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公开(公告)号：US20220397390A1
公开(公告)日：2022-12-15
申请号：US17623498
申请日：2020-06-29
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Chan Kwon LEE , Moon Young JEON , Deok Hwa HONG , Joong Ki JEONG
IPC: G01B11/25
Abstract: The present disclosure proposes a detachable second apparatus coupled to a first apparatus that determines a first three-dimensional shape of an object and configured to determine an angle of an upper surface of the object. The second apparatus includes a first light source configured to sequentially irradiate first pattern lights having one phase range, a beam splitter and lenses configured to change optical paths of the first pattern lights so that a beam of light corresponding to a respective phase of the phase range spreads, and arrives at each point of a partial region of the upper surface of the object, a communication interface, and a first processor configured to obtain first information on first reflected lights generated by reflecting the first pattern lights from the partial region and determine the angle of the upper surface with respect to the reference plane based on the first information.
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公开(公告)号：US20240426766A1
公开(公告)日：2024-12-26
申请号：US18830031
申请日：2024-09-10
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Chan Kwon LEE , Moon Young JEON , Jung HUR , Deok Hwa HONG , Eun Ha JO
Abstract: An inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.
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公开(公告)号：US20250027766A1
公开(公告)日：2025-01-23
申请号：US18910749
申请日：2024-10-09
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Chan Kwon LEE , Moon Young JEON , Deok Hwa HONG , Joong Ki JEONG
Abstract: The present disclosure proposes an apparatus for determining a first three-dimensional shape of an object. The apparatus includes one or more first light sources configured to irradiate one or more first pattern lights to the object, a second light source configured to sequentially irradiate one or more second pattern lights having one phase range, a beam splitter and one or more lenses configured to change optical paths of the one or more second pattern lights, an image sensor configured to capture one or more first reflected lights and one or more second reflected lights, and a processor configured to determine the first three-dimensional shape of the object based on the one or more first reflected lights and the one or more second reflected lights.
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公开(公告)号：US20220260503A1
公开(公告)日：2022-08-18
申请号：US17735521
申请日：2022-05-03
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Chan Kwon LEE , Moon Young JEON , Jung HUR , Deok Hwa HONG , Eun Ha JO
Abstract: An inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.
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公开(公告)号：US20220357149A1
公开(公告)日：2022-11-10
申请号：US17623497
申请日：2020-06-29
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Chan Kwon LEE , Moon Young JEON , Deok Hwa HONG , Joong Ki JEONG
Abstract: The present disclosure proposes an apparatus for determining a first three-dimensional shape of an object. The apparatus includes a first light source configured to irradiate first pattern lights to the object, first image sensors configured to capture first reflected lights generated by reflecting the first pattern lights from the object, a second light source configured to sequentially irradiate second pattern lights having one phase range, a beam splitter and lenses configured to change optical paths of the second pattern lights, a second image sensor configured to capture second reflected lights generated by reflecting the second pattern lights from the partial region, and a processor configured to determine the first three-dimensional shape of the object based on the first reflected lights and the second reflected lights.
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Patent Agency Ranking
公开(公告)号：US20210102903A1
公开(公告)日：2021-04-08
申请号：US17123901
申请日：2020-12-16
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Chan Kwon LEE , Moon Young JEON , Jung HUR , Deok Hwa HONG , Eun Ha JO
Abstract: The present disclosure proposes an inspection apparatus. The inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.
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公开(公告)号：US20200264420A1
公开(公告)日：2020-08-20
申请号：US16635842
申请日：2018-04-09
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Chan Kwon LEE , Young Chul PARK , Yu Ri KOH
Abstract: The present disclosure relates to a medical microscope field. A stereo microscope connected to an optical coherence tomography (OCT) unit for forming a tomographic image of a target object includes an objective lens unit including a plurality of lenses each having an aperture of a predetermined size, a pair of first magnification lens units each including a plurality of lenses having a pair of magnification lens apertures positioned within the aperture of the objective lens unit, a second magnification lens unit including a plurality of lenses having an OCT aperture disposed separately from the pair of magnification lens aperture within the aperture of the objective lens unit, and a light delivery unit configured to receive light from the OCT unit and deliver the light to the second magnification lens unit and configured to deliver light received from the second magnification lens unit to the OCT unit.
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公开(公告)号：US20250012565A1
公开(公告)日：2025-01-09
申请号：US18898318
申请日：2024-09-26
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Chan Kwon LEE , Moon Young JEON , Deok Hwa HONG , Joong Ki JEONG
Abstract: The present disclosure proposes a detachable second apparatus coupled to a first apparatus that determines a first three-dimensional shape of an object and configured to determine an angle of an upper surface of the object. The second apparatus includes a first light source configured to sequentially irradiate first pattern lights having one phase range, a beam splitter and lenses configured to change optical paths of the first pattern lights so that a beam of light corresponding to a respective phase of the phase range spreads, and arrives at each point of a partial region of the upper surface of the object, a communication interface, and a first processor configured to obtain first information on first reflected lights generated by reflecting the first pattern lights from the partial region and determine the angle of the upper surface with respect to the reference plane based on the first information.
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公开(公告)号：US20240060908A1
公开(公告)日：2024-02-22
申请号：US18499784
申请日：2023-11-01
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Chan Kwon LEE , Moon Young JEON , Jung HUR , Deok Hwa HONG , Eun Ha JO
CPC classification number: G01N21/9501 , G01N21/4738
Abstract: An inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.
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公开(公告)号：US20220364852A1
公开(公告)日：2022-11-17
申请号：US17623508
申请日：2020-06-29
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Chan Kwon LEE , Moon Young JEON , Deok Hwa HONG , Joong Ki JEONG
Abstract: The present disclosure proposes an apparatus for determining a first three-dimensional shape of an object. The apparatus includes one or more first light sources configured to irradiate one or more first pattern lights to the object, a second light source configured to sequentially irradiate one or more second pattern lights having one phase range, a beam splitter and one or more lenses configured to change optical paths of the one or more second pattern lights, an image sensor configured to capture one or more first reflected lights and one or more second reflected lights, and a processor configured to determine the first three-dimensional shape of the object based on the one or more first reflected lights and the one or more second reflected lights.
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