公开(公告)号：US12300626B2

公开(公告)日：2025-05-13

申请号：US18358261

申请日：2023-07-25

Applicant: Intel Corporation

Inventor： Shawna M. Liff ,  Adel A. Elsherbini ,  Johanna M. Swan

IPC: H01L23/538 ,  H01L25/065

Abstract: Microelectronic assemblies, and related devices and methods, are disclosed herein. For example, in some embodiments, a microelectronic assembly may include a first die comprising a first face and a second face; and a second die, the second die comprising a first face and a second face, wherein the second die further comprises a plurality of first conductive contacts at the first face and a plurality of second conductive contacts at the second face, and the second die is between first-level interconnect contacts of the microelectronic assembly and the first die.

公开(公告)号：US12266682B2

公开(公告)日：2025-04-01

申请号：US17025209

申请日：2020-09-18

Applicant: Intel Corporation

Inventor： Adel A. Elsherbini ,  Mohammad Enamul Kabir ,  Zhiguo Qian ,  Gerald S. Pasdast ,  Kimin Jun ,  Shawna M. Liff ,  Johanna M. Swan ,  Aleksandar Aleksov ,  Feras Eid

IPC: H01L23/49 ,  H01L23/492 ,  H01L49/02

Abstract: Disclosed herein are capacitors and resistors at direct bonding interfaces in microelectronic assemblies, as well as related structures and techniques. For example, in some embodiments, a microelectronic assembly may include a first microelectronic component and a second microelectronic component, wherein a direct bonding interface of the second microelectronic component is direct bonded to a direct bonding interface of the first microelectronic component, the microelectronic assembly includes a sensor, the sensor includes a first sensor plate and a second sensor plate, the first sensor plate is at the direct bonding interface of the first microelectronic component, and the second sensor plate is at the direct bonding interface of the second microelectronic component.

公开(公告)号：US20250022845A1

公开(公告)日：2025-01-16

申请号：US18827351

申请日：2024-09-06

Applicant: Intel Corporation

Inventor： Adel A. Elsherbini ,  Feras Eid ,  Johanna M. Swan ,  Shawna M. Liff

IPC: H01L25/065 ,  H01L23/00 ,  H01L25/00 ,  H01L25/18

Abstract: Microelectronic assemblies, related devices and methods, are disclosed herein. In some embodiments, a microelectronic assembly may include a package substrate having a first surface and an opposing second surface; a first die having a first surface and an opposing second surface embedded in a first dielectric layer, where the first surface of the first die is coupled to the second surface of the package substrate by first interconnects; a second die having a first surface and an opposing second surface embedded in a second dielectric layer, where the first surface of the second die is coupled to the second surface of the first die by second interconnects; and a third die having a first surface and an opposing second surface embedded in a third dielectric layer, where the first surface of the third die is coupled to the second surface of the second die by third interconnects.

公开(公告)号：US12199063B2

公开(公告)日：2025-01-14

申请号：US18403545

申请日：2024-01-03

Applicant: Intel Corporation

Inventor： Shawna M. Liff ,  Adel A. Elsherbini ,  Johanna M. Swan ,  Arun Chandrasekhar

IPC: H01L25/065 ,  H01L23/00 ,  H01L25/00 ,  H01L25/18

Abstract: Microelectronic assemblies, and related devices and methods, are disclosed herein. For example, in some embodiments, a microelectronic assembly may include a package substrate having a first surface and an opposing second surface, and a die secured to the package substrate, wherein the die has a first surface and an opposing second surface, the die has first conductive contacts at the first surface and second conductive contacts at the second surface, and the first conductive contacts are coupled to conductive pathways in the package substrate by first non-solder interconnects.

公开(公告)号：US12165962B2

公开(公告)日：2024-12-10

申请号：US17121093

申请日：2020-12-14

Applicant: Intel Corporation

Inventor： Aleksandar Aleksov ,  Mohammad Enamul Kabir ,  Adel A. Elsherbini ,  Shawna M. Liff ,  Johanna M. Swan ,  Feras Eid

IPC: H01L23/00 ,  H01L23/498 ,  H01L23/538 ,  H01L23/31 ,  H01L23/48

Abstract: Disclosed herein are microelectronic assemblies including microelectronic components coupled by direct bonding, and related structures and techniques. In some embodiments, a microelectronic assembly may include a first microelectronic component including a first guard ring extending through at least a portion of a thickness of and along a perimeter; a second microelectronic component including a second guard ring extending through at least a portion of a thickness of and along a perimeter, where the first and second microelectronic components are coupled by direct bonding; and a seal ring formed by coupling the first guard ring to the second guard ring. In some embodiments, a microelectronic assembly may include a microelectronic component coupled to an interposer that includes a first liner material at a first surface; a second liner material at an opposing second surface; and a perimeter wall through the interposer and connected to the first and second liner materials.

