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    METHOD FOR TESTING MEMORY
    1.
    发明申请
    METHOD FOR TESTING MEMORY 有权

    公开(公告)号：US20220059180A1

    公开(公告)日：2022-02-24

    申请号：US17387189

    申请日：2021-07-28

    Applicant: Infineon Technologies AG

    Inventor： Martin Perner

    IPC: G11C29/42 ,  G11C29/46 ,  G11C29/10 ,  G11C29/18

    Abstract: A method for testing a memory area. The method includes jumping from a destination address to a source address, reading a data word at the source address after jumping to the source address, and examining the data word. The source address was determined based on a static test.

    Testing memory cells by allocating an access value to a memory access and granting an access credit
    2.
    发明授权
    Testing memory cells by allocating an access value to a memory access and granting an access credit 有权

    公开(公告)号：US11238948B2

    公开(公告)日：2022-02-01

    申请号：US17168310

    申请日：2021-02-05

    Applicant: Infineon Technologies AG

    Inventor： Martin Perner

    IPC: G11C29/02 ,  G11C29/10 ,  G11C29/08 ,  G11C29/42 ,  G11C29/16 ,  G11C29/36 ,  G11C29/00

    Abstract: A method for testing memory cells under test of an integrated circuit includes allocating an access value to a memory access and granting an access credit. If the access value of the memory access does not exceed the access credit, the memory access is performed and the access credit is reduced by the access value. The memory access is performed to one memory cell or at bit level to a plurality of memory cells. A processor is connectable to a memory having a plurality of memory cells. The processor is configured to test memory cells of a protected memory area of the memory by performing memory accesses at bit level, control a counting register in such a way that a value stored in the counting register is modified according to a number of performed memory accesses, and test memory cells of the protected memory area of the memory only if the value stored in the counting register lies within a permissible value range.

    TESTING MEMORY CELLS BY ALLOCATING AN ACCESS VALUE TO A MEMORY ACCESS AND GRANTING AN ACCESS CREDIT
    6.
    发明申请
    TESTING MEMORY CELLS BY ALLOCATING AN ACCESS VALUE TO A MEMORY ACCESS AND GRANTING AN ACCESS CREDIT 有权

    公开(公告)号：US20210158882A1

    公开(公告)日：2021-05-27

    申请号：US17168310

    申请日：2021-02-05

    Applicant: Infineon Technologies AG

    Inventor： Martin Perner

    IPC: G11C29/02 ,  G11C29/10 ,  G11C29/42 ,  G11C29/16 ,  G11C29/36 ,  G11C29/08 ,  G11C29/00

    Abstract: A method for testing memory cells under test of an integrated circuit includes allocating an access value to a memory access and granting an access credit. If the access value of the memory access does not exceed the access credit, the memory access is performed and the access credit is reduced by the access value. The memory access is performed to one memory cell or at bit level to a plurality of memory cells. A processor is connectable to a memory having a plurality of memory cells. The processor is configured to test memory cells of a protected memory area of the memory by performing memory accesses at bit level, control a counting register in such a way that a value stored in the counting register is modified according to a number of performed memory accesses, and test memory cells of the protected memory area of the memory only if the value stored in the counting register lies within a permissible value range

    Testing memory cells by allocating an access value to a memory access and granting an access credit
    8.
    发明授权
    Testing memory cells by allocating an access value to a memory access and granting an access credit 有权

    公开(公告)号：US10916322B2

    公开(公告)日：2021-02-09

    申请号：US16109185

    申请日：2018-08-22

    Applicant: Infineon Technologies AG

    Inventor： Martin Perner

    IPC: G11C29/02 ,  G11C29/10 ,  G11C29/42 ,  G11C29/16 ,  G11C29/36 ,  G11C29/08 ,  G11C29/00

    Abstract: A method for testing memory cells under test of an integrated circuit includes allocating an access value to a memory access and granting an access credit. If the access value of the memory access does not exceed the access credit, the memory access is performed and the access credit is reduced by the access value. The memory access is performed to one memory cell or at bit level to a plurality of memory cells. A processor is connectable to a memory having a plurality of memory cells. The processor is configured to test memory cells of a protected memory area of the memory by performing memory accesses at bit level, control a counting register in such a way that a value stored in the counting register is modified according to a number of performed memory accesses, and test memory cells of the protected memory area of the memory only if the value stored in the counting register lies within a permissible value range.

    Method of operating a memory unit sector
    9.
    发明授权
    Method of operating a memory unit sector 有权

    公开(公告)号：US10395729B2

    公开(公告)日：2019-08-27

    申请号：US16108243

    申请日：2018-08-22

    Applicant: Infineon Technologies AG

    Inventor： Martin Perner

    IPC: G11C7/02 ,  G11C11/00 ,  G11C11/56 ,  G11C16/08 ,  G06F11/10 ,  G06F11/20 ,  G11C29/52

    Abstract: Disclosed is a memory unit that includes a sector of memory cells. The sector includes a first memory cell configured to selectively take on a state representation of a first plurality of state representations and a second memory cell configured to selectively take on at least one of a second plurality of state representations. The second plurality of state representations is different than the first plurality of state representations. An apparatus includes a processing unit and a memory unit coupled to the processing unit. The memory unit includes a sector of memory cells. Further disclosed are a method of operating a memory unit sector and a method of controlling a sector of a memory unit.

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