Abstract:
A semiconductor sensor adapted to detect with a high degree of sensitivity small magnitudes of a mechanical force, presence of traces of a gas or light. The sensor includes a high energy gap (i.e.,*1.0 electron volts) semiconductor wafer. Mechanical force is measured by employing a non-centrosymmetric material for the semiconductor. Distortion of the semiconductor by the force creates a contact potential difference (cpd) at the semiconductor surface, and this cpd is determined to give a measure of the force. When such a semiconductor is subjected to illumination with an energy less than the energy gap of the semiconductors, such illumination also creates a cpd at the surface. Detection of this cpd is employed to sense the illumination itself or, in a variation of the system, to detect a gas. When either a gas or light is to be detected and a crystal of a non-centrosymmetric material is employed, the presence of gas or light, in appropriate circumstances, results in a strain within the crystal which distorts the same and the distortion provides a mechanism for qualitative and quantitative evaluation of the gas or the light, as the case may be.
Abstract:
A method of growing epitaxial layers from a solution in a solution-substrate system. An electrically conductive solution, consisting of one or more materials to be deposited upon the substrate, is placed in contact with the substrate. The temperature of the system is established and maintained at a level at which the solution is at or near saturation. An electric current is then passed across the interface between the solution and the substrate, the direction and magnitude of the current being chosen to effect cooling at the interface only, the remainder of the system being maintained at said equilibrium temperature.
Abstract:
A METHOD IS DISCLOSED FOR PREPARING AN ELECTRICALLY AND OPTICALLY ACTIVE MATERIAL, EITHER VITEOUS OR POLYCRYSTALLINE, THAT PROVIDES A MATERIAL THAT IS NON-POROUS, CONTAINS NO INCLUSIONS, IS CHEMICALLY HOMOGENEOUS, AND ONE THAT CAN BE CUT OR OTHERWISE FORMED TO SOME DESIRED UNIFORM GEOMETRICAL SHAPE. THE PROCESS DISCLOSED INCLUDES SUBJECTING THE COMPONENTS OF THE MATERIAL HELD WITHIN A SEALED AMPOULE OR OTHER CLOSED CONTAINER TO AN ELEVATED TEMPERATURE IN AN INERT ATMOSPHERE OR VACUUM FOR A TIME PERIOD LONG ENOUGH FOR THE COMPONENTS TO BECOME MOLTEN AND TO REACT CHEMICALLY WITH ONE ANOTHER. HEATO IS THEN WITHDRAWN FORM THE MOLTEN MATERIAL TO LOWER THE TEMPERATURE TO A VALUE AT WHICH A THIN LAYER OF MOLTEN MATERIALS ADHERES TO THE INNER SURFACE OF THE CONTAINER. RELATIVE MOVEMENT IS EFFECTED BETWEEN THE BULK OF THE MOLTEN MATERIAL AND THE THIN LAYER OF MELT THAT ADHERED TO THE INNER SURFACE, THE THIN LAYER BEING MOVED AWAY FROM THE BULK OF THE MELT TO ALLOW SOLIDICICATION THEREBY TO FORM A SOLIDIFIED LAYER. THE SOLIDIFIED LAYER IS ALTERNATELY BROUGHT INTO CONTACT WITH THE BULK OF THE MOLTEN MATERIAL TO PICK UP A THIN LAYER OF MELT AND REMOVED FROM SUCH CONTACT TO ALLOW THE THIN LAYER TO SOLIDIFY, THERE BEING A CONTINUED WITHDRAWAL OF HEAT FROM THE REGION OCCUPIED BY THE AMPOULE IN ORDER THAT THE SOLID LAYER WILL INCREASE IN THICKNESS LAYER UPON LAYER AS ADDITIONAL MOLTEN MATERIAL SOLIFIFIES.