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公开(公告)号:US20230194883A1
公开(公告)日:2023-06-22
申请号:US18168285
申请日:2023-02-13
Applicant: Metalenz, Inc.
Inventor: Gilbert N. Riley, JR. , Robert Devlin , Adam Erlich , Pawel Latawiec , John Graff
IPC: G02B27/09 , H01L27/146 , H01S5/026 , H01S5/40 , H01S5/42 , G02B27/12 , G02B27/10 , G02B6/24 , G02B6/42
CPC classification number: G02B27/0916 , G02B27/0927 , H01L27/14625 , H01S5/026 , H01S5/4012 , H01S5/423 , G02B27/0922 , G02B27/12 , G02B27/10 , G02B27/123 , G02B27/1006 , G02B27/106 , G02B27/09 , G02B6/24 , G02B6/42 , G02B6/4201 , G02B6/4274 , G02B6/428 , H01L31/02327
Abstract: Metasurface elements, integrated systems incorporating such metasurface elements with light sources and/or detectors, and methods of the manufacture and operation of such optical arrangements and integrated systems are provided. Systems and methods for integrating transmissive metasurfaces with other semiconductor devices or additional metasurface elements, and more particularly to the integration of such metasurfaces with substrates, illumination sources and sensors are also provided. The metasurface elements provided may be used to shape output light from an illumination source or collect light reflected from a scene to form two unique patterns using the polarization of light. In such embodiments, shaped-emission and collection may be combined into a single co-designed probing and sensing optical system.
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公开(公告)号:US10795168B2
公开(公告)日:2020-10-06
申请号:US16120174
申请日:2018-08-31
Applicant: Metalenz, Inc.
Inventor: Gilbert N. Riley, Jr. , Robert Devlin , Adam Erlich , Pawel Latawiec , John Graff
IPC: G02B27/09 , H01L27/146 , H01L31/0232 , H01L33/58
Abstract: Metasurface elements, integrated systems incorporating such metasurface elements with light sources and/or detectors, and methods of the manufacture and operation of such optical arrangements and integrated systems are provided. Systems and methods for integrating transmissive metasurfaces with other semiconductor devices or additional metasurface elements, and more particularly to the integration of such metasurfaces with substrates, illumination sources and sensors are also provided. The metasurface elements provided may be used to shape output light from an illumination source or collect light reflected from a scene to form two unique patterns using the polarization of light. In such embodiments, shaped-emission and collection may be combined into a single co-designed probing and sensing optical system.
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公开(公告)号:US20200271941A1
公开(公告)日:2020-08-27
申请号:US15931184
申请日:2020-05-13
Applicant: Metalenz, Inc.
Inventor: Gilbert N. Riley, JR. , Robert Devlin , Adam Erlich , Pawel Latawiec , John Graff
IPC: G02B27/09 , H01L27/146
Abstract: Metasurface elements, integrated systems incorporating such metasurface elements with light sources and/or detectors, and methods of the manufacture and operation of such optical arrangements and integrated systems are provided. Systems and methods for integrating transmissive metasurfaces with other semiconductor devices or additional metasurface elements, and more particularly to the integration of such metasurfaces with substrates, illumination sources and sensors are also provided. The metasurface elements provided may be used to shape output light from an illumination source or collect light reflected from a scene to form two unique patterns using the polarization of light. In such embodiments, shaped-emission and collection may be combined into a single co-designed probing and sensing optical system.
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公开(公告)号:US20190064532A1
公开(公告)日:2019-02-28
申请号:US16120174
申请日:2018-08-31
Applicant: Metalenz, Inc.
Inventor: Gilbert N. Riley, JR. , Robert Devlin , Adam Erlich , Pawel Latawiec , John Graff
IPC: G02B27/09
Abstract: Metasurface elements, integrated systems incorporating such metasurface elements with light sources and/or detectors, and methods of the manufacture and operation of such optical arrangements and integrated systems are provided. Systems and methods for integrating transmissive metasurfaces with other semiconductor devices or additional metasurface elements, and more particularly to the integration of such metasurfaces with substrates, illumination sources and sensors are also provided. The metasurface elements provided may be used to shape output light from an illumination source or collect light reflected from a scene to form two unique patterns using the polarization of light. In such embodiments, shaped-emission and collection may be combined into a single co-designed probing and sensing optical system.
