公开(公告)号：US10707585B2

公开(公告)日：2020-07-07

申请号：US16370309

申请日：2019-03-29

Applicant: Kymeta Corporation

Inventor： Tom Hower ,  Lamin Ceesay ,  Benjamin Ash ,  Matthew Fornes ,  William Pedler ,  Mohsen Sazegar ,  Jacob Tyler Repp

IPC: G01R29/10 ,  H01Q21/06 ,  H01Q1/28 ,  H01Q3/24 ,  H01Q3/26

Abstract: Methods and apparatuses are disclosed for a free space segment tester (FSST). In one example, an apparatus includes a frame, a first horn antenna, a second horn antenna, a controller, and an analyzer. The frame has a platform to support a thin film transistor (TFT) segment of a flat panel antenna. The first horn antenna transmits microwave energy to the TFT segment and receives reflected energy from the TFT segment. The second horn antenna receives microwave energy transmitted through the TFT segment. The controller is coupled to the TFT segment and provides at least one stimulus or condition to the TFT segment. The analyzer measures a characteristic of the TFT segment using the first horn antenna and the second horn antenna. Examples of a measured characteristic includes a measured microwave frequency response, transmission response, or reflection response for the TFT segment. In one example, the TFT segment is used for integration into a flat panel antenna if the measured characteristic of the TFT segment indicates the TFT segment is acceptable.

公开(公告)号：USD843356S1

公开(公告)日：2019-03-19

申请号：US29600422

申请日：2017-04-12

Applicant: Kymeta Corporation

Designer： Ryan Stevenson ,  Steven Linn ,  Robert Morey ,  Mohsen Sazegar ,  Stephen Olfert ,  Benjamin Ash ,  Matthew Fornes ,  Ken Harp ,  Tom Hower ,  David Levesque ,  Mike Slota ,  Alex Truesdale Perry ,  Colin Stuart Short ,  Tung Pham ,  Andrew Turner ,  Mohamed Sabri

公开(公告)号：USD923612S1

公开(公告)日：2021-06-29

申请号：US29680023

申请日：2019-02-12

Applicant: Kymeta Corporation

Designer： Ryan Stevenson ,  Steven Linn ,  Robert E. Morey ,  Mohsen Sazegar ,  Stephen Olfert ,  Benjamin Ash ,  Matthew Fornes ,  Ken Harp ,  Tom Hower ,  David Levesque ,  Michael W. Slota ,  Alex Truesdale Perry ,  Colin Stuart Short ,  Tung Pham ,  Andrew Turner ,  Mohamed Sabri

公开(公告)号：US20190229434A1

公开(公告)日：2019-07-25

申请号：US16370309

申请日：2019-03-29

Applicant: Kymeta Corporation

Inventor： Tom Hower ,  Lamin Ceesay ,  Benjamin Ash ,  Matthew Fornes ,  William Pedler ,  Mohsen Sazegar ,  Jacob Tyler Repp

IPC: H01Q21/06 ,  H01Q3/26 ,  H01Q3/24

Abstract: Methods and apparatuses are disclosed for a free space segment tester (FSST). In one example, an apparatus includes a frame, a first horn antenna, a second horn antenna, a controller, and an analyzer. The frame has a platform to support a thin film transistor (TFT) segment of a flat panel antenna. The first horn antenna transmits microwave energy to the TFT segment and receives reflected energy from the TFT segment. The second horn antenna receives microwave energy transmitted through the TFT segment. The controller is coupled to the TFT segment and provides at least one stimulus or condition to the TFT segment. The analyzer measures a characteristic of the TFT segment using the first horn antenna and the second horn antenna. Examples of a measured characteristic includes a measured microwave frequency response, transmission response, or reflection response for the TFT segment. In one example, the TFT segment is used for integration into a flat panel antenna if the measured characteristic of the TFT segment indicates the TFT segment is acceptable.