop at the second location, and a photodetector optically coupled to the second alignment coupler and configured to detect the first light when the waveguide loop is aligned with the first alignment coupler and the second alignment coupler, and generate, based on the detection and on the received light, an electrical signal.
Abstract:
System and method embodiments are provided for a thermo-optic switch with thermally isolated and heat restricting pillars. The embodiments enable increased integration density in photonic integrated chips (PICs), reduced power consumption, improved switching speed, and increased chip lifetime. In an embodiment, an optical waveguide; a resistive heater in thermal contact with a surface of the optical waveguide; and a plurality of heat flow restricting pillars connected to the sides of the optical waveguide and supporting the optical waveguide such that the optical waveguide is substantially thermally isolated from a substrate below the optical waveguide by a gap formed between the optical waveguide and the substrate, and wherein the pillars restrict heat flow from the optical waveguide to a supporting structure that supports the pillars.
Abstract:
An apparatus comprising a first photonic device comprising a waveguide loop configured to guide a first light from a first location of a surface to a second location of the surface, and a second photonic device comprising a light source configured to provide the first light, and a first alignment coupler optically coupled to the light source and configured to optically couple to the waveguide loop at the first location, a second alignment coupler configured to optically couple to the waveguide loop at the second location, and a photodetector optically coupled to the second alignment coupler and configured to detect the first light when the waveguide loop is aligned with the first alignment coupler and the second alignment coupler, and generate, based on the detection and on the received light, an electrical signal.
Abstract:
System and method embodiments are provided for a thermo-optic switch with thermally isolated and heat restricting pillars. The embodiments enable increased integration density in photonic integrated chips (PICs), reduced power consumption, improved switching speed, and increased chip lifetime. In an embodiment, an optical waveguide; a resistive heater in thermal contact with a surface of the optical waveguide; and a plurality of heat flow restricting pillars connected to the sides of the optical waveguide and supporting the optical waveguide such that the optical waveguide is substantially thermally isolated from a substrate below the optical waveguide by a gap formed between the optical waveguide and the substrate, and wherein the pillars restrict heat flow from the optical waveguide to a supporting structure that supports the pillars.
Abstract:
System and method embodiments are provided for high density on-chip optical input/output (I/O) arrays with partition waveguide routing topology. System and apparatus embodiments for on-chip optical I/O arrays provide for doubling the density of optical I/O arrays in a given footprint on a photonic integrated circuit (PIC) chip. System and apparatus embodiments for on-chip optical I/O arrays also provide waveguide routing topology to provide signal feedback to facility automated active alignment and coupling of optical fiber arrays in to surface grating coupler elements without use of waveguide crossings and without intersecting with waveguides connecting devices to I/O ports. In an embodiment, a PIC chip includes a plurality of first optical I/O elements and a plurality of second optical I/O elements, wherein a row of I/O elements comprises alternating ones of the first optical I/O elements and the second optical I/O elements.
Abstract:
A method and apparatus is provided for control of plural optical phase shifters in an optical device, such as a Mach-Zehnder Interferometer switch. Drive signal magnitude is set using a level setting input and is used for operating both phase shifters, which may have similar characteristics due to co-location and co-manufacture. A device state control signal selects which of the phase shifters receives the drive signal. One or more switches may be used to route the drive signal to the selected phase shifter. Separate level control circuits and state control circuits operating at different speeds may be employed. When the phase shifters are asymmetrically conducting (e.g. carrier injection) phase shifters, a bi-polar drive circuit can be employed. In this case, the phase shifters can be connected in reverse-parallel, and the drive signal polarity can be switchably reversed in order to drive a selected one of the phase shifters.