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公开(公告)号:US11988844B2
公开(公告)日:2024-05-21
申请号:US15931184
申请日:2020-05-13
Applicant: Metalenz, Inc.
Inventor: Gilbert N. Riley, Jr. , Robert Devlin , Adam Erlich , Pawel Latawiec , John Graff
IPC: G02B27/09 , G02B1/00 , G02B6/24 , G02B6/42 , G02B27/10 , G02B27/12 , H01L27/146 , H01S5/026 , H01S5/40 , H01S5/42 , H01L31/0232 , H01L33/58 , H01S5/00
CPC classification number: G02B27/0916 , G02B1/002 , G02B6/24 , G02B6/42 , G02B6/4201 , G02B6/4274 , G02B6/428 , G02B27/09 , G02B27/0922 , G02B27/0927 , G02B27/10 , G02B27/1006 , G02B27/106 , G02B27/12 , G02B27/123 , H01L27/14625 , H01S5/026 , H01S5/4012 , H01S5/423 , H01L31/02327 , H01L33/58 , H01S5/0085
Abstract: Metasurface elements, integrated systems incorporating such metasurface elements with light sources and/or detectors, and methods of the manufacture and operation of such optical arrangements and integrated systems are provided. Systems and methods for integrating transmissive metasurfaces with other semiconductor devices or additional metasurface elements, and more particularly to the integration of such metasurfaces with substrates, illumination sources and sensors are also provided. The metasurface elements provided may be used to shape output light from an illumination source or collect light reflected from a scene to form two unique patterns using the polarization of light. In such embodiments, shaped-emission and collection may be combined into a single co-designed probing and sensing optical system.
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公开(公告)号:US11579456B2
公开(公告)日:2023-02-14
申请号:US17643091
申请日:2021-12-07
Applicant: Metalenz, Inc.
Inventor: Gilbert N. Riley, Jr. , Robert Devlin , Adam Erlich , Pawel Latawiec , John Graff
IPC: G02B27/09 , H01L27/146 , H01S5/026 , H01S5/40 , H01S5/42 , G02B27/12 , G02B27/10 , G02B6/24 , G02B6/42 , H01L31/0232 , H01L33/58
Abstract: Metasurface elements, integrated systems incorporating such metasurface elements with light sources and/or detectors, and methods of the manufacture and operation of such optical arrangements and integrated systems are provided. Systems and methods for integrating transmissive metasurfaces with other semiconductor devices or additional metasurface elements, and more particularly to the integration of such metasurfaces with substrates, illumination sources and sensors are also provided. The metasurface elements provided may be used to shape output light from an illumination source or collect light reflected from a scene to form two unique patterns using the polarization of light. In such embodiments, shaped-emission and collection may be combined into a single co-designed probing and sensing optical system.
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公开(公告)号:US20220091428A1
公开(公告)日:2022-03-24
申请号:US17643091
申请日:2021-12-07
Applicant: Metalenz, Inc.
Inventor: Gilbert N. Riley, JR. , Robert Devlin , Adam Erlich , Pawel Latawiec , John Graff
IPC: G02B27/09 , H01L27/146
Abstract: Metasurface elements, integrated systems incorporating such metasurface elements with light sources and/or detectors, and methods of the manufacture and operation of such optical arrangements and integrated systems are provided. Systems and methods for integrating transmissive metasurfaces with other semiconductor devices or additional metasurface elements, and more particularly to the integration of such metasurfaces with substrates, illumination sources and sensors are also provided. The metasurface elements provided may be used to shape output light from an illumination source or collect light reflected from a scene to form two unique patterns using the polarization of light. In such embodiments, shaped-emission and collection may be combined into a single co-designed probing and sensing optical system.
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