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Patent Agency Ranking
公开(公告)号：US10890538B2
公开(公告)日：2021-01-12
申请号：US16653291
申请日：2019-10-15
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Chan Kwon Lee , Moon Young Jeon , Jung Hur , Deok Hwa Hong , Eun Ha Jo
Abstract: The present disclosure proposes an inspection apparatus. The inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.
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公开(公告)号：US12193802B2
公开(公告)日：2025-01-14
申请号：US17430225
申请日：2020-02-11
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Hong Ki Kim , Young Joo Hong , Deok Hwa Hong , Guk Bin Lim , Seung Tae Kim , Min Kyu Kim , Eun Ha Jo
Abstract: A blood flow measurement device according to various embodiments may be configured to irradiate light to a first position of a subject and a second position of the subject located in a first direction with respect to the first position, acquire intensities of the reflected light at the first position and the second position, determine a first value which is a difference between the intensities of the reflected light at the first position and the second position, irradiate light to a third position of the subject located in a second direction with respect to the second position, acquire an intensity of the reflected light at the third position, determine a second value which is a difference between the intensities of the reflected light at the second position and the third position, and determine a blood flow direction based on the first value and the second value.
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公开(公告)号：US11360031B2
公开(公告)日：2022-06-14
申请号：US17123901
申请日：2020-12-16
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Chan Kwon Lee , Moon Young Jeon , Jung Hur , Deok Hwa Hong , Eun Ha Jo
Abstract: The present disclosure proposes an inspection apparatus. The inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.
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公开(公告)号：US12105029B2
公开(公告)日：2024-10-01
申请号：US18499784
申请日：2023-11-01
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Chan Kwon Lee , Moon Young Jeon , Jung Hur , Deok Hwa Hong , Eun Ha Jo
CPC classification number: G01N21/9501 , G01N21/4738
Abstract: An inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.
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公开(公告)号：US11821846B2
公开(公告)日：2023-11-21
申请号：US17735521
申请日：2022-05-03
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Chan Kwon Lee , Moon Young Jeon , Jung Hur , Deok Hwa Hong , Eun Ha Jo
CPC classification number: G01N21/9501 , G01N21/4738
Abstract: An inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.
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