公开(公告)号：US10739251B2

公开(公告)日：2020-08-11

申请号：US16126230

申请日：2018-09-10

Applicant: Huazhong University of Science and Technology

Inventor： Hao Jiang ,  Jiamin Liu ,  Shiyuan Liu ,  Song Zhang ,  Zhicheng Zhong ,  Xiuguo Chen ,  Honggang Gu

IPC: G01N21/21 ,  G02B5/30

Abstract: The present invention discloses a high temporal resolution Mueller matrix elliptical polarization measuring device and method. In the incident light path, four polarization modulation channels are used to split and modulate a pulse laser beam into four polarized beams in independent polarization states. Due to different light path differences, the pulse beams have a time interval of several nanoseconds, and thus four pulse laser beams are successively irradiated on the surface of the sample. In the reflected light path, six channel polarization detection modules are used to synchronously measure the Stokes vectors of the reflected beams on the sample surface. By using known incident and reflected Stokes vectors of the four pulse beams, linear equations can be solved to obtain the Mueller matrix of the sample.