公开(公告)号：US20170045397A1

公开(公告)日：2017-02-16

申请号：US15302664

申请日：2015-05-07

Applicant: NATIONAL UNIVERSITY OF SINGAPORE

Inventor： DANIEL SCHMIDT ,  SASCHA PIERRE HEUSSLER

IPC: G01J3/447 ,  G01N21/3581 ,  G01N21/21

CPC classification number: G01J3/447 ,  G01J3/36 ,  G01J4/04 ,  G01N21/211 ,  G01N21/3581 ,  G01N2021/213 ,  G01N2021/3155

Abstract: A device for analysing a specimen is disclosed. The device comprises a first polarizer for polarizing a first beam of electromagnetic radiation; an optical device for directing the polarized beam of electromagnetic radiation at the specimen to enable interaction between the polarized beam of electromagnetic radiation and the specimen to cause generation of a second beam of electromagnetic radiation; a plurality of second polarizers for dividing the wavefront of the second beam of electromagnetic radiation into a plurality of beams of electromagnetic radiation polarized with different polarization states; and at least one spectrometer for analysing respective electromagnetic spectrums of the plurality of polarized beams of electromagnetic radiation to enable the specimen to be characterised. A related method is also disclosed.

Abstract translation: 公开了一种用于分析试样的装置。 该装置包括用于使第一电磁辐射束偏振的第一偏振器; 用于将电磁辐射的偏振光束引导到样品处以使得电磁辐射的偏振光束与样本之间的相互作用以产生第二电磁辐射束的光学装置; 多个第二偏振器，用于将所述第二电磁辐射束的波前划分为以不同极化状态偏振的多个电磁辐射束; 以及用于分析电磁辐射的多个偏振光束的各个电磁光谱的至少一个光谱仪，以使样本得以表征。 还公开了相关方法。