公开(公告)号：US20230243635A1

公开(公告)日：2023-08-03

申请号：US17588540

申请日：2022-01-31

Applicant: Infineon Technologies AG

Inventor： Joo ll PARK ,  Gernot BINDER ,  Dirk HAMMERSCHMIDT ,  Christoph OSWALD ,  Armin SATZ

IPC: G01B7/00 ,  G01D5/14

CPC classification number: G01B7/003 ,  G01D5/145

Abstract: An absolute position measurement system includes a multipole magnet including alternating magnetic poles extending along a multipole extension direction, the multipole magnet has a linear changing configuration relative to a linear path and produces a magnetic field having a field strength that undergoes a sinusoidal change along the linear path due to the alternating magnetic poles and a linear change along the linear path according to the linear changing configuration relative to the linear path; and a magnetic sensor configured to move along the linear path. The magnetic sensor includes a first sensor element arrangement configured to generate a first sensor signal, a second sensor element arrangement configured to generate a second sensor signal that is phase shifted with respect to the first sensor signal, and a processing circuit configured to calculate an absolute position of the magnetic sensor based on the first sensor signal and the second sensor signal.

公开(公告)号：US20250057051A1

公开(公告)日：2025-02-13

申请号：US18448657

申请日：2023-08-11

Applicant: Infineon Technologies AG

Inventor： Michael KIRSCH ,  Patrick HANEKAMP ,  Werner ROBL ,  Klemens PRÜGL ,  Juergen ZIMMER ,  Christoph OSWALD

IPC: H10N50/85 ,  C23C14/16 ,  C23C14/34 ,  C23C28/02 ,  C25D3/56 ,  C25D5/02 ,  C25D7/12 ,  G01R33/02 ,  H10N50/01 ,  H10N59/00

Abstract: A layered structure includes a silicon-based substrate comprising a substrate surface; a titanium-copper seed layer arranged on the substrate surface, wherein the titanium-copper seed layer comprises a titanium layer and a copper layer, wherein the titanium layer is arranged on the substrate surface such that covalent bonds are formed between the titanium layer and silicon of the silicon-based substrate, and wherein the copper layer is arranged directly on the titanium layer, such that the titanium layer is arranged between the substrate surface and the copper layer; and a nickel-iron plating layer arranged directly on the copper layer of the titanium-copper seed layer such that the titanium-copper seed layer is arranged between the silicon-based substrate and the nickel-iron plating layer.

公开(公告)号：US20240318948A1

公开(公告)日：2024-09-26

申请号：US18735723

申请日：2024-06-06

Applicant: Infineon Technologies AG

Inventor： Joo Il PARK ,  Gernot BINDER ,  Dirk HAMMERSCHMIDT ,  Christoph OSWALD ,  Armin SATZ

IPC: G01B7/00 ,  G01D5/14

CPC classification number: G01B7/003 ,  G01D5/145

Abstract: An absolute position measurement system includes a multipole magnet comprising alternating magnetic poles extending along a multipole extension direction, the alternating magnetic poles generating a magnetic field. A magnetic sensor includes a first sensor element arrangement configured to generate a first signal in response to a first magnetic field component and a second sensor element arrangement configured to generate a second signal in response to a second magnetic field component. The absolute position measurement system is configured, as a position of the magnetic sensor relative to the multipole magnet changes, to generate a first oscillating sensor signal with decreasing first signal amplitude and to generate a second oscillating sensor signal with decreasing second signal amplitude based on the first and second signals. A processing circuit is configured to calculate an absolute position of the magnetic sensor based on the first oscillating sensor signal and the second oscillating sensor signal.