DISPLAY DEVICE HAVING BI-DIRECTIONAL SCAN MECHANISM AND GATE SIGNAL SCANNING METHOD THEREOF
    1.
    发明申请
    DISPLAY DEVICE HAVING BI-DIRECTIONAL SCAN MECHANISM AND GATE SIGNAL SCANNING METHOD THEREOF 审中-公开
    具有双向扫描机制的显示装置及其门信号扫描方法

    公开(公告)号:US20110025590A1

    公开(公告)日:2011-02-03

    申请号:US12630852

    申请日:2009-12-04

    CPC classification number: G09G3/3677 G09G2310/0283 G09G2310/0286 G11C19/28

    Abstract: A display device having bi-directional scan mechanism includes a plurality of gate lines, a first shift register circuit and a second shift register circuit. The first shift register circuit includes a plurality of forward shift register stages. The second shift register circuit includes a plurality of backward shift register stages. Each of the gate lines is electrically connected to both a corresponding forward shift register stage and a corresponding backward shift register stage. When the first shift register circuit is enabled, the forward shift register stages are employed to provide plural forward gate signals sequentially enabled for scanning the gate lines based on a first sequence. When the second shift register circuit is enabled, the backward shift register stages are employed to provide plural backward gate signals sequentially enabled for scanning the gate lines based on a second sequence opposite to the first sequence.

    Abstract translation: 具有双向扫描机构的显示装置包括多条栅极线,第一移位寄存器电路和第二移位寄存器电路。 第一移位寄存器电路包括多个正向移位寄存器级。 第二移位寄存器电路包括多个反向移位寄存器级。 每个栅极线电连接到相应的正移位寄存器级和相应的反向移位寄存器级。 当第一移位寄存器电路被使能时,采用正向移位寄存器级以提供依次使能的多个正向栅极信号,以便基于第一序列扫描栅极线。 当第二移位寄存器电路被使能时,采用反向移位寄存器级来提供多个反向栅极信号,该反向栅极信号基于与第一序列相反的第二序列而能够扫描栅极线。

    Display panel with test shorting bar
    2.
    发明授权
    Display panel with test shorting bar 有权
    带测试短路棒的显示面板

    公开(公告)号:US08755000B2

    公开(公告)日:2014-06-17

    申请号:US13471425

    申请日:2012-05-14

    Applicant: Jian-Hong Lin

    Inventor: Jian-Hong Lin

    CPC classification number: G02F1/1345 G02F1/136259 G02F2001/136272

    Abstract: A display panel including a first substrate, a second substrate, and a liquid crystal layer. The first substrate comprises a display region and a peripheral circuit region adjacent to the display region, and the first substrate includes a pixel array, a plurality of test shorting bars, and a plurality of wires. The pixel array is disposed in the display region. The test shorting bars are disposed in the peripheral circuit region. The wires are disposed in the peripheral circuit region and electrically connected with the pixel array. Moreover, at least one wire and one of the test shorting bars respectively share a part for connecting with each other and forming a common trace. Additionally, the second substrate is disposed opposite to the first substrate. The liquid crystal layer is disposed between the first substrate and the second substrate.

    Abstract translation: 一种显示面板,包括第一基板,第二基板和液晶层。 第一衬底包括与显示区域相邻的显示区域和外围电路区域,并且第一衬底包括像素阵列,多个测试短路条和多条电线。 像素阵列设置在显示区域中。 测试短路棒设置在外围电路区域中。 电线布置在外围电路区域中并与像素阵列电连接。 此外,至少一根线和一个测试短路棒分别共享用于彼此连接并形成公共痕迹的部分。 另外,第二基板与第一基板相对设置。 液晶层设置在第一基板和第二基板之间。

    Hydraulic Buffer Device
    3.
    发明申请
    Hydraulic Buffer Device 审中-公开
    液压缓冲装置

    公开(公告)号:US20120205206A1

    公开(公告)日:2012-08-16

    申请号:US13342922

    申请日:2012-01-03

    CPC classification number: F16F9/096

    Abstract: A hydraulic buffer device includes a first chamber, a second chamber, and a buffering space disposed under the first and second chambers, an air bladder disposed in the buffering space, an oil chamber disposed above the first and second chambers and divided by a piston into upper and lower chamber portions, and an annular passage disposed around the oil chamber. When the piston is moved downwardly within the oil chamber, the hydraulic oil flows from the lower chamber portion into the buffering space via the first chamber to contract the air bladder so that, upon expansion of the air bladder, air pressure in the air bladder pushes the hydraulic oil to flow from the buffering space into the upper chamber portion via the second chamber and the annular passage.

