公开(公告)号：US20150369695A1

公开(公告)日：2015-12-24

申请号：US14518537

申请日：2014-10-20

Applicant: NATIONAL CENTRAL UNIVERSITY

Inventor： Ching-Cherng SUN ,  Yeh-Wei YU ,  Ting-Wei LIN ,  Che-Chu LIN

IPC: G01M11/00 ,  G01J3/28 ,  G01J1/42

CPC classification number: G01J3/28 ,  G01J1/0403 ,  G01J1/0437 ,  G01J1/0477 ,  G01J1/4257 ,  G01J3/0229 ,  G01J2001/4247 ,  G01J2001/4252 ,  G01J2001/448 ,  G01M11/00

Abstract: A detecting system for detecting an under-test light of an under-test object includes a light spatial distribution unit, a chromatic-dispersion light-splitting unit and a detecting unit. The light spatial distribution unit is disposed on a side of the under-test object to receive the under-test light and form a plurality of point light sources. The chromatic-dispersion light-splitting unit is disposed on a side of the light spatial distribution unit to receive the point light sources and produce a light-splitting signal. The detecting unit is disposed on a side of the chromatic-dispersion light-splitting unit to receive the light-splitting signal and produce an optical field distribution of the under-test light.

Abstract translation: 用于检测被测试物体的被测试光的检测系统包括光空间分布单元，色散分光单元和检测单元。 光空间分配单元设置在被测试对象的一侧以接收未被测试的光并形成多个点光源。 色散分光单元设置在光空间分配单元的一侧以接收点光源并产生分光信号。 检测单元设置在色散分光单元的一侧以接收分光信号并产生未被测试的光的光场分布。

公开(公告)号：US20140049631A1

公开(公告)日：2014-02-20

申请号：US13652206

申请日：2012-10-15

Applicant: NATIONAL CENTRAL UNIVERSITY

Inventor： Ching-Cherng SUN ,  Yeh-Wei YU ,  Che-Chu LIN ,  Szu-Yu CHEN

IPC: G02B21/00 ,  H04N7/18

CPC classification number: G01N21/45 ,  A61B5/0059 ,  G02B21/0056 ,  G02B21/082 ,  G02B21/14 ,  G02B21/16 ,  G02B21/365

Abstract: The present invention discloses a microscopy imaging structure with phase conjugated mirror and the method thereof. The afore-mentioned imaging structure produces a reverse focusing conjugated probe beam together with an original probe beam. These two probe beams meet at the focal point in the object body to be probed, and an interference pattern is produced. The interval between any two consecutive wave fronts in the interference pattern is then half of the wavelength of the original probe beam, and hence the vertical resolution of the image is improved. The present invention also applies a light modulator module on the probe beam to easily adjust the depth of the focal point of the probe beam and the phase conjugated reverse focusing probe beam in the object body. With the adoption of this invention, the size or position limitation of the target object is eliminated and the imaging resolution is also improved.

Abstract translation: 本发明公开了一种具有相位共轭反射镜的显微镜成像结构及其方法。 上述成像结构与原始探针光束一起产生反向聚焦共轭探针光束。 这两个探测光束在被探测物体的焦点处相交，产生干涉图案。 干涉图案中的任何两个相邻波前的间隔是原始探测波长波长的一半，因此改善了图像的垂直分辨率。 本发明还将光调制器模块应用在探测光束上，以容易地将探测光束的焦点和相位共轭反向聚焦探测光束的深度调节到物体中。 采用本发明，消除了目标物体的尺寸或位置限制，并且还提高了成像分辨率。

公开(公告)号：US20160225399A1

公开(公告)日：2016-08-04

申请号：US14880285

申请日：2015-10-12

Applicant: National Central University

Inventor： Ching-Cherng SUN ,  Yeh-Wei YU ,  Che-Chu LIN

IPC: G11B7/1353

CPC classification number: G11B7/1353 ,  G11B7/0065 ,  G11B7/1374 ,  G11B2007/00653

Abstract: A light interference module includes an object lens, a first light-guiding element, and a second light-guiding element. The object lens is configured to project a signal light beam to an optical storage media. The first light-guiding element is configured to project a first reference light beam to the optical storage media, in which the first reference light beam and the signal light beam produce a first interference pattern on the optical storage media. The second light-guiding element is configured to project a second reference light beam to the optical storage media, in which the second reference light beam and the signal light beam produce a second interference pattern on the optical storage media, and the first interference pattern is different from the second interference pattern.

Abstract translation: 光干涉模块包括物镜，第一导光元件和第二导光元件。 物镜被配置为将信号光束投射到光学存储介质。 第一导光元件被配置为将第一参考光束投射到光学存储介质，其中第一参考光束和信号光束在光学存储介质上产生第一干涉图案。 第二导光元件被配置为将第二参考光束投射到光学存储介质，其中第二参考光束和信号光束在光学存储介质上产生第二干涉图案，并且第一干涉图案是 不同于第二干涉图案。