公开(公告)号：US20240135209A1

公开(公告)日：2024-04-25

申请号：US18400632

申请日：2023-12-29

Applicant: Intel Corporation

Inventor： Priyanka Mudgal ,  Rita H. Wouhaybi

IPC: G06N5/04 ,  G06N20/00

CPC classification number: G06N5/04 ,  G06N20/00

Abstract: A first computing system includes a data store with a sensitive dataset. The first computing system uses a feature extraction tool to perform a statistical analysis of the dataset to generate feature description data to describe a set of features within the dataset. A second computing system is coupled to the first computing system and does not have access to the dataset. The second computing system uses a data synthesizer to receive the feature description data and generate a synthetic dataset that models the dataset and includes the set of features. The second computing system trains a machine learning model with the synthetic data set and provides the trained machine learning model to the first computing system for use with data from the data store as an input.

公开(公告)号：US20240346801A1

公开(公告)日：2024-10-17

申请号：US18750388

申请日：2024-06-21

Applicant: Intel Corporation

Inventor： Priyanka Mudgal ,  Rita Hanna Wouhaybi ,  Caleb Mark McMillan ,  Patrick L. Connor ,  Ritesh Kumar Rajore ,  Jennifer Marie Williams

IPC: G06V10/44

CPC classification number: G06V10/44 ,  G06V2201/07

Abstract: Example apparatus disclosed herein are to generate first descriptive data of a first physical characteristic of a first object based on first camera sensor data from a first camera sensor, and generate second descriptive data of a second physical characteristic of a second object based on second camera sensor data from a second camera sensor different from the first camera sensor. Disclosed example apparatus are also identify, based on the first descriptive data and the second descriptive data, common physical characteristics associated with both the first object and the second object, first unique physical characteristics associated with the first object, and second unique physical characteristics associated with the second object. Disclosed example apparatus are further to identify the first object and the second object as one of a same object or different objects based on the common physical characteristics, the first unique physical characteristics, and the second unique physical characteristics.

公开(公告)号：US20240185129A1

公开(公告)日：2024-06-06

申请号：US18415588

申请日：2024-01-17

Applicant: Intel Corporation

Inventor： Priyanka Mudgal ,  Caleb Mark McMillan ,  Rita Hanna Wouhaybi ,  Mark David Yarvis ,  Jennifer Williams ,  Greeshma Pisharody

IPC: G06N20/00

CPC classification number: G06N20/00

Abstract: Methods, apparatus, systems, and articles of manufacture to facilitate collaborative learning in a multi-sensor environment are disclosed. An example computer readable medium comprises instructions at least one programmable circuit to after determining that first data from a first device conflicts with second data from a second device: validate the first device based on third data from a validated device; and mitigate the second device based on the third data.

公开(公告)号：US20240134365A1

公开(公告)日：2024-04-25

申请号：US18395849

申请日：2023-12-26

Applicant: Intel Corporation

Inventor： Fabian Oboril ,  Cornelius Buerkle ,  Priyanka Mudgal ,  Frederik Pasch ,  Syed Qutub ,  Kay-Ulrich Scholl

IPC: G05B19/418 ,  G05D1/698 ,  G05D107/70

CPC classification number: G05B19/41895 ,  G05D1/698 ,  G05D2107/70

Abstract: A system, including: a communication interface operable to receive sensor data related to a state of an object; object state estimation processor circuitry operable to estimate, based on the sensor data, a prospective probability of a degradation of the state of the object; and cobot fleet control processor circuitry operable to generate a command for either a transport cobot operable to transport the object, or another actor, to take proactive action to mitigate the prospective probability of the degradation of the state of the object.

公开(公告)号：US20240103506A1

公开(公告)日：2024-03-28

申请号：US18531476

申请日：2023-12-06

Applicant: Intel Corporation

Inventor： Priyanka Mudgal ,  Mark Yarvis ,  Rita H. Wouhaybi

IPC: G05B23/02

CPC classification number: G05B23/0221

Abstract: Systems, apparatus, articles of manufacture, and methods are disclosed to identify causes of defects in industrial environments. An example apparatus includes interface circuitry to access data associated with an object in an environment and programmable circuitry to utilize machine-readable instructions. For example, the programmable circuitry is to identify a cause of a defect of the object based on a timeline of the object in the environment, the timeline based on the data.