Microscope and method for determining an aberration in a microscope

    公开(公告)号:US11415789B2

    公开(公告)日:2022-08-16

    申请号:US17080874

    申请日:2020-10-27

    Abstract: A microscope includes an optical imaging system with an adjustable corrector, a microscope drive, a position sensitive detector, an optical measuring system and a control unit. The optical measuring system configured to form first and second measuring light beams, direct the measuring light beams into an entrance pupil of the optical imaging system eccentrically with first and second distances to the optical axis thereof, receive first and second reflection light beams, and direct the reflection light beams onto the position sensitive detector. The control unit is configured to record positions of the reflection light beams on the position sensitive detector, and determine an aberration based on the recorded positions.

    Device and method for imaging an object

    公开(公告)号:US12228719B2

    公开(公告)日:2025-02-18

    申请号:US17636034

    申请日:2019-08-27

    Abstract: An optical imaging device for a microscope includes an objective and an optical system configured to interact with the objective for optically imaging an object selectively in a first operating mode and a second operating mode. The optical system includes a first optical subsystem associated with the first operating mode, and a second optical subsystem associated with the second operating mode. The first optical subsystem is configured to form a first image of the object with a first magnification. The second optical subsystem is configured to form a second image of the object with a second magnification that is less than the first magnification. The second optical subsystem includes an optical module insertable into the optical path for selecting the second operating mode. The optical module includes a lens element with a positive refractive power.

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