公开(公告)号：US20240319105A1

公开(公告)日：2024-09-26

申请号：US18577922

申请日：2022-09-09

Applicant: ISRA VISION GMBH

Inventor： Klaus VEIT

IPC: G01N21/88 ,  G01N21/958

CPC classification number: G01N21/8806 ,  G01N21/958 ,  G01N2021/8829 ,  G01N2021/9586 ,  G01N2201/126

Abstract: A method for detecting local defects on a reflective surface with a device having at least one pattern for reflection on the reflective surface, at least one camera and a data processing unit. The pattern has at least one substantially linear light-dark transition, the positioning and orientation of the camera are known, the camera captures the pattern reflected on the surface and generates image data of the reflected pattern which are transmitted by the camera to the data processing unit, and the data processing unit determines local defects on the surface on the basis of an evaluation of at least one property of the at least one light-dark transition in the image data of the reflected pattern. Also a device and a computer program.