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    Localized free space tester
    1.
    发明授权
    Localized free space tester 有权

    公开(公告)号：US10948528B2

    公开(公告)日：2021-03-16

    申请号：US16681681

    申请日：2019-11-12

    Applicant: Kymeta Corporation

    Inventor： Cagdas Varel ,  Ryan Stevenson ,  Steven Linn ,  Michael Severson ,  Colin Stuart Short ,  Mohsen Sazegar

    IPC: G01R29/08 ,  G01R29/10 ,  H04B17/12 ,  H04B17/21 ,  H04B17/17

    Abstract: A method and apparatus for testing radio-frequency antenna elements are disclosed. In one embodiment, the apparatus comprises: a frame having a platform to support an array of radio-frequency (RF) antenna elements of a flat panel antenna having antenna elements; a first antenna to transmit microwave energy to subsets of RF antenna elements of the segment and to receive reflected microwave energy from the subsets of RF antenna elements; a filter between the segment and the first antenna, the filter comprising an opening positioned over each of the subsets of RF antenna elements at different times to expose said each of the subsets of RF antenna elements to microwave energy transmitted by the first antenna; a second antenna to receive microwave energy transmitted though the subsets of RF antenna elements at the different times; a controller coupled to the subsets of RF antenna elements and to provide at least one stimulus or condition to the subsets of RF antenna elements; and an analyzer to provide stimulus to the subsets of RF antenna elements and to measure a characteristic of the array using one or both of the first antenna and second antenna.

    Storage capacitor for use in an antenna aperture
    2.
    发明授权
    Storage capacitor for use in an antenna aperture 有权

    公开(公告)号：US11049658B2

    公开(公告)日：2021-06-29

    申请号：US15849483

    申请日：2017-12-20

    Applicant: Kymeta Corporation

    Inventor： Steven Linn ,  Cagdas Varel

    IPC: H01G4/30 ,  H01Q1/44 ,  H01Q1/48 ,  H01Q9/04 ,  H01Q13/10 ,  H01Q21/06 ,  H01G4/35

    Abstract: A storage capacitor and method for using the same in an antenna aperture are described. In one embodiment, an antenna comprises a physical antenna aperture having first and second substrates forming an array of radio-frequency (RF) radiating antenna elements that are controlled and operable together to form a beam for the frequency band for use in holographic beam steering, wherein each of the antenna elements is coupled to a circuit to supply a voltage to the said each antenna element and a storage capacitor formed with a plurality of conductive layers (e.g., metal layers) on a first substrate, wherein top and bottom conductive layers of the plurality of conductive layers are at a first voltage that is equal to a second voltage on a conductive layer (e.g., a metal layer) of the second substrate to reduce parasitic capacitance produced between the storage capacitor and the conductive layer on the second substrate.

    LOCALIZED FREE SPACE TESTER
    4.
    发明申请
    LOCALIZED FREE SPACE TESTER 审中-公开

    公开(公告)号：US20200081048A1

    公开(公告)日：2020-03-12

    申请号：US16681681

    申请日：2019-11-12

    Applicant: Kymeta Corporation

    Inventor： Cagdas Varel ,  Ryan Stevenson ,  Steven Linn ,  Michael Severson ,  Colin Stuart Short ,  Mohsen Sazegar

    IPC: G01R29/08 ,  G01R29/10 ,  H04B17/17 ,  H04B17/12 ,  H04B17/21

    Abstract: A method and apparatus for testing radio-frequency antenna elements are disclosed. In one embodiment, the apparatus comprises: a frame having a platform to support an array of radio-frequency (RF) antenna elements of a flat panel antenna having antenna elements; a first antenna to transmit microwave energy to subsets of RF antenna elements of the segment and to receive reflected microwave energy from the subsets of RF antenna elements; a filter between the segment and the first antenna, the filter comprising an opening positioned over each of the subsets of RF antenna elements at different times to expose said each of the subsets of RF antenna elements to microwave energy transmitted by the first antenna; a second antenna to receive microwave energy transmitted though the subsets of RF antenna elements at the different times; a controller coupled to the subsets of RF antenna elements and to provide at least one stimulus or condition to the subsets of RF antenna elements; and an analyzer to provide stimulus to the subsets of RF antenna elements and to measure a characteristic of the array using one or both of the first antenna and second antenna.

    DC offset correction in an antenna aperture
    6.
    发明授权
    DC offset correction in an antenna aperture 有权

    公开(公告)号：US11217890B2

    公开(公告)日：2022-01-04

    申请号：US16134221

    申请日：2018-09-18

    Applicant: Kymeta Corporation

    Inventor： Steven Linn ,  Cagdas Varel

    IPC: H01Q1/38 ,  H01Q3/24 ,  H01Q3/28 ,  H01Q3/36 ,  G01R29/10 ,  H01Q17/00 ,  H01Q3/00 ,  H01Q3/34 ,  H01Q13/10 ,  H01Q21/00 ,  H01Q21/06 ,  H03D3/00 ,  G01R29/08 ,  G01R31/28

    Abstract: A method and apparatus for DC offset correction in an antenna aperture are described. In one embodiment, the antenna comprises: an array of antenna elements having liquid crystal (LC); drive circuitry coupled to the array and having a plurality of drivers, each driver of the plurality of drivers coupled to an antenna element of the array and operable to apply a drive voltage to the antenna element; and voltage correction logic coupled to the drive circuitry adjust drive voltages to compensate for an offset between a first magnitude of a first voltage applied to the LC of each antenna element during a first interval of drive polarity and a second magnitude of a second voltage applied to the LC of said each antenna element during a second interval of drive polarity opposite the drive polarity of the first interval.

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