MAGNETICALLY ALIGNING TEST STRIPS IN TEST METER

    公开(公告)号:US20150285758A1

    公开(公告)日:2015-10-08

    申请号:US14744085

    申请日:2015-06-19

    CPC classification number: G01N27/3273 C12Q1/54 G01N33/4875

    Abstract: An analytical test meter includes a meter housing containing a test strip connector that includes at least two terminals. A processor is disposed within the meter housing, as well as a current generator that generates a magnetic field in association with one of the terminals for attracting a contact of an analytical test strip for alignment or retention therewith. Detection of the presence of an analytical test strip relative to an electrical contact can cause an increase in the intensity of the magnetic field.

Patent Agency Ranking