公开(公告)号：US20150204962A1

公开(公告)日：2015-07-23

申请号：US14557181

申请日：2014-12-01

Applicant: MPI CORPORATION

Inventor： WEI-CHENG KU ,  SHAO-WEI LU ,  HAO WEI ,  YU-TSE WANG

IPC: G01R35/00 ,  G01R31/04

CPC classification number: G01R31/2891 ,  G01R35/005

Abstract: A method of operating a testing system is provided, wherein the testing system has a test machine and a probe module, which has a first probe set and a second probe set. One of the first probe set and the second probe set can be connected to the test machine. The method includes the following steps: connect the test machine and the first probe set; calibrate the testing system; abut the first probe set against a DUT to do electrical tests; disconnect the first probe set and the DUT; disconnect the test machine and the first probe set; connect the test machine and the second probe set; calibrate the testing system again; abut the second probe set against the DUT to do electrical tests.

Abstract translation: 提供了一种操作测试系统的方法，其中所述测试系统具有测试机器和探针模块，所述测试机器和探针模块具有第一探针组和第二探针组。 第一个探针组和第二个探针组之一可以连接到测试机。 该方法包括以下步骤：连接测试机和第一个探头组; 校准测试系统; 将第一个探测器对准DUT进行电气测试; 断开第一个探针组和DUT; 断开测试机和第一个探头组; 连接测试机和第二个探头组; 再次校准测试系统; 将第二个探测器对准DUT，进行电气测试。

公开(公告)号：US20150233969A1

公开(公告)日：2015-08-20

申请号：US14552957

申请日：2014-11-25

Applicant: MPI CORPORATION

Inventor： WEI-CHENG KU ,  SHAO-WEI LU ,  HAO WEI ,  YU-TSE WANG

IPC: G01R1/073 ,  G01R1/04 ,  G01R1/02

CPC classification number: G01R1/07314 ,  G01R1/025 ,  G01R1/04 ,  G01R1/07392 ,  G01R31/2812 ,  G01R35/005

Abstract: A testing system includes a test machine, a plurality of probe sets, a data input device, a controller, a memory, and a data output device. The test machine has a platform for a DUT to be placed thereon, and a test arm which is movable relative to the platform. The probe sets are provided on the test machine with at least one probe set provided on the test arm to contact the DUT. The data input device is used to input information about the DUT. The controller is electrically connected to the test arm, the probe set on the test arm, and the data input device to move the test arm to a predetermined position according to the inputted information, and to make the probe set contact the DUT for electrical test. The memory saves electrical test result, which is outputted by the data output device.

Abstract translation: 测试系统包括测试机，多个探针组，数据输入设备，控制器，存储器和数据输出设备。 测试机具有用于被放置在其上的DUT的平台以及可相对于平台移动的测试臂。 探头组在测试机器上提供，测试臂上提供至少一个探针组，以便与DUT接触。 数据输入设备用于输入有关DUT的信息。 控制器电气连接到测试臂，测试臂上设置的探头和数据输入设备，根据输入的信息将测试臂移动到预定位置，并使探头组接触DUT进行电气测试 。 存储器节省了由数据输出装置输出的电气测试结果。

公开(公告)号：US20150204908A1

公开(公告)日：2015-07-23

申请号：US14557043

申请日：2014-12-01

Applicant: MPI CORPORATION

Inventor： WEI-CHENG KU ,  SHAO-WEI LU ,  HUNG-CHIH SUNG ,  CHUN-NAN CHEN

IPC: G01R1/073 ,  G01R1/04

CPC classification number: G01R1/04 ,  G01R1/07392 ,  G01R31/2887

Abstract: An electrical testing machine includes a base having two parallel first rails, a platform provided on the base, a probe holder provided on the base and having a plurality of placement locations, a support provided between the first rails and having a second rail thereon, a test arm provided on the second rail and above the platform, a receiving seat provided on the test arm, and a plurality of probe sets, wherein one of the probe sets is engaged on the receiving seat, while the others are respectively provided on the placement locations. The support is movable relative to the base and the platform. The test arm is movable along with the support, and is also movable relative to the support. The receiving seat is movable or rotatable relative to the test arm. The probe set engaged on the receiving seat is movable along with the receiving seat.

Abstract translation: 电测试机包括具有两个平行的第一轨道的基座，设置在基座上的平台，设置在基座上并具有多个放置位置的探针保持架，设置在第一轨道之间并具有第二轨道的支撑件， 设置在第二导轨上并位于平台上的测试臂，设置在测试臂上的接收座和多个探针组，其中探针组中的一个接合在接收座上，而其它探针组分别设置在放置位置 位置。 支撑件相对于基座和平台是可移动的。 测试臂与支撑件一起可移动，并且也可相对于支撑件移动。 接收座椅相对于测试臂是可移动的或可旋转的。 接合在接收座上的探针组可与接收座一起移动。

公开(公告)号：US20150204907A1

公开(公告)日：2015-07-23

申请号：US14556612

申请日：2014-12-01

Applicant: MPI CORPORATION

Inventor： WEI-CHENG KU ,  SHAO-WEI LU ,  YA-HUNG LO ,  SHOU-JEN TSAI

IPC: G01R1/073 ,  G01R1/04

CPC classification number: G01R1/04 ,  G01R1/07392 ,  G01R31/2887

Abstract: An electrical testing device includes a base having two parallel first rails, a platform provided on the base, a support provided between the first rails, a test arm, a rotary table provided on the test arm, a plurality of holders provided on the rotary table, and a plurality of probe sets respectively provided on the holders. The support has a second rail provided thereon, and is moveable relative to the base and the platform. The test arm is provided on the second rail and above the platform, wherein the test arm is moveable along with the support, and is also movable relative to the support. The rotary table is moveable or rotatable relative to the test arm. The holders are moveable along with the rotary table, and are also moveable or rotatable relative to the rotary table. The probe sets are moveable along with the holders.