    Abstract translation: 液压缓冲装置包括第一室,第二室和设置在第一和第二室下方的缓冲空间,设置在缓冲空间中的空气囊,设置在第一和第二室上方并由活塞分隔的油室 上室和下室部分以及设置在油室周围的环形通道。 当活塞在油室内向下移动时,液压油经由第一腔室从下室部分流入缓冲空间,以使气囊收缩,使得当气囊膨胀时,空气囊中的空气压力推动 所述液压油经由所述第二室和所述环形通道从所述缓冲空间流入所述上室部。

    PULL-DOWN CONTROL CIRCUIT AND SHIFT REGISTER OF USING SAME
    4.
    发明申请
    PULL-DOWN CONTROL CIRCUIT AND SHIFT REGISTER OF USING SAME 有权
    下拉控制电路和使用相同的移位寄存器

    公开(公告)号:US20110069806A1

    公开(公告)日:2011-03-24

    申请号:US12565226

    申请日:2009-09-23

    Abstract: The present invention relates to a pull-down control circuit and a shift register of using same. In one embodiment, the pull-down control circuit includes a release circuit and four transistors T4, T5, T6 and T7 electrically coupled to each other. The release circuit is adapted for causing the transistor T5 to be turned on and off alternately, thereby substantially reducing the stress thereon, improving the reliability and prolonging the lifetime of the shift register.

    Abstract translation: 本发明涉及一种下拉控制电路和使用它的移位寄存器。 在一个实施例中,下拉控制电路包括释放电路和彼此电耦合的四个晶体管T4,T5,T6和T7。 释放电路适于使晶体管T5交替地导通和截止,从而大大降低其上的应力,提高可靠性并延长移位寄存器的寿命。

    Process for Improving the Reliability of Interconnect Structures and Resulting Structure
    5.
    发明申请
    Process for Improving the Reliability of Interconnect Structures and Resulting Structure 有权
    提高互连结构和结构结构可靠性的过程

    公开(公告)号:US20100327456A1

    公开(公告)日:2010-12-30

    申请号:US12879770

    申请日:2010-09-10

    Abstract: An interconnect structure of an integrated circuit having improved reliability and a method for forming the same are provided. The method includes providing a substrate, forming a dielectric layer overlying the substrate, performing a first shrinking process, wherein the dielectric layer shrinks and has a first shrinkage rate, forming a conductive feature in the dielectric layer after the step of performing the first shrinking process, and performing a second shrinking process after the step of forming the conductive feature, wherein the dielectric layer substantially shrinks and has a second shrinkage rate.

    Abstract translation: 提供了具有改善的可靠性的集成电路的互连结构及其形成方法。 该方法包括提供衬底,形成覆盖在衬底上的电介质层,执行第一收缩过程,其中电介质层收缩并具有第一收缩率,在执行第一收缩过程的步骤之后在介电层中形成导电特征 并且在形成导电特征的步骤之后执行第二收缩过程,其中介电层基本上收缩并且具有第二收缩率。

    ARRAY SUBSTRATE AND DISPLAY PANEL THEREOF
    6.
    发明申请
    ARRAY SUBSTRATE AND DISPLAY PANEL THEREOF 有权
    阵列基板和显示面板

    公开(公告)号:US20100014030A1

    公开(公告)日:2010-01-21

    申请号:US12369748

    申请日:2009-02-12

    Applicant: Jian-Hong Lin

    Inventor: Jian-Hong Lin

    CPC classification number: G02F1/1345 G02F1/136259 G02F2001/136272

    Abstract: An array substrate having a display region and a peripheral circuit region adjacent to the display region is provided. The array substrate includes a pixel array, a plurality of test shorting bars and a plurality of wires. The pixel array is disposed in the display region. The test shorting bars are disposed in the peripheral circuit region. The wires electrically connected with the pixel array are disposed in the peripheral circuit region. Specially, at least one wire and the test shorting bar share a part for connecting each other and the part forms a common trace.