公开(公告)号：US20240355768A1

公开(公告)日：2024-10-24

申请号：US18761443

申请日：2024-07-02

Applicant: Intel Corporation

Inventor： Adel A. Elsherbini ,  Krishna Bharath ,  Kevin P. O'Brien ,  Kimin Jun ,  Han Wui Then ,  Mohammad Enamul Kabir ,  Gerald S. Pasdast ,  Feras Eid ,  Aleksandar Aleksov ,  Johanna M. Swan ,  Shawna M. Liff

IPC: H01L23/00 ,  H01L25/065

CPC classification number: H01L24/08 ,  H01L24/05 ,  H01L24/29 ,  H01L24/32 ,  H01L25/0657 ,  H01L28/10 ,  H01L2224/05147 ,  H01L2224/05639 ,  H01L2224/05644 ,  H01L2224/05647 ,  H01L2224/0801 ,  H01L2224/08145 ,  H01L2224/0903 ,  H01L2224/09055 ,  H01L2224/09505 ,  H01L2224/29186 ,  H01L2224/32145

Abstract: Disclosed herein are microelectronic assemblies including microelectronic components that are coupled together by direct bonding, as well as related structures and techniques. For example, in some embodiments, a microelectronic assembly may include a first microelectronic component and a second microelectronic component coupled to the first microelectronic component by a direct bonding region, wherein the direct bonding region includes at least part of an inductor.

公开(公告)号：US12057402B2

公开(公告)日：2024-08-06

申请号：US17025166

申请日：2020-09-18

Applicant: Intel Corporation

Inventor： Aleksandar Aleksov ,  Adel A. Elsherbini ,  Shawna M. Liff ,  Johanna M. Swan ,  Feras Eid ,  Randy B. Osborne ,  Van H. Le

IPC: H01L23/538 ,  H01L23/49 ,  H01L25/065

CPC classification number: H01L23/5384 ,  H01L23/49 ,  H01L23/5385 ,  H01L23/5386 ,  H01L25/0657

Abstract: Disclosed herein are microelectronic assemblies including microelectronic components that are coupled together by direct bonding, as well as related structures and techniques. For example, in some embodiments, a microelectronic assembly may include an interposer, including an organic dielectric material, and a microelectronic component coupled to the interposer by direct bonding.

公开(公告)号：US11967580B2

公开(公告)日：2024-04-23

申请号：US17956773

申请日：2022-09-29

Applicant: Intel Corporation

Inventor： Adel A. Elsherbini ,  Amr Elshazly ,  Arun Chandrasekhar ,  Shawna M. Liff ,  Johanna M. Swan

IPC: H01L23/48 ,  H01L23/498 ,  H01L25/00 ,  H01L25/065

CPC classification number: H01L25/0652 ,  H01L23/49822 ,  H01L25/50

Abstract: Microelectronic assemblies, and related devices and methods, are disclosed herein. For example, in some embodiments, a microelectronic assembly may include a package substrate, a first die coupled to the package substrate with first interconnects, and a second die coupled to the first die with second interconnects, wherein the second die is coupled to the package substrate with third interconnects, a communication network is at least partially included in the first die and at least partially included in the second die, and the communication network includes a communication pathway between the first die and the second die.

公开(公告)号：US11916006B2

公开(公告)日：2024-02-27

申请号：US17822200

申请日：2022-08-25

Applicant: Intel Corporation

Inventor： Adel A. Elsherbini ,  Kaladhar Radhakrishnan ,  Krishna Bharath ,  Shawna M. Liff ,  Johanna M. Swan

IPC: H01L23/498 ,  G05F1/46 ,  H01L23/00 ,  H01L23/522 ,  H01L23/64 ,  H01L49/02 ,  H01F27/24

CPC classification number: H01L23/49838 ,  G05F1/46 ,  H01L23/5226 ,  H01L23/642 ,  H01L23/645 ,  H01L24/17 ,  H01L28/10 ,  H01L28/40 ,  H01F27/24

Abstract: Microelectronic assemblies, related devices and methods, are disclosed herein. In some embodiments, a microelectronic assembly may include a package substrate having a surface; a die having a first surface and an opposing second surface; and a chiplet having a first surface and an opposing second surface, wherein the chiplet is between the surface of the package substrate and the first surface of the die, wherein the first surface of the chiplet is coupled to the surface of the package substrate and the second surface of the chiplet is coupled to the first surface of the die, and wherein the chiplet includes: a capacitor at the first surface; and an element at the second surface, wherein the element includes a switching transistor or a diode.

公开(公告)号：US11764452B2

公开(公告)日：2023-09-19

申请号：US17672876

申请日：2022-02-16

Applicant: Intel Corporation

Inventor： Georgios Dogiamis ,  Adel A. Elsherbini ,  Telesphor Kamgaing ,  Henning Braunisch ,  Johanna M. Swan

IPC: H01P3/16 ,  H01L23/66 ,  H01P11/00 ,  H04B10/2581

CPC classification number: H01P3/16 ,  H01L23/66 ,  H01P11/006 ,  H01L2223/6627 ,  H04B10/2581

Abstract: Disclosed herein are various designs for dielectric waveguides, as well as methods of manufacturing such waveguides. One type of dielectric waveguides described herein includes waveguides with one or more cavities in the dielectric waveguide material. Another type of dielectric waveguides described herein includes waveguides with a conductive ridge in the dielectric waveguide material. Dielectric waveguides described herein may be dispersion reduced dielectric waveguides, compared to conventional dielectric waveguides, and may be designed to adjust the difference in the group delay between the lower frequencies and the higher frequencies of a chosen bandwidth.