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公开(公告)号：US20230380927A1
公开(公告)日：2023-11-30
申请号：US18248854
申请日：2021-10-13
Applicant: KOH YOUNG TECHNOLOGY INC
Inventor： Moon Young JEON , Seung Yeol RYU
CPC classification number: A61B90/361 , A61B34/20 , G06T7/246 , A61B90/39 , G06T2200/04 , A61B2034/2046 , A61B2090/3945
Abstract: A medical three-dimensional image measuring device includes a light source configured to output light, a camera configured to generate three-dimensional image information by receiving reflected light generated by reflecting the light from an object, a housing including the camera disposed therein and forming an opening through which the reflected light enters into the housing, and a marker disposed on the housing to be capable of changing at least one of a relative location or a relative posture to the opening and including a tracking surface configured to be imaged by an external imaging device for tracking a location and a posture.
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公开(公告)号：US20220397390A1
公开(公告)日：2022-12-15
申请号：US17623498
申请日：2020-06-29
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Chan Kwon LEE , Moon Young JEON , Deok Hwa HONG , Joong Ki JEONG
IPC: G01B11/25
Abstract: The present disclosure proposes a detachable second apparatus coupled to a first apparatus that determines a first three-dimensional shape of an object and configured to determine an angle of an upper surface of the object. The second apparatus includes a first light source configured to sequentially irradiate first pattern lights having one phase range, a beam splitter and lenses configured to change optical paths of the first pattern lights so that a beam of light corresponding to a respective phase of the phase range spreads, and arrives at each point of a partial region of the upper surface of the object, a communication interface, and a first processor configured to obtain first information on first reflected lights generated by reflecting the first pattern lights from the partial region and determine the angle of the upper surface with respect to the reference plane based on the first information.
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公开(公告)号：US20240426766A1
公开(公告)日：2024-12-26
申请号：US18830031
申请日：2024-09-10
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Chan Kwon LEE , Moon Young JEON , Jung HUR , Deok Hwa HONG , Eun Ha JO
Abstract: An inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.
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公开(公告)号：US20180156606A1
公开(公告)日：2018-06-07
申请号：US15735021
申请日：2016-06-03
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Moon Young JEON
CPC classification number: G01B11/2513 , G01B11/02 , G01B11/245 , G01B11/254 , G01B11/2545 , G01N21/95684 , G01N2021/95638 , G06T7/521 , G06T7/593 , H04N13/239 , H04N13/243 , H04N13/254
Abstract: A three-dimensional shape measurement apparatus includes main pattern illumination parts, main image-capturing parts and a control part. The main pattern illumination parts obliquely illuminate grating pattern light in different directions toward a measurement target. The main image-capturing parts obtain a grating pattern image of the measurement target by receiving reflection light of the grating pattern light illuminated from the main pattern illumination parts and obliquely reflected by the measurement target. The control part produces height data of the measurement target using grating pattern images of the measurement target, or produces height data of the measurement target using image positions of plane images for the measurement target and texture information of the measurement target. The control part employs a grating pattern illuminated on the measurement target as the texture information to produce height data of the measurement target. Thus, a three-dimensional shape may be measured more easily and accurately.
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公开(公告)号：US20250012565A1
公开(公告)日：2025-01-09
申请号：US18898318
申请日：2024-09-26
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Chan Kwon LEE , Moon Young JEON , Deok Hwa HONG , Joong Ki JEONG
Abstract: The present disclosure proposes a detachable second apparatus coupled to a first apparatus that determines a first three-dimensional shape of an object and configured to determine an angle of an upper surface of the object. The second apparatus includes a first light source configured to sequentially irradiate first pattern lights having one phase range, a beam splitter and lenses configured to change optical paths of the first pattern lights so that a beam of light corresponding to a respective phase of the phase range spreads, and arrives at each point of a partial region of the upper surface of the object, a communication interface, and a first processor configured to obtain first information on first reflected lights generated by reflecting the first pattern lights from the partial region and determine the angle of the upper surface with respect to the reference plane based on the first information.
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Patent Agency Ranking
公开(公告)号：US20240060908A1
公开(公告)日：2024-02-22
申请号：US18499784
申请日：2023-11-01
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Chan Kwon LEE , Moon Young JEON , Jung HUR , Deok Hwa HONG , Eun Ha JO
CPC classification number: G01N21/9501 , G01N21/4738
Abstract: An inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.
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公开(公告)号：US20220364852A1
公开(公告)日：2022-11-17
申请号：US17623508
申请日：2020-06-29
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Chan Kwon LEE , Moon Young JEON , Deok Hwa HONG , Joong Ki JEONG
Abstract: The present disclosure proposes an apparatus for determining a first three-dimensional shape of an object. The apparatus includes one or more first light sources configured to irradiate one or more first pattern lights to the object, a second light source configured to sequentially irradiate one or more second pattern lights having one phase range, a beam splitter and one or more lenses configured to change optical paths of the one or more second pattern lights, an image sensor configured to capture one or more first reflected lights and one or more second reflected lights, and a processor configured to determine the first three-dimensional shape of the object based on the one or more first reflected lights and the one or more second reflected lights.
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公开(公告)号：US20230284933A1
公开(公告)日：2023-09-14
申请号：US18248856
申请日：2021-10-13
Applicant: KOH YOUNG TECHNOLOGY INC
Inventor： Moon Young JEON , Seung Yeol RYU
CPC classification number: A61B5/1079 , A61B5/0013 , A61B5/1077 , A61B5/0077 , A61B5/065 , A61B2090/364
Abstract: A portable three-dimensional image measuring device according to various embodiments of the present disclosure may include a light source configured to output patterned light; a camera configured to generate a light field image of an object by receiving reflected light generated by reflecting the patterned light from the object; and an optical path control element configured to reflect the patterned light output from the light source so that the object is irradiated with the patterned light, and to transmit the reflected light reflected from the object so that the reflected light reaches the camera. An optical path of the patterned light output from the light source and irradiated onto the object and an optical path of the reflected light reflected from the object and reaching the camera may overlap coaxially in a section between the optical path control element and the object.
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公开(公告)号：US20220357149A1
公开(公告)日：2022-11-10
申请号：US17623497
申请日：2020-06-29
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Chan Kwon LEE , Moon Young JEON , Deok Hwa HONG , Joong Ki JEONG
Abstract: The present disclosure proposes an apparatus for determining a first three-dimensional shape of an object. The apparatus includes a first light source configured to irradiate first pattern lights to the object, first image sensors configured to capture first reflected lights generated by reflecting the first pattern lights from the object, a second light source configured to sequentially irradiate second pattern lights having one phase range, a beam splitter and lenses configured to change optical paths of the second pattern lights, a second image sensor configured to capture second reflected lights generated by reflecting the second pattern lights from the partial region, and a processor configured to determine the first three-dimensional shape of the object based on the first reflected lights and the second reflected lights.
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公开(公告)号：US20210102903A1
公开(公告)日：2021-04-08
申请号：US17123901
申请日：2020-12-16
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Chan Kwon LEE , Moon Young JEON , Jung HUR , Deok Hwa HONG , Eun Ha JO
Abstract: The present disclosure proposes an inspection apparatus. The inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.
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