    Abstract translation: 提供了具有与显示区域相邻的显示区域和外围电路区域的阵列基板。 阵列基板包括像素阵列,多个测试短路棒和多根线。 像素阵列设置在显示区域中。 测试短路棒设置在外围电路区域中。 与像素阵列电连接的布线设置在外围电路区域中。 特别地,至少一根电线和测试短路棒共享用于彼此连接的部件,并且该部件形成共同的轨迹。

    DISPLAY PANEL
    7.
    发明申请
    DISPLAY PANEL 有权
    显示面板

    公开(公告)号:US20120050658A1

    公开(公告)日:2012-03-01

    申请号:US13005538

    申请日:2011-01-13

    Abstract: A display panel includes an active device array substrate, an opposite substrate, and a liquid crystal layer. The active device array substrate includes a substrate and further includes a pixel array, signal lines, and first and second repairing lines all disposed on the substrate. The signal lines electrically connect the pixel array. The first repairing line includes first and second line segments respectively located on first and second sides of the pixel array. The first side is substantially perpendicular to the second side. The first and second line segments are electrically connected. The second repairing line includes third and fourth line segments respectively located on third and second sides of the pixel array. The third side is substantially parallel to the first side. The fourth and third line segments are electrically connected. The opposite substrate above the active device array substrate does not cover the first and third line segments.

    Abstract translation: 显示面板包括有源器件阵列衬底,相对衬底和液晶层。 有源器件阵列衬底包括衬底,并且还包括像素阵列,信号线以及全部设置在衬底上的第一和第二修复线。 信号线电连接像素阵列。 第一修复线包括分别位于像素阵列的第一和第二侧上的第一和第二线段。 第一侧基本垂直于第二侧。 第一和第二线段电连接。 第二修复线包括分别位于像素阵列的第三和第二侧上的第三和第四线段。 第三侧基本上平行于第一侧。 第四和第三线段电连接。 有源器件阵列衬底上方的相对衬底不覆盖第一和第三线段。

    Seal Ring Structures with Reduced Moisture-Induced Reliability Degradation
    8.
    发明申请
    Seal Ring Structures with Reduced Moisture-Induced Reliability Degradation 有权
    具有降低水分诱导可靠性降解的密封环结构

    公开(公告)号:US20110108945A1

    公开(公告)日:2011-05-12

    申请号:US13007927

    申请日:2011-01-17

    CPC classification number: H01L23/585 H01L2924/0002 H01L2924/00

    Abstract: A semiconductor chip includes a seal ring adjacent to edges of the semiconductor chip; an opening extending from a top surface to a bottom surface of the seal ring, wherein the opening has a first end on an outer side of the seal ring and a second end on an inner side of the seal ring; and a moisture barrier having a sidewall parallel to a nearest side of the seal ring, wherein the moisture barrier is adjacent the seal ring and has a portion facing the opening.

    Abstract translation: 半导体芯片包括与半导体芯片的边缘相邻的密封环; 从所述密封环的顶表面延伸到底表面的开口,其中所述开口具有在所述密封环的外侧上的第一端和所述密封环的内侧上的第二端; 以及具有平行于所述密封环的最近侧的侧壁的防潮屏障,其中所述防潮层邻近所述密封环并且具有面向所述开口的部分。

    Process for improving the reliability of interconnect structures and resulting structure
    9.
    发明授权
    Process for improving the reliability of interconnect structures and resulting structure 有权
    提高互连结构和结构结构可靠性的方法

    公开(公告)号:US07816256B2

    公开(公告)日:2010-10-19

    申请号:US11487741

    申请日:2006-07-17

    Abstract: An interconnect structure of an integrated circuit having improved reliability and a method for forming the same are provided. The method includes providing a substrate, forming a dielectric layer overlying the substrate, performing a first shrinking process, wherein the dielectric layer shrinks and has a first shrinkage rate, forming a conductive feature in the dielectric layer after the step of performing the first shrinking process, and performing a second shrinking process after the step of forming the conductive feature, wherein the dielectric layer substantially shrinks and has a second shrinkage rate.

    Abstract translation: 提供了具有改善的可靠性的集成电路的互连结构及其形成方法。 该方法包括提供衬底,形成覆盖在衬底上的电介质层,执行第一收缩过程,其中电介质层收缩并具有第一收缩率,在执行第一收缩过程的步骤之后在介电层中形成导电特征 并且在形成导电特征的步骤之后执行第二收缩过程,其中介电层基本上收缩并且具有第二收缩率。

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