Abstract translation: 电测试装置包括具有两个平行的第一轨道的基座，设置在基座上的平台，设置在第一轨道之间的支撑件，测试臂，设置在测试臂上的旋转台，设置在旋转台上的多个保持架 ，以及分别设置在保持器上的多个探针组。 支撑件具有设置在其上的第二轨道，并且可相对于基座和平台移动。 测试臂设置在第二轨道上并在平台上方，其中测试臂可与支撑件一起移动，并且也可相对于支撑件移动。 旋转台相对于测试臂是可移动的或可旋转的。 支架可与旋转工作台一起移动，并且也可相对于旋转工作台移动或旋转。 探头组与支架一起可移动。

公开(公告)号：US20170146634A1

公开(公告)日：2017-05-25

申请号：US15401987

申请日：2017-01-09

Applicant: MPI CORPORATION

Inventor： WEI-CHENG KU ,  SHAO-WEI LU ,  HAO WEI ,  YU-TSE WANG

IPC: G01R35/00 ,  G01R1/073

CPC classification number: G01R35/005 ,  G01R1/073 ,  G01R31/2808 ,  G01R31/2894

Abstract: A method of calibrating and debugging a testing system is provided. First, values of different electrical path segments are calibrated, and parameters of the electrical path segments while being calibrated are saved. After calibration, electrical tests can be processed on a DUT. If the testing system malfunctions, the values of the electrical path segments are calibrated again to compare the current parameters to the previously saved parameters. The component which goes wrong can be found out quickly in this way.

公开(公告)号：US20150241544A1

公开(公告)日：2015-08-27

申请号：US14553153

申请日：2014-11-25

Applicant: MPI CORPORATION

Inventor： WEI-CHENG KU ,  SHAO-WEI LU ,  HAO WEI ,  YU-TSE WANG

IPC: G01R35/00 ,  G01R1/073

CPC classification number: G01R35/005 ,  G01R31/2808 ,  G01R31/2894

Abstract: A method of calibrating and debugging a testing system is provided. First, values of different electrical path segments are calibrated, and parameters of the electrical path segments while being calibrated are saved. After calibration, electrical tests can be processed on a DUT. If the testing system malfunctions, the values of the electrical path segments are calibrated again to compare the current parameters to the previously saved parameters. The component which goes wrong can be found out quickly in this way.

Abstract translation: 提供了一种校准和调试测试系统的方法。 首先，校准不同电路段的值，并保存校准时电路段的参数。 校准后，可以在DUT上对电气测试进行处理。 如果测试系统发生故障，则再次校准电气路径段的值，以将当前参数与先前保存的参数进行比较。 出现错误的组件可以通过这种方式迅速找到。

公开(公告)号：US20150212186A1

公开(公告)日：2015-07-30

申请号：US14558450

申请日：2014-12-02

Applicant: MPI CORPORATION

Inventor： WEI-CHENG KU ,  SHAO-WEI LU ,  SHOU-JEN TSAI ,  YU-TSE WANG

IPC: G01R35/00 ,  G01R31/02

CPC classification number: G01R35/005 ,  G01R31/025 ,  G01R31/043 ,  G01R31/2808 ,  G01R31/2851

Abstract: A method of calibrating and operating a testing system is provided, wherein the testing system has a test machine, a conducting wire set, a calibration module, and a probe module. The method includes the following steps: electrically connect the test machine and the conducting wire set; electrically connect the conducting wire set and the calibration module; send out electrical signals from the test machine to the calibration module for doing at least one test among a short-circuit test, an open-circuit test, and an impedance test, and then calibrate the testing system by correspondingly performing compensation based on results of these tests; electrically disconnect the conducting wire set and the calibration module, and electrically connect the conducting wire set and the probe module; abut the probe module against a DUT; send out electrical signals from the test machine to the probe module to do electrical tests on the DUT.

Abstract translation: 提供了一种校准和操作测试系统的方法，其中测试系统具有测试机，导线组，校准模块和探针模块。 该方法包括以下步骤：将测试机与导线组电连接; 电连接导线组和校准模块; 在短路测试，开路测试和阻抗测试中，将测试机器的电信号发送到校准模块进行至少一次测试，然后通过相应地根据测试结果进行补偿来校准测试系统 这些测试; 电气断开导线组和校准模块，并电连接导线组和探针模块; 将探针模块抵靠DUT; 从测试机发送电信号到探头模块，对DUT进行电气